JPWO2021044704A5 - - Google Patents

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JPWO2021044704A5
JPWO2021044704A5 JP2021543964A JP2021543964A JPWO2021044704A5 JP WO2021044704 A5 JPWO2021044704 A5 JP WO2021044704A5 JP 2021543964 A JP2021543964 A JP 2021543964A JP 2021543964 A JP2021543964 A JP 2021543964A JP WO2021044704 A5 JPWO2021044704 A5 JP WO2021044704A5
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Japan
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light
angle
diffraction grating
threshold value
reference position
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JP2021543964A
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Japanese (ja)
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JPWO2021044704A1 (https=
JP7616054B2 (ja
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Priority claimed from PCT/JP2020/023847 external-priority patent/WO2021044704A1/ja
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JP2021543964A 2019-09-02 2020-06-17 クロマトグラフ用分光光度計および基準位置検出方法 Active JP7616054B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019159791 2019-09-02
JP2019159791 2019-09-02
PCT/JP2020/023847 WO2021044704A1 (ja) 2019-09-02 2020-06-17 クロマトグラフ用分光光度計および基準位置検出方法

Publications (3)

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JPWO2021044704A1 JPWO2021044704A1 (https=) 2021-03-11
JPWO2021044704A5 true JPWO2021044704A5 (https=) 2022-04-27
JP7616054B2 JP7616054B2 (ja) 2025-01-17

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JP2021543964A Active JP7616054B2 (ja) 2019-09-02 2020-06-17 クロマトグラフ用分光光度計および基準位置検出方法

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JP (1) JP7616054B2 (https=)
WO (1) WO2021044704A1 (https=)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56108923A (en) * 1980-01-31 1981-08-28 Norito Suzuki Sweep control method of luminous analyzing spectroscope using microcomputer
JPS57142524A (en) * 1981-02-27 1982-09-03 Hitachi Ltd Measuring method and device for spectral luminous intensity
US4916645A (en) * 1988-06-02 1990-04-10 The Perkin-Elmer Corporation Continuous monochrometer drift compensation of a spectral monochromator
JPH0660844B2 (ja) * 1989-01-28 1994-08-10 株式会社島津製作所 分光光度計
JPH04290933A (ja) * 1991-03-19 1992-10-15 Hitachi Ltd 回折格子駆動装置
JPH08114538A (ja) * 1994-10-15 1996-05-07 Horiba Ltd 吸光度計
JP3591156B2 (ja) * 1996-09-30 2004-11-17 株式会社島津製作所 分光分析装置
JP2000065641A (ja) * 1998-08-24 2000-03-03 Shimadzu Corp 分光光度計
JP4533527B2 (ja) * 2000-12-05 2010-09-01 アンリツ株式会社 光スペクトラムアナライザおよびその波長校正方法
JP2008292249A (ja) * 2007-05-23 2008-12-04 Hitachi High-Tech Manufacturing & Service Corp 分光光度計

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