JPWO2018038164A1 - 硫化物固体電解質 - Google Patents
硫化物固体電解質 Download PDFInfo
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- 239000002203 sulfidic glass Substances 0.000 title claims abstract description 70
- 239000000203 mixture Substances 0.000 claims abstract description 64
- 239000013078 crystal Substances 0.000 claims abstract description 33
- 238000005259 measurement Methods 0.000 claims description 21
- 238000000634 powder X-ray diffraction Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 abstract description 83
- 229910001416 lithium ion Inorganic materials 0.000 abstract description 10
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 abstract description 5
- 239000000126 substance Substances 0.000 abstract description 2
- 239000012071 phase Substances 0.000 description 47
- 239000007784 solid electrolyte Substances 0.000 description 36
- 150000002500 ions Chemical class 0.000 description 26
- 238000002441 X-ray diffraction Methods 0.000 description 17
- 239000002001 electrolyte material Substances 0.000 description 12
- 229910052744 lithium Inorganic materials 0.000 description 11
- 229910018091 Li 2 S Inorganic materials 0.000 description 10
- 229910052718 tin Inorganic materials 0.000 description 10
- 238000010438 heat treatment Methods 0.000 description 9
- 239000007787 solid Substances 0.000 description 9
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 8
- 239000008188 pellet Substances 0.000 description 8
- 230000009467 reduction Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 239000002994 raw material Substances 0.000 description 7
- 238000003991 Rietveld refinement Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000006104 solid solution Substances 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000000843 powder Substances 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 229910020346 SiS 2 Inorganic materials 0.000 description 3
- 229910008813 Sn—Si Inorganic materials 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 125000002485 formyl group Chemical class [H]C(*)=O 0.000 description 3
- 238000000227 grinding Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 238000003701 mechanical milling Methods 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 238000009740 moulding (composite fabrication) Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 229910010953 LiGePS Inorganic materials 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000008602 contraction Effects 0.000 description 2
- 239000002178 crystalline material Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000008151 electrolyte solution Substances 0.000 description 2
- 238000010348 incorporation Methods 0.000 description 2
- 239000010416 ion conductor Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000007773 negative electrode material Substances 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000007858 starting material Substances 0.000 description 2
- 238000012916 structural analysis Methods 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 230000005469 synchrotron radiation Effects 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 239000002227 LISICON Substances 0.000 description 1
- 229910008029 Li-In Inorganic materials 0.000 description 1
- 229910008323 Li-P-S Inorganic materials 0.000 description 1
- 229910009290 Li2S-GeS2-P2S5 Inorganic materials 0.000 description 1
- 229910009110 Li2S—GeS2—P2S5 Inorganic materials 0.000 description 1
- 229910012851 LiCoO 2 Inorganic materials 0.000 description 1
- 229910013641 LiNbO 3 Inorganic materials 0.000 description 1
- 229910006670 Li—In Inorganic materials 0.000 description 1
- 229910006736 Li—P—S Inorganic materials 0.000 description 1
- 206010027476 Metastases Diseases 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 238000005275 alloying Methods 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000012300 argon atmosphere Substances 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000002484 cyclic voltammetry Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
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- 239000002226 superionic conductor Substances 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 125000000101 thioether group Chemical group 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
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Abstract
Description
非特許文献2は、12×10−3Scm−1という電解液に匹敵するほどの高いイオン導電率を示すLi10GeP2S12(以下において、「LGPS系硫化物固体電解質」、「LGPS」等と称することがある。)について報告している。
また、本発明では、Li含有分やP含有分が従来技術より少ない組成を有する、リチウムイオン伝導性が良好な硫化物固体電解質材料を提供することを目的とする。
本発明により、以下の手段が提供される。
[1]組成式(Li3.45+β-4αSnα)(Si0.36Sn0.09)(P0.55-βSiβ)S4 で示され、ここでα≦0.67;β≦0.33;0.43<α+β(但し、β=0.2のときの0.23<α≦0.4およびβ=0.3のときの0.13<α≦0.4を除いてもよい)、または組成式Li7+γSiγP1−γS6で示され、ここで0.1≦γ<0.3である、結晶構造を有する硫化物固体電解質。
[2]X線波長1.5418オングストロームのCu−Kα線による粉末X線回折測定において、少なくとも、15.9°、18.3°、25.9°、30.4°、31.8°、40.3°、41.3°、45.5°、48.4°の回折角(2θ)付近に特徴的ピークを有する、項目[1]に記載の硫化物固体電解質。
[3]0.2≦βである、項目[1]または[2]に記載の硫化物固体電解質。
なお、図1は、(Li2S)x−(MS2)y−(P2S5)zの三元系組成を平面で表現した図であるが、本発明の硫化物固体電解質材料のM(すなわちSnおよびSi)の組成比αとβが変化する様子を模式的に立体図で表したものが図2である。図2は、本願の組成範囲を理解するための参考図であって、本願発明の硫化物固体電解質材料の組成を正確に表現したものではない点に留意されたい。
より具体的には、本発明の硫化物固体電解質材料の少なくとも一部は、X線波長1.5418オングストロームのCu−Kα線による粉末X線回折測定において、少なくとも、15.9°、18.3°、25.9°、30.4°、31.8°、40.3°、41.3°、45.5°、48.4°の回折角(2θ)付近に特徴的ピークを有する。なお、上述したピークの位置は、±0.50°(中でも±0.30°)の範囲内で前後していても良い。本発明の硫化物固体電解質材料の少なくとも一部は、その特徴的ピークの回折角(2θ)から、アルジロダイト型相を高い割合で含んでいる。
なお、上記の組成範囲の固体電解質材料が、アルジロダイト型相以外の結晶構造、例えばLGPS型相の結晶構造を有する場合もある。本願の組成範囲の固体電解質がLGPS型相を高い割合で含む場合にも、高イオン導電性が得られることが期待される。
上下のラインの間にプロットされている、垂直な記号(|)は、結晶相の空間群の取り得るブラッグ反射の位置であり、このことからも本願の電解質材料が、結晶相を有していることが裏付けられる。
シンクロトロンX線測定は、シンクロトロン放射光(光速に近い速度で直進する電子が、その進行方向を変えられた際に発生する電磁波)を用いた測定法である。シンクロトロン放射光は、輝度が高いため、結晶構造をより詳細に分析できる。
本願の硫化物固体電解質材料は、イオン伝導性が高いことが好ましく、25℃における硫化物固体電解質材料のイオン伝導性は、粉末状の硫化物固体電解質材料を冷間圧縮した場合に、3.9×10−5S/cm以上を得ることができる。本願の電解質材料である、Li3.14[Sn0.74Si]P0.38S6、及びLi7PS6からの誘導体であるLi7.25Si0.25P0.75S6、の冷間圧縮粉体のイオン電導性をACインピーダンス法により測定した結果を表1に示す。
アルゴン雰囲気のグローブボックス内で、出発原料のLi2S、P2S5、SiS2、およびSnS2を所望の組成となるように秤量し、手で粉砕して、さらにボールミルを使用して混合試料を作製した。その試料をペレッターに入れ、一軸プレス機を用いてそのペレッターに20MPaの圧力を印加して、φ13mmのペレットを成形した。カーボンコートした石英管にこのペレットを10Paの略真空で封入した。そして、ペレットを入れた石英管を3時間で560℃まで昇温(昇温速度約3℃/分)させた後、24時間保持し、その後自然冷却した。さらに、その後の評価のために、粉砕を行った。合成した試料の組成は表1の三元図に示される。
作製した試料に含まれる結晶を同定するために、粉末X線回折装置Ulima-IV(株式会社リガク製)およびSmart Lab(株式会社リガク製)を使用して、粉末X線回折測定を行った。粉末X線回折測定には、X線波長1.5418オングストロームのCu−Kα線を使用した。10〜50°の範囲で0.01°ステップで回折角(2θ)で粉末X線回折測定を行った。
粉砕した試料を常温用セルに入れた後、5MPaの圧力を常温用セルに適用してペレットを作製した。そのペレットの両面に金粉末を分散させた後、15MPaの圧力をペレットに適用してペレットの両面に電極を形成して測定用試料を作製した。測定用試料の導電率の測定には、インピーダンス・ゲインフェーズアナライザーSolatron1260(ソーラトロン社製)を使用した。1Hz〜10MHzの測定範囲、25℃の測定温度、50〜100mVの交流電圧および2秒の積算時間の条件で交流インピーダンス測定を行い、試料の導電率を測定した。また、比較例として、本発明の固体電解質とは異なる固体電解質を用いた場合の導電率についても調査を行った。
充放電試験では、リチウムイオン伝導性固体電解質として実施例で得られた硫化物固体電解質材料を、正極活質としてLiNbO3コートしたLiCoO2、負極活物質としてLi−In合金を用いて、挟み込んだ全固体リチウム電池を構成した。これらの電池に、1/20C(=7.25mA/g)で充放電を行った。
(X線回折測定)
上記で得られた硫化物固体電解質材料を用いて、X線回折(XRD)測定を行った。その結果を図3に示す。図3の上方3つのラインは、本願発明の組成範囲内にある硫化物固体電解質材料をCuKα線により測定したXRDである。より具体的には、Li3.225[Sn0.735Si0.99]P0.375S6 (α=0.4,β=0.3)の周辺組成の硫化物固体電解質材料である。図3の下方のラインは、対照となるHT−Li7PS6をCuKα線により測定したXRDパターンである。ここで、典型的なLiアルジロダイトLi7PS6及びLi6PS5Xと比較するために、組成式のSを6に揃えて記載している。Li3.14[Sn0.74Si]P0.38S6において、立方アルジロダイト相の特徴的な回折ピークが、不純物ピークをほとんど伴わずに、観察された。他の組成、Li3.3[Sn0.7Si]P0.38S6及びLi3.45[Sn0.7Si]P0.35S6は、SnとPの含有量を減らして、Li含有量を高めて合成したものである。しかし、未知の相およびLi3PS4 の回折ピークの強度が高まった。
また、図4は、Li7+γSiγP1−γS6のXRD測定を行った結果である。Li7+γSiγP1−γS6は、従来から知られているアルジロライト型Li7PS6をベースとして、PをSiで置換して得た、硫化物固体電解質であり、本願発明の組成範囲では0.1≦γ<0.3である。Siでの置換をしないLi7PS6は、斜方晶の低温相として得られた。0.1≦γ<3では、γの増大とともに、XRDピークが低角度方向へ緩やかにシフトしているが、アルジロダイト相を維持していた。このピークのシフトは、SiによってPが緩やかに置換されていることを示唆している。Pよりも大きなイオン半径を有するSiの組み込みは、アルジロダイト相の格子パラメータの拡大に寄与すると考えられる。一方で、γが0.3まで増大すると、アルジロダイト相でのピークのシフトは見られず、相対的にLi2Sのピークが増大した。このことは、さらにSiがPと置換することはないだろうことを示唆する。これらの結果から、Si4+の導入により、従来の固溶反応によって立方晶アルジロライト型Li7PS6を合成でき、その組成式がLi7+γSiγP1−γS6で示され、ここで0.1≦γ<0.3であることが確認された。
上下のラインの間にプロットされている、垂直な記号(|)は、結晶相の空間群の取り得るブラッグ反射の位置であり、このことからも本願の電解質材料が、結晶相を有していることが裏付けられる。
本願の電解質材料である、Li3.14[Sn0.74Si]P0.38S6、及びLi7PS6の誘導体であるLi7.25Si0.25P0.75S6、の冷間圧縮粉体のイオン電導性をACインピーダンス法により測定した結果を表1に示す。
Li7PS6の誘導体であるLi7+γSiγP1−γS6シリーズでは、Si比が増加するにつれて、Li含有率および格子パラメータの増加により、4.4×10−4Scm−1から9.5×10−4Scm−1に増加するが、その後Li2S不純物により7.2×10−4Scm−1に減少した。Li3.14[Sn0.74Si]P0.38S6のイオン電導性はLi7+γSiγP1−γS6シリーズよりも一桁低い。この原因として、Li含有率が低いことと48hサイトのSn/SiがLi拡散をブロックしていることが考えられる。
充放電試験では、リチウムイオン伝導性固体電解質として、実施例で得られた硫化物固体電解質材料を用いて、全固体リチウム電池を構成した。この電池の充放電の結果を図9に示す。本願の電解質材料を用いたリチウム電池は、問題なく作動することが確認された。すなわち、本願の電解質材料は、電気化学的安定性が高く、且つ、充放電容量の低下が少ないことが確認された。したがって、本願の電解質材料は、理論エネルギー密度最大のLi金属を全固体電池の負極として用いることを可能にし、全固体電池の高エネルギー密度化に大きく寄与すると期待される。
Claims (3)
- 組成式(Li3.45+β-4αSnα)(Si0.36Sn0.09)(P0.55-βSiβ)S4 で示され、ここでα≦0.67;β≦0.33;0.43<α+β(但し、β=0.2のときの0.23<α≦0.4およびβ=0.3のときの0.13<α≦0.4を除く)、または組成式Li7+γSiγP1−γS6で示され、ここで0.1≦γ<0.3である、結晶構造を有する硫化物固体電解質。
- X線波長1.5418オングストロームのCu−Kα線による粉末X線回折測定において、少なくとも、15.9°、18.3°、25.9°、30.4°、31.8°、40.3°、41.3°、45.5°、48.4°の回折角(2θ)付近に特徴的ピークを有する、請求項1に記載の硫化物固体電解質。
- 0.2≦βである、請求項1または2に記載の硫化物固体電解質。
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