JPWO2021229638A1 - - Google Patents

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Publication number
JPWO2021229638A1
JPWO2021229638A1 JP2020555250A JP2020555250A JPWO2021229638A1 JP WO2021229638 A1 JPWO2021229638 A1 JP WO2021229638A1 JP 2020555250 A JP2020555250 A JP 2020555250A JP 2020555250 A JP2020555250 A JP 2020555250A JP WO2021229638 A1 JPWO2021229638 A1 JP WO2021229638A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2020555250A
Other versions
JP6887575B1 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of JP6887575B1 publication Critical patent/JP6887575B1/ja
Publication of JPWO2021229638A1 publication Critical patent/JPWO2021229638A1/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/007—Environmental aspects, e.g. temperature variations, radiation, stray fields
    • G01R33/0076—Protection, e.g. with housings against stray fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/146—Measuring arrangements for current not covered by other subgroups of G01R15/14, e.g. using current dividers, shunts, or measuring a voltage drop
    • G01R15/148—Measuring arrangements for current not covered by other subgroups of G01R15/14, e.g. using current dividers, shunts, or measuring a voltage drop involving the measuring of a magnetic field or electric field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/028—Electrodynamic magnetometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0094—Sensor arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
JP2020555250A 2020-05-11 2020-05-11 電磁界センサ Active JP6887575B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/018816 WO2021229638A1 (ja) 2020-05-11 2020-05-11 電磁界センサ

Publications (2)

Publication Number Publication Date
JP6887575B1 JP6887575B1 (ja) 2021-06-16
JPWO2021229638A1 true JPWO2021229638A1 (ja) 2021-11-18

Family

ID=76310232

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020555250A Active JP6887575B1 (ja) 2020-05-11 2020-05-11 電磁界センサ

Country Status (5)

Country Link
US (1) US11946953B2 (ja)
EP (1) EP4134689A4 (ja)
JP (1) JP6887575B1 (ja)
CN (1) CN115516327B (ja)
WO (1) WO2021229638A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7403713B1 (ja) 2022-08-29 2023-12-22 三菱電機株式会社 電磁波検出装置

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08248080A (ja) * 1995-03-09 1996-09-27 Kanagawa Pref Gov 電磁雑音測定用磁界プローブ、電磁雑音測定用電界プローブ、及び電磁雑音測定装置
JP3611409B2 (ja) * 1996-09-25 2005-01-19 Ｎｅｃトーキン株式会社 電界センサ
JP2943793B1 (ja) * 1998-04-08 1999-08-30 日本電気株式会社 磁界検出装置および磁界分布測定装置
JP3300285B2 (ja) * 1998-05-07 2002-07-08 松下電器産業株式会社 電磁放射測定装置及び測定システム
SE515832C2 (sv) * 1999-12-16 2001-10-15 Allgon Ab Slitsantennanordning
JP2003207531A (ja) * 2002-01-11 2003-07-25 Kyocera Corp 近傍磁界プローブ
CN2569159Y (zh) * 2002-07-30 2003-08-27 西安交通大学 大尺径磁芯传感器
CN101065682A (zh) 2004-11-25 2007-10-31 皇家飞利浦电子股份有限公司 具有并联的磁传感器条的磁传感器
JP5151032B2 (ja) 2006-01-13 2013-02-27 株式会社日立製作所 磁界プローブ装置及び磁界プローブ素子
US8013600B1 (en) * 2007-11-19 2011-09-06 Sandia Corporation Mountable eddy current sensor for in-situ remote detection of surface and sub-surface fatigue cracks
JP2009229101A (ja) * 2008-03-19 2009-10-08 Kumamoto Univ 微小コイルおよび微小装置
JP5207950B2 (ja) * 2008-12-18 2013-06-12 キヤノン株式会社 磁界計測アレイセンサ
JP2011024168A (ja) * 2009-07-21 2011-02-03 Murata Mfg Co Ltd ループアンテナおよび磁界プローブ
CN103348532B (zh) * 2011-02-18 2016-03-30 莱尔德技术股份有限公司 具有改进的隔离性的多频带平面倒f天线（pifa）和系统
JP2017049010A (ja) * 2015-08-31 2017-03-09 三菱電機株式会社 電磁界プローブ
DE102015117170A1 (de) * 2015-10-08 2017-04-13 Infineon Technologies Ag Kontaktlos-Schaltkreisanordnung
WO2017212542A1 (ja) * 2016-06-07 2017-12-14 三菱電機株式会社 電磁界プローブ
US10359324B2 (en) * 2016-08-18 2019-07-23 General Electric Company Non-contact magnetostrictive sensors and methods of operation of such sensors
WO2018179045A1 (ja) * 2017-03-27 2018-10-04 三菱電機株式会社 電磁界プローブ
JP7216397B2 (ja) * 2018-08-27 2023-02-01 国立大学法人金沢大学 磁界空間分布検出装置
JPWO2020230819A1 (ja) * 2019-05-16 2020-11-19
CN111224724A (zh) * 2019-11-06 2020-06-02 重庆邮电大学 一种基于智慧医疗服务的路径损耗测量方法

Also Published As

Publication number Publication date
EP4134689A4 (en) 2023-04-26
US11946953B2 (en) 2024-04-02
JP6887575B1 (ja) 2021-06-16
EP4134689A1 (en) 2023-02-15
WO2021229638A1 (ja) 2021-11-18
CN115516327A (zh) 2022-12-23
CN115516327B (zh) 2023-12-01
US20230127382A1 (en) 2023-04-27

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