JPWO2021199683A1 - - Google Patents
Info
- Publication number
- JPWO2021199683A1 JPWO2021199683A1 JP2022511610A JP2022511610A JPWO2021199683A1 JP WO2021199683 A1 JPWO2021199683 A1 JP WO2021199683A1 JP 2022511610 A JP2022511610 A JP 2022511610A JP 2022511610 A JP2022511610 A JP 2022511610A JP WO2021199683 A1 JPWO2021199683 A1 JP WO2021199683A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/01—Shaping pulses
- H03K5/08—Shaping pulses by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
- H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
- H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
- H03K5/2481—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors with at least one differential stage
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Electronic Switches (AREA)
- Manipulation Of Pulses (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020060599 | 2020-03-30 | ||
| PCT/JP2021/004604 WO2021199683A1 (ja) | 2020-03-30 | 2021-02-08 | コンパレータ回路 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2021199683A1 true JPWO2021199683A1 (https=) | 2021-10-07 |
Family
ID=77928057
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022511610A Pending JPWO2021199683A1 (https=) | 2020-03-30 | 2021-02-08 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20230146017A1 (https=) |
| JP (1) | JPWO2021199683A1 (https=) |
| CN (1) | CN115362631A (https=) |
| WO (1) | WO2021199683A1 (https=) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6116612A (ja) * | 1984-07-03 | 1986-01-24 | Ricoh Co Ltd | コンパレ−タ回路 |
| JPH09321586A (ja) * | 1996-05-29 | 1997-12-12 | Toshiba Microelectron Corp | レベル比較器 |
| JP2010517336A (ja) * | 2007-01-19 | 2010-05-20 | パワー・インテグレーションズ・インコーポレーテッド | 相補的な差動入力段を有する比較器 |
| JP2010199490A (ja) * | 2009-02-27 | 2010-09-09 | Fuji Electric Systems Co Ltd | パワー半導体装置の温度測定装置およびこれを使用したパワー半導体モジュール |
| JP2011027625A (ja) * | 2009-07-28 | 2011-02-10 | Denso Corp | スイッチング素子の温度検出装置 |
| JP2012227517A (ja) * | 2011-04-01 | 2012-11-15 | Rohm Co Ltd | 温度検出装置、温度検出回路およびパワー半導体モジュール |
| JP2013012870A (ja) * | 2011-06-29 | 2013-01-17 | Toshiba Corp | 差動増幅回路及びコンパレータ |
| JP2014020994A (ja) * | 2012-07-20 | 2014-02-03 | Denso Corp | 温度検出装置 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0590847A (ja) * | 1991-09-28 | 1993-04-09 | Victor Co Of Japan Ltd | 電力増幅器 |
| US5289054A (en) * | 1992-03-24 | 1994-02-22 | Intel Corporation | Fast electronic comparator |
| JP3392271B2 (ja) * | 1995-11-02 | 2003-03-31 | シャープ株式会社 | 演算増幅回路 |
| US6252435B1 (en) * | 2000-10-05 | 2001-06-26 | Pericom Semiconductor Corp. | Complementary differential amplifier with resistive loads for wide common-mode input range |
| JP2011223130A (ja) * | 2010-04-06 | 2011-11-04 | Fuji Electric Co Ltd | 比較回路 |
| JP5491969B2 (ja) * | 2010-05-31 | 2014-05-14 | ローム株式会社 | トランスミッタ、インタフェイス装置、車載通信システム |
| JP5602170B2 (ja) * | 2012-03-03 | 2014-10-08 | レノボ・シンガポール・プライベート・リミテッド | プロセッサの動作を制御する方法および電子機器 |
| US8736355B2 (en) * | 2012-06-12 | 2014-05-27 | Taiwan Semiconductor Manufacturing Co., Ltd. | Device layout for reference and sensor circuits |
| JP6259649B2 (ja) * | 2013-12-06 | 2018-01-10 | 株式会社小糸製作所 | 車両用灯具 |
| US20170142519A1 (en) * | 2015-11-17 | 2017-05-18 | Cirrus Logic International Semiconductor Ltd. | Digital microphones |
| JP6646490B2 (ja) * | 2016-03-23 | 2020-02-14 | キヤノン株式会社 | 電源回路及び画像形成装置 |
| US10476433B2 (en) * | 2016-07-05 | 2019-11-12 | Delta Electronics, Inc. | Microwave generator with power factor correction function and control method thereof |
| JP7028653B2 (ja) * | 2018-01-17 | 2022-03-02 | ローム株式会社 | 絶縁同期整流型ｄｃ／ｄｃコンバータ |
| JP6647690B1 (ja) * | 2019-10-26 | 2020-02-14 | トレックス・セミコンダクター株式会社 | コンパレータおよびこれを有する充電制御ｉｃ |
| CN112865763B (zh) * | 2019-11-28 | 2025-02-07 | 长鑫存储技术有限公司 | 比较器 |
-
2021
- 2021-02-08 JP JP2022511610A patent/JPWO2021199683A1/ja active Pending
- 2021-02-08 CN CN202180025782.2A patent/CN115362631A/zh active Pending
- 2021-02-08 US US17/913,586 patent/US20230146017A1/en not_active Abandoned
- 2021-02-08 WO PCT/JP2021/004604 patent/WO2021199683A1/ja not_active Ceased
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6116612A (ja) * | 1984-07-03 | 1986-01-24 | Ricoh Co Ltd | コンパレ−タ回路 |
| JPH09321586A (ja) * | 1996-05-29 | 1997-12-12 | Toshiba Microelectron Corp | レベル比較器 |
| JP2010517336A (ja) * | 2007-01-19 | 2010-05-20 | パワー・インテグレーションズ・インコーポレーテッド | 相補的な差動入力段を有する比較器 |
| JP2010199490A (ja) * | 2009-02-27 | 2010-09-09 | Fuji Electric Systems Co Ltd | パワー半導体装置の温度測定装置およびこれを使用したパワー半導体モジュール |
| JP2011027625A (ja) * | 2009-07-28 | 2011-02-10 | Denso Corp | スイッチング素子の温度検出装置 |
| JP2012227517A (ja) * | 2011-04-01 | 2012-11-15 | Rohm Co Ltd | 温度検出装置、温度検出回路およびパワー半導体モジュール |
| JP2013012870A (ja) * | 2011-06-29 | 2013-01-17 | Toshiba Corp | 差動増幅回路及びコンパレータ |
| JP2014020994A (ja) * | 2012-07-20 | 2014-02-03 | Denso Corp | 温度検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115362631A (zh) | 2022-11-18 |
| WO2021199683A1 (ja) | 2021-10-07 |
| US20230146017A1 (en) | 2023-05-11 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
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| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20231208 |
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| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20241001 |
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| A02 | Decision of refusal |
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