JPWO2017168745A1 - Conductor forming apparatus and conductor manufacturing method - Google Patents

Conductor forming apparatus and conductor manufacturing method Download PDF

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JPWO2017168745A1
JPWO2017168745A1 JP2016564116A JP2016564116A JPWO2017168745A1 JP WO2017168745 A1 JPWO2017168745 A1 JP WO2017168745A1 JP 2016564116 A JP2016564116 A JP 2016564116A JP 2016564116 A JP2016564116 A JP 2016564116A JP WO2017168745 A1 JPWO2017168745 A1 JP WO2017168745A1
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pattern
plating
thin film
conductive thin
peeling
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藤川 治
治 藤川
義夫 中山
義夫 中山
政憲 秋山
政憲 秋山
豊 秋元
豊 秋元
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CHEMITRON INC.
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/18Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material

Abstract

搬送装置11は、現像装置12からパターンめっき装置13及び剥離装置14を経由してエッチング装置15に至る搬送経路20の全域のうち、少なくとも現像装置12からパターンめっき装置13までの範囲において、基材1を略鉛直に起立した姿勢で連続的に搬送する。The conveying device 11 includes a base material in a range from the developing device 12 to the pattern plating device 13 at least in the entire conveyance path 20 from the developing device 12 to the etching device 15 via the pattern plating device 13 and the peeling device 14. 1 is continuously conveyed in an upright posture.

Description

本発明は、プリント基板等の導体形成装置及び導体製造方法に関する。   The present invention relates to a conductor forming apparatus such as a printed circuit board and a conductor manufacturing method.

プリント基板等に回路を形成する方法として、アディティブ法が知られている。アディティブ法では、例えば特許文献1に記載されているように、処理対象物の表面の導電性薄膜上に、導体パターンとは逆パターンのめっきレジストを形成し(現像工程)、導電性薄膜におけるめっきレジストが形成されていない表面領域に、導体パターンを形成し(パターンめっき工程)、導電性薄膜上からめっきレジストを剥離し(剥離工程)、導体パターン下の領域を除く導電性薄膜を、所定のエッチング液を用いた化学エッチングにより除去して(エッチング工程)、回路パターンを形成する。   An additive method is known as a method for forming a circuit on a printed circuit board or the like. In the additive method, as described in Patent Document 1, for example, a plating resist having a pattern opposite to the conductive pattern is formed on the conductive thin film on the surface of the object to be processed (development process), and plating on the conductive thin film is performed. A conductive pattern is formed on the surface region where the resist is not formed (pattern plating step), the plating resist is peeled off from the conductive thin film (peeling step), and the conductive thin film excluding the region under the conductive pattern Removal by chemical etching using an etching solution (etching process) to form a circuit pattern.

従来の一般的な導体形成装置では、処理対象物を略水平に倒伏した状態で搬送する水平搬送と、処理対象物を略鉛直に起立した状態で搬送する垂直搬送とが混在する。処理対象物は、例えば現像工程(現像装置)では水平搬送され、パターンめっき工程(パターンめっき装置)では垂直搬送され、剥離工程(剥離装置)及びエッチング工程(エッチング装置)では水平搬送される。   In a conventional general conductor forming apparatus, there are a mixture of horizontal transport for transporting a processing object in a state of lying substantially horizontally and vertical transport for transporting a processing object in an upright position. For example, the processing object is horizontally conveyed in the developing process (developing apparatus), vertically conveyed in the pattern plating process (pattern plating apparatus), and horizontally conveyed in the peeling process (peeling apparatus) and the etching process (etching apparatus).

特開平6−164104号公報JP-A-6-164104

上記従来の一般的な導体形成装置では、現像装置、剥離装置及びエッチング装置の各工程において、処理対象物は水平搬送される。このような水平搬送では、搬送ローラーと処理対象物とが接触するため、処理対象物の表面(回路パターン)への負荷が大きく、細線化になるほど、レジストのつぶれや欠け等が発生し、その結果、パターン断線や短絡等の不良が発生し易くなる。   In the conventional general conductor forming apparatus, the processing object is horizontally transported in each step of the developing device, the peeling device, and the etching device. In such horizontal conveyance, the conveyance roller and the object to be processed are in contact with each other, so that the load on the surface (circuit pattern) of the object to be processed is large. As a result, defects such as pattern disconnection and short circuit are likely to occur.

また、現像装置とパターンめっき装置との間では、処理対象物を、現像装置の水平搬送型の搬送装置から取外し(搬送ローラー上から受け取り)、パターンめっき装置の垂直搬送型の搬送装置に取付け直す必要がある。同様に、パターンめっき装置と剥離装置との間では、処理対象物を、パターンめっき装置の垂直搬送型の搬送装置から取外し、剥離装置の水平搬送型の搬送装置に取付け直す(搬送ローラー上に再び置く)必要がある。このため、作業効率の低下や、工数の増大や、搬送装置の分割による装置の大型化や複雑化を招くとともに、処理対象物の取外し及び取付けによる不良が発生し易くなる。   Further, between the developing device and the pattern plating device, the object to be processed is removed from the horizontal conveying type conveying device of the developing device (received from the conveying roller) and reattached to the vertical conveying type conveying device of the pattern plating device. There is a need. Similarly, between the pattern plating apparatus and the peeling apparatus, the object to be processed is removed from the vertical conveying type conveying apparatus of the pattern plating apparatus and reattached to the horizontal conveying type conveying apparatus of the peeling apparatus (on the conveying roller again). Need to put). For this reason, work efficiency is reduced, man-hours are increased, and the size and complexity of the apparatus are increased due to the division of the transfer apparatus, and defects due to removal and attachment of the processing object are likely to occur.

そこで、本発明は、品質の安定化及び作業効率の向上を図ることが可能な導体形成装置及び導体製造方法の提供を目的とする。   Then, an object of this invention is to provide the conductor formation apparatus and conductor manufacturing method which can aim at stabilization of quality and improvement of work efficiency.

上記目的を達成すべく、本発明の導体形成装置は、搬送手段と、現像装置と、パターンめっき装置と、剥離装置と、エッチング装置とを備える。   In order to achieve the above object, the conductor forming apparatus of the present invention includes a conveying means, a developing device, a pattern plating device, a peeling device, and an etching device.

搬送手段は、絶縁性の基板の表面に導電性薄膜を有する処理対象物を、所定の搬送経路に沿って上流側から下流側へ搬送する。現像装置は、搬送経路に沿って搬送される処理対象物の導電性薄膜上に、導体パターンとは逆パターンのめっきレジストを形成する。パターンめっき装置は、現像装置の下流側に配置され、導電性薄膜におけるめっきレジストが形成されていない表面領域に、導体パターンを形成する。剥離装置は、パターンめっき装置の下流側に配置され、導電性薄膜上からめっきレジストを剥離する。エッチング装置は、剥離装置の下流側に配置され、導体パターン下の領域を除く導電性薄膜を、所定のエッチング液を用いた化学エッチングにより除去する。   The conveyance means conveys a processing object having a conductive thin film on the surface of an insulating substrate from the upstream side to the downstream side along a predetermined conveyance path. The developing device forms a plating resist having a pattern opposite to the conductor pattern on the conductive thin film of the object to be processed conveyed along the conveyance path. The pattern plating apparatus is disposed on the downstream side of the developing device, and forms a conductor pattern in a surface region where the plating resist in the conductive thin film is not formed. The peeling device is disposed on the downstream side of the pattern plating device and peels the plating resist from the conductive thin film. The etching apparatus is disposed on the downstream side of the peeling apparatus, and removes the conductive thin film excluding the region under the conductor pattern by chemical etching using a predetermined etching solution.

本発明の第1の態様の導体形成装置では、搬送手段は、現像装置からパターンめっき装置及び剥離装置を経由してエッチング装置に至る搬送経路のうち、少なくとも現像装置からパターンめっき装置までの範囲において、処理対象物を略鉛直に起立した姿勢で連続的に搬送する。   In the conductor forming apparatus according to the first aspect of the present invention, the conveying means is at least in the range from the developing apparatus to the pattern plating apparatus in the conveying path from the developing apparatus to the etching apparatus via the pattern plating apparatus and the peeling apparatus. Then, the object to be processed is continuously conveyed in an upright posture.

また、本発明の導体製造方法は、現像工程と、パターンめっき工程と、剥離工程と、エッチング工程とを備える。   Moreover, the conductor manufacturing method of this invention is equipped with the image development process, the pattern plating process, the peeling process, and the etching process.

現像工程では、絶縁性の基板の表面に導電性薄膜を有し所定の搬送経路に沿って搬送される処理対象物の導電性薄膜上に、導体パターンとは逆パターンのめっきレジストを形成する。パターンめっき工程では、現像工程から搬送経路に沿って搬送される処理対象物の導電性薄膜におけるめっきレジストが形成されていない領域に、導体パターンを形成する。剥離工程では、パターンめっき工程から搬送経路に沿って搬送される処理対象物の導電性薄膜上からめっきレジストを剥離する。エッチング工程では、剥離工程から搬送経路に沿って搬送される処理対象物の導体パターン下の領域を除く導電性薄膜を、所定のエッチング液を用いた化学エッチングにより除去する。   In the development step, a plating resist having a pattern opposite to the conductor pattern is formed on the conductive thin film of the object to be processed which has a conductive thin film on the surface of the insulating substrate and is transported along a predetermined transport path. In the pattern plating process, a conductor pattern is formed in a region where the plating resist is not formed in the conductive thin film of the object to be processed conveyed along the conveyance path from the development process. In the stripping step, the plating resist is stripped from the conductive thin film of the processing object transported along the transport path from the pattern plating step. In the etching process, the conductive thin film excluding the region under the conductor pattern of the object to be processed that is transported along the transport path from the peeling process is removed by chemical etching using a predetermined etching solution.

本発明の第1の態様の導体製造方法では、現像工程からパターンめっき工程及び剥離工程を経由してエッチング工程に至る搬送経路のうち、少なくとも現像工程からパターンめっき工程までの範囲において、処理対象物を略鉛直に起立した姿勢で連続的に搬送する。   In the conductor manufacturing method according to the first aspect of the present invention, the object to be processed is at least in the range from the development step to the pattern plating step in the transport path from the development step to the etching step via the pattern plating step and the peeling step. Is continuously transported in a vertically standing posture.

上記第1の態様の装置及び方法によれば、処理対象物は、搬送経路のうち現像装置(現像工程)からパターンめっき装置(パターンめっき工程)までの範囲において、略鉛直に起立した姿勢で連続的に搬送される。このため、現像工程及びパターンめっき工程において、処理対象物と搬送ローラー等との接触を防止することができ、レジストのつぶれや欠け等が生じ難くなり、パターン断線や短絡等の不良の発生を抑制することができる。   According to the apparatus and method of the first aspect, the object to be processed is continuously in an upright posture in the range from the developing device (developing step) to the pattern plating device (pattern plating step) in the transport path. Is conveyed. For this reason, in the development process and the pattern plating process, it is possible to prevent contact between the object to be processed and the transfer roller, etc., resist crushing and chipping are less likely to occur, and suppress occurrence of defects such as pattern disconnection and short circuit. can do.

また、現像工程とパターンめっき工程との間を搬送経路が連続するので、工程間で処理対象物の取外しや取付けを行う必要がない。このため、作業効率の低下や、工数の増大や、搬送装置の分割による装置の大型化や複雑化を招くことがなく、且つ処理対象物の取外し及び取付けによる不良も発生しない。   Moreover, since a conveyance path | route continues between a image development process and a pattern plating process, it is not necessary to remove and attach a process target object between processes. For this reason, the work efficiency is not reduced, the number of man-hours is increased, the apparatus is not enlarged or complicated due to the division of the transfer apparatus, and the defect due to the removal and attachment of the processing object does not occur.

本発明の第2の態様の導体形成装置では、搬送手段は、現像装置からパターンめっき装置及び剥離装置を経由してエッチング装置に至る搬送経路のうち、少なくともパターンめっき装置から剥離装置までの範囲において、処理対象物を略鉛直に起立した姿勢で連続的に搬送する。   In the conductor forming apparatus according to the second aspect of the present invention, the conveying means is at least in the range from the pattern plating apparatus to the peeling apparatus in the conveyance path from the developing apparatus to the etching apparatus via the pattern plating apparatus and the peeling apparatus. Then, the object to be processed is continuously conveyed in an upright posture.

本発明の第2の態様の導体製造方法では、現像工程からパターンめっき工程及び剥離工程を経由してエッチング工程に至る搬送経路のうち、少なくともパターンめっき工程から剥離工程までの範囲において、処理対象物を略鉛直に起立した姿勢で連続的に搬送する。   In the conductor manufacturing method according to the second aspect of the present invention, the object to be processed is at least in the range from the pattern plating step to the peeling step in the transport path from the development step to the etching step via the pattern plating step and the peeling step. Is continuously transported in a vertically standing posture.

上記第2の態様の装置及び方法によれば、処理対象物は、搬送経路のうちパターンめっき装置(パターンめっき工程)から剥離装置(剥離工程)までの範囲において、略鉛直に起立した姿勢で連続的に搬送される。このため、パターンめっき工程及び剥離工程において、処理対象物と搬送ローラー等との接触を防止することができ、パターンへのダメージが低減し又は無くなり、パターン断線や短絡等の不良の発生を抑制することができる。   According to the apparatus and method of the said 2nd aspect, a process target object is continuous with the attitude | position standing substantially vertically in the range from a pattern plating apparatus (pattern plating process) to a peeling apparatus (peeling process) among conveyance paths. Is conveyed. For this reason, in a pattern plating process and a peeling process, a contact with a processing object, a conveyance roller, etc. can be prevented, damage to a pattern is reduced or eliminated, and generation | occurrence | production of defects, such as a pattern disconnection and a short circuit, is suppressed. be able to.

また、パターンめっき工程と剥離工程との間を搬送経路が連続するので、工程間で処理対象物の取外しや取付けを行う必要がない。このため、作業効率の低下や、工数の増大や、搬送装置の分割による装置の大型化や複雑化を招くことがなく、且つ処理対象物の取外し及び取付けによる不良も発生しない。   Moreover, since a conveyance path | route continues between a pattern plating process and a peeling process, it is not necessary to remove and attach a process target object between processes. For this reason, the work efficiency is not reduced, the number of man-hours is increased, the apparatus is not enlarged or complicated due to the division of the transfer apparatus, and the defect due to the removal and attachment of the processing object does not occur.

本発明の第3の態様の導体形成装置では、搬送手段は、現像装置からパターンめっき装置及び剥離装置を経由してエッチング装置に至る搬送経路の全域において、処理対象物を略鉛直に起立した姿勢で連続的に搬送する。   In the conductor forming apparatus according to the third aspect of the present invention, the conveying means has a posture in which the object to be processed stands substantially vertically over the entire conveying path from the developing device to the etching device via the pattern plating device and the peeling device. Convey continuously.

本発明の第3の態様の導体製造方法では、現像工程からパターンめっき工程及び剥離工程を経由してエッチング工程に至る搬送経路の全域において、処理対象物を略鉛直に起立した姿勢で連続的に搬送する。   In the conductor manufacturing method according to the third aspect of the present invention, the object to be processed is continuously raised in a vertically standing position throughout the entire conveyance path from the development process to the etching process via the pattern plating process and the peeling process. Transport.

上記第3の態様の装置及び方法によれば、処理対象物は、現像工程からパターンめっき工程及び剥離工程を経由してエッチング工程まで連続する搬送経路の全域において、略鉛直に起立した姿勢で搬送される。このため、処理対象物と搬送ローラー等との接触を防止することができ、レジストのつぶれや欠け等が生じ難くなり、パターン断線や短絡等の不良の発生を抑制することができる。   According to the apparatus and method of the third aspect, the object to be processed is conveyed in a substantially vertically upright position throughout the entire conveyance path from the development process to the etching process via the pattern plating process and the peeling process. Is done. For this reason, it is possible to prevent contact between the object to be processed and the conveying roller, and resist resist crushing, chipping, and the like, and occurrence of defects such as pattern disconnection and short circuit can be suppressed.

また、各工程間を搬送経路が連続するので、工程間で処理対象物の取外しや取付けを行う必要がない。このため、作業効率の低下や、工数の増大や、搬送装置の分割による装置の大型化や複雑化を招くことがなく、且つ処理対象物の取外し及び取付けによる不良も発生しない。   In addition, since the conveyance path is continuous between the processes, it is not necessary to remove or attach the processing object between the processes. For this reason, the work efficiency is not reduced, the number of man-hours is increased, the apparatus is not enlarged or complicated due to the division of the transfer apparatus, and the defect due to the removal and attachment of the processing object does not occur.

本発明の第4の態様の導体形成装置は、第1又は第3の態様の導体形成装置であって、現像工程とパターンめっき装置との間に配置され、搬送経路に沿って搬送される処理対象物が通過する第1の搬送室を備える。第1の搬送室には、処理対象物の乾燥を防止するために第1の搬送室を加湿する第1の加湿手段が設けられている。   The conductor forming apparatus according to the fourth aspect of the present invention is the conductor forming apparatus according to the first or third aspect, and is disposed between the developing step and the pattern plating apparatus and is transported along the transport path. A first transfer chamber through which the object passes is provided. The first transfer chamber is provided with a first humidifying means for humidifying the first transfer chamber in order to prevent the processing object from drying.

第4の態様の導体形成装置によれば、基板の表面の略全域が水の膜で覆われた状態の処理対象物をパターンめっき装置に供給することができる。これにより、基板の表面の空気酸化を最小限に抑えることができ、めっき前処理での化学薬品による強力な酸化被膜除去処理が不要となる。また、基板の表面の水濡れ性を良好に保つことができるので、水洗処理に要する水量を大幅に削減することができる。   According to the conductor forming apparatus of the fourth aspect, it is possible to supply the processing object in a state where substantially the entire surface of the substrate is covered with the water film to the pattern plating apparatus. As a result, air oxidation on the surface of the substrate can be minimized, and a powerful oxide film removal process using chemicals in the pre-plating process becomes unnecessary. Moreover, since the water wettability of the surface of the substrate can be kept good, the amount of water required for the water washing treatment can be greatly reduced.

また、現像からパターンめっきまで連続的に基板の全表面が水の膜に覆われた状態に保たれるため、基板表面に形成されたレジスト皮膜回路の凹部に取り込まれた気泡に起因するめっきの析出不良を著しく低減することができる。   In addition, since the entire surface of the substrate is continuously covered with a water film from development to pattern plating, plating caused by bubbles taken into the recesses of the resist film circuit formed on the substrate surface Deposition failure can be significantly reduced.

本発明の第5の態様の導体形成装置は、第2又は第3の態様の導体形成装置であって、パターンめっき装置と剥離装置の間に配置され、搬送経路に沿って搬送される処理対象物が通過する第2の搬送室を備える。第2の搬送室には、処理対象物の乾燥を防止するために第2の搬送室を加湿する第2の加湿手段が設けられている。   The conductor forming apparatus according to the fifth aspect of the present invention is the conductor forming apparatus according to the second or third aspect, and is disposed between the pattern plating apparatus and the peeling apparatus and is conveyed along the conveyance path. A second transfer chamber through which an object passes is provided. The second transfer chamber is provided with second humidifying means for humidifying the second transfer chamber in order to prevent the processing object from drying.

第5の態様の導体形成装置によれば、非乾燥状態(ウェット状態)の処理対象物を剥離工程に供給することができる。これにより、基板の表面を常に水に濡れた状態に保つことができ、水濡れ性を良好に保つことができる。   According to the conductor forming apparatus of the fifth aspect, it is possible to supply the non-dry state (wet state) processing object to the peeling step. Thereby, the surface of a board | substrate can always be kept in the state wet with water, and water wettability can be kept favorable.

また、パターンめっき後の基板全域に亘り薄い水の膜が形成されたまま処理対象物が剥離工程へと送られるため、特にレジスト皮膜上への油膜や異物の付着防止効果が得られ、 レジスト剥離液がレジスト皮膜と接触する阻害因子を十分に且つ確実に排除することができる。   In addition, since the object to be processed is sent to the peeling process with a thin water film formed over the entire area of the substrate after pattern plating, the effect of preventing the adhesion of an oil film or foreign matter on the resist film is obtained. Inhibitors that cause the liquid to come into contact with the resist film can be eliminated sufficiently and reliably.

本発明によれば、品質の安定化及び作業効率の向上を図ることができる。   According to the present invention, quality can be stabilized and work efficiency can be improved.

本発明の一実施形態に係る導体形成装置の全体を模式的に示す平面図である。It is a top view showing typically the whole conductor formation device concerning one embodiment of the present invention. 図1の現像装置及び第1方向転換機構を模式的に示す平面図である。FIG. 2 is a plan view schematically showing the developing device and the first direction changing mechanism of FIG. 1. 図1の現像装置を模式的に示す側面図である。FIG. 2 is a side view schematically showing the developing device of FIG. 1. 図1の第2方向転換機構、剥離装置及びエッチング装置を模式的に示す平面図である。It is a top view which shows typically the 2nd direction change mechanism, peeling apparatus, and etching apparatus of FIG. 処理対象物を垂直搬送する状態を模式的に示す斜視図である。It is a perspective view which shows typically the state which conveys a process target object vertically. アディティブ法による工程を説明するための模式図であり、(a)は基材を、(b)は導電性薄膜を形成した状態を、(c)はめっきレジストを形成した状態を、(d)は導電層を形成した状態を、(e)はめっきレジストを剥離した状態を、(f)は導電性薄膜を化学エッチングにより除去した状態をそれぞれ示す。It is a schematic diagram for demonstrating the process by an additive method, (a) is a base material, (b) is the state which formed the electroconductive thin film, (c) is the state which formed the plating resist, (d) Indicates a state where a conductive layer is formed, (e) indicates a state where the plating resist is peeled off, and (f) indicates a state where the conductive thin film is removed by chemical etching.

以下、本発明の一実施形態に係る導体形成装置10について、図面に基づいて説明する。   Hereinafter, the conductor formation apparatus 10 which concerns on one Embodiment of this invention is demonstrated based on drawing.

まず、導体形成装置10を用いたアディティブ法によるプリント配線板の製造方法の概要について、図6を参照して説明する。   First, an outline of a method for manufacturing a printed wiring board by an additive method using the conductor forming apparatus 10 will be described with reference to FIG.

アディティブ法では、図6(a)に示すように、絶縁層からなる基材(基板)1を用意する。基材1は、例えばエポキシやポリイミド、その他の樹脂からなる絶縁性の薄肉状のフィルムや薄板等である。なお、銅張積層板又は金属箔からなる基板上に樹脂を塗布することにより基材1を形成してもよい。   In the additive method, as shown in FIG. 6A, a base material (substrate) 1 made of an insulating layer is prepared. The substrate 1 is, for example, an insulating thin-walled film or thin plate made of epoxy, polyimide, or other resin. In addition, you may form the base material 1 by apply | coating resin on the board | substrate consisting of a copper clad laminated board or metal foil.

次に、図6(b)に示すように、基材1の表面上にスパッタリングや無電解銅めっき等によって導電性薄膜2を所定の膜厚(例えば10μm以下)で形成する。なお、基材1に銅張積層板を使用することで、その銅箔を導電性薄膜2としてもよい。   Next, as shown in FIG. 6B, the conductive thin film 2 is formed on the surface of the substrate 1 with a predetermined film thickness (for example, 10 μm or less) by sputtering, electroless copper plating, or the like. In addition, it is good also considering the copper foil as the electroconductive thin film 2 by using a copper clad laminated board for the base material 1. FIG.

次に、図6(c)に示すように、導電性薄膜2上に例えばドライフィルム等をラミネートし、露光および現像することにより、後工程で形成される導体パターン4とは逆パターンのめっきレジスト3を形成する(現像工程)。   Next, as shown in FIG. 6C, for example, a dry film or the like is laminated on the conductive thin film 2, and exposure and development are performed, whereby a plating resist having a pattern opposite to that of the conductor pattern 4 formed in a subsequent process is obtained. 3 is formed (developing step).

次に、図6(d)に示すように、導電性薄膜2におけるめっきレジスト3が形成されていない表面領域に、例えば硫酸銅めっき液を用いて電気めっきにより銅からなる導体パターン4を形成する(パターンめっき工程)。導体パターン4の材料として銅以外の金属または合金を用いてもよい。   Next, as shown in FIG. 6D, a conductive pattern 4 made of copper is formed by electroplating using, for example, a copper sulfate plating solution on the surface region of the conductive thin film 2 where the plating resist 3 is not formed. (Pattern plating process). A metal or alloy other than copper may be used as the material of the conductor pattern 4.

次に、図6(e)に示すように、めっきレジスト3を剥離等により除去する(剥離工程)。   Next, as shown in FIG. 6E, the plating resist 3 is removed by peeling or the like (peeling process).

次に、図6(f)に示すように、導体パターン4下の領域を除く導電性薄膜(被除去層)2を、所定のエッチング液(例えば硫酸過酸化水素水混合液)を用いた化学エッチングにより除去する(エッチング工程)。これにより、基材1上に所定の導体パターン4を有するプリント配線板が形成される。なお、導電性薄膜2が形成された基材1が処理対象物となるが、以下では、処理対象物を単に基材1と称する場合がある。   Next, as shown in FIG. 6 (f), the conductive thin film (removed layer) 2 excluding the region under the conductor pattern 4 is chemically treated with a predetermined etching solution (for example, a mixed solution of sulfuric acid and hydrogen peroxide). It is removed by etching (etching process). Thereby, the printed wiring board which has the predetermined conductor pattern 4 on the base material 1 is formed. In addition, although the base material 1 in which the electroconductive thin film 2 was formed turns into a process target object, a process target object may only be called the base material 1 below.

図1に示すように、導体形成装置10は、搬送装置(搬送手段)11と、現像装置12と、パターンめっき装置13と、剥離装置14と、エッチング装置15と、複数の洗浄装置16とを備える。洗浄装置16は、現像装置12、パターンめっき装置13、剥離装置14及びエッチング装置15の各々に付帯して設けられる。なお、図6では、基材1の一面のみに導体パターン4を形成する場合を例示したが、本実施形態では、基材1の両面に導体パターン4を形成する場合について説明する。すなわち、基材1の両面(両側の表面)に、導電性薄膜2が形成されて、現像工程からエッチング工程までの処理が施される。また、本実施形態の基材1は、所定の大きさに切断された平板材である。   As shown in FIG. 1, the conductor forming apparatus 10 includes a transport device (transport means) 11, a developing device 12, a pattern plating device 13, a peeling device 14, an etching device 15, and a plurality of cleaning devices 16. Prepare. The cleaning device 16 is attached to each of the developing device 12, the pattern plating device 13, the peeling device 14, and the etching device 15. 6 illustrates the case where the conductor pattern 4 is formed only on one surface of the base material 1, but in this embodiment, the case where the conductor pattern 4 is formed on both surfaces of the base material 1 will be described. That is, the conductive thin film 2 is formed on both surfaces (surfaces on both sides) of the base material 1, and processing from the development process to the etching process is performed. Moreover, the base material 1 of this embodiment is a flat plate material cut into a predetermined size.

搬送装置11は、導電性薄膜2が形成された基材1を、所定の搬送経路20に沿って上流側から下流側へ搬送する。搬送経路20は、直線状に延びる第1ライン21と、第1ライン21と略平行に並んで直線状に延びる第2ライン22と、第1ライン21の一端と第2ライン22の一端とを繋ぐ第3ライン23と、第2ライン22の他端と第1ライン21の他端とを繋ぐ第4ライン24とを有する矩形環状である。剥離装置14とエッチング装置15と現像装置12とは、第1ライン21に沿って並び、パターンめっき装置13は第2ライン22に沿って延びるように配置されている。第1ライン21のエッチング装置15と現像装置12との間には、現像装置12の上流側で作業者Mが基材1を搬送経路20に供給するワーク供給位置25と、エッチング装置15の下流側で作業者Mが搬送経路20から回路形成済みの基材1を取出すワーク取出位置26とが設定されている。搬送経路20は、ワーク供給位置25から、現像装置12とパターンめっき装置13と剥離装置14とエッチング装置15とを順次経由して、現像装置12に戻る。   The transport device 11 transports the base material 1 on which the conductive thin film 2 is formed from the upstream side to the downstream side along a predetermined transport path 20. The conveyance path 20 includes a first line 21 that extends linearly, a second line 22 that extends substantially parallel to the first line 21, and one end of the first line 21 and one end of the second line 22. It is a rectangular ring having a third line 23 that connects and a fourth line 24 that connects the other end of the second line 22 and the other end of the first line 21. The peeling device 14, the etching device 15, and the developing device 12 are arranged along the first line 21, and the pattern plating device 13 is arranged so as to extend along the second line 22. Between the etching device 15 and the developing device 12 on the first line 21, a work supply position 25 where the worker M supplies the base material 1 to the transport path 20 on the upstream side of the developing device 12, and downstream of the etching device 15. On the side, a workpiece take-out position 26 is set where the operator M takes out the substrate 1 on which the circuit has been formed from the transport path 20. The conveyance path 20 returns from the workpiece supply position 25 to the developing device 12 through the developing device 12, the pattern plating device 13, the peeling device 14, and the etching device 15 in order.

搬送装置11は、基材1を保持するワーク保持部材30と、第1ライン21及び第2ライン22に対応してそれぞれ設けられる直線状のレール31(図5参照)と、第3ライン23及び第4ライン24に対応してそれぞれ設けられる第1方向転換機構32及び第2方向転換機構33と、駆動機構37(図3参照)とを備える。   The conveyance device 11 includes a workpiece holding member 30 that holds the base material 1, linear rails 31 (see FIG. 5) provided corresponding to the first line 21 and the second line 22, a third line 23, A first direction changing mechanism 32 and a second direction changing mechanism 33 provided corresponding to the fourth line 24, and a drive mechanism 37 (see FIG. 3) are provided.

図5に示すように、ワーク保持部材30は、基材1の上端縁部を着脱自在に把持するワーク把持部34と、ワーク把持部34から略水平方向に延びるアーム部35と、レール31に沿って移動可能な可動部36とを有し、可動部36は、駆動機構37(図3参照)によってレール31に沿って移動する。すなわち、第1ライン21及び第2ライン22では、ワーク保持部材30はレール31に沿って移動する。なお、ワーク供給位置25でワーク保持部材30に取付けられた基材1は、当該ワーク保持部材30に取付けられたままワーク取出位置26まで移動した後、ワーク取出位置26でワーク保持部材30から取外される。   As shown in FIG. 5, the work holding member 30 includes a work gripping portion 34 that detachably grips the upper edge of the substrate 1, an arm portion 35 that extends from the work gripping portion 34 in a substantially horizontal direction, and a rail 31. The movable portion 36 is movable along the rail 31 by a drive mechanism 37 (see FIG. 3). That is, in the first line 21 and the second line 22, the work holding member 30 moves along the rail 31. The substrate 1 attached to the workpiece holding member 30 at the workpiece supply position 25 moves to the workpiece removal position 26 while being attached to the workpiece holding member 30, and then is removed from the workpiece holding member 30 at the workpiece removal position 26. Removed.

図2に示すように、第1方向転換機構32は、第1ライン21の一端に到達したワーク保持部材30を、第1の搬送室41内の第3ライン23に沿って第2ライン22の一端までスライド移動する。また、図4に示すように、第2方向転換機構33は、第2ライン22の他端に到達したワーク保持部材30を、第2の搬送室42内の第4ライン24に沿って第1ライン21の他端までスライド移動する。従って、第1ライン21と第2ライン22とでは、ワーク保持部材30の移動方向38が反転する。   As shown in FIG. 2, the first direction changing mechanism 32 moves the work holding member 30 that has reached one end of the first line 21 along the third line 23 in the first transfer chamber 41 to the second line 22. Slide to one end. Further, as shown in FIG. 4, the second direction changing mechanism 33 moves the work holding member 30 that has reached the other end of the second line 22 along the fourth line 24 in the second transfer chamber 42. Slide to the other end of the line 21. Accordingly, the movement direction 38 of the work holding member 30 is reversed between the first line 21 and the second line 22.

また、第1の搬送室41内と第2の搬送室42内とには、移動する基材1の乾燥防止を目的として、微細な水(ミスト)を噴霧して室内を加湿する複数の噴霧ノズル(加湿手段)43,44がそれぞれ設けられている。第1の搬送室41内を加湿することにより、表面の略全域が水の膜で覆われた状態の基材1をパターンめっき工程に供給することができる。これにより、基材1の露出銅表面の空気酸化を最小限に抑えることができ、めっき前処理での化学薬品による強力な酸化被膜除去処理が不要となる。また、基材1の表面の水濡れ性を良好に保つことができ、従来の過剰に必要な水洗処理を大幅に省略でき、水資源の節約に極めて大きな効果をもたらすことができる。また、第2の搬送室42内を加湿することにより、非乾燥状態(ウェット状態)の基材1を剥離工程に供給することができる。これにより、基材1の表面を常に水に濡れた状態に保つことができ、水濡れ性を良好に保つことができる。なお、各搬送室41,42内を加湿する手段は、ミストを噴霧する噴霧ノズル43,44に限定されず、他の手段(例えば超音波を用いた加湿器など)であってもよい。   In addition, in the first transfer chamber 41 and the second transfer chamber 42, a plurality of sprays for spraying fine water (mist) to humidify the room for the purpose of preventing drying of the moving base material 1. Nozzles (humidifying means) 43 and 44 are provided. By humidifying the inside of the first transfer chamber 41, the substrate 1 in a state where substantially the entire surface is covered with a water film can be supplied to the pattern plating step. Thereby, the air oxidation of the exposed copper surface of the base material 1 can be suppressed to a minimum, and a powerful oxide film removal process with a chemical in the pre-plating process becomes unnecessary. Moreover, the water wettability of the surface of the base material 1 can be kept good, and the conventional excessive water washing treatment can be largely omitted, which can bring about a great effect in saving water resources. Further, by humidifying the inside of the second transfer chamber 42, the base material 1 in a non-dry state (wet state) can be supplied to the peeling step. Thereby, the surface of the base material 1 can always be kept wet with water, and water wettability can be kept favorable. The means for humidifying the inside of the transfer chambers 41 and 42 is not limited to the spray nozzles 43 and 44 for spraying mist, but may be other means (for example, a humidifier using ultrasonic waves).

作業者Mは、図2に示すように、ワーク供給位置25で、ワーク保持部材30のワーク把持部34(図5参照)に基材1の上端縁を装着し、図4に示すように、ワーク取出位置26で、ワーク保持部材30のワーク把持部34(図5参照)から基材1を取外す。ワーク保持部材30に装着された基材1は、ワーク把持部34から略鉛直方向に吊り下がり、第1ライン21及び第2ライン22では、基材1の面方向が各ライン21,22(基材1の移動方向38)に沿う姿勢で略水平に移動し、第3ライン23及び第4ライン24では、基材1の面方向が各ライン23,24(基材1の移動方向38)と略直交する姿勢で略水平に移動する。このように、搬送装置11は、ワーク供給位置25から現像装置12、パターンめっき装置13、剥離装置14、エッチング装置15を経由してワーク取出位置26まで連続する搬送経路20の全域において、基材1を略鉛直に起立した姿勢で搬送する。なお、本実施形態の基材1(ワーク保持部材30)の移動方向38は、図1において反時計回りであるが、移動方向38を反対方向(時計回り)に設定してもよい。   As shown in FIG. 2, the worker M attaches the upper edge of the substrate 1 to the work gripping portion 34 (see FIG. 5) of the work holding member 30 at the work supply position 25, and as shown in FIG. 4, At the workpiece removal position 26, the base material 1 is removed from the workpiece gripping portion 34 (see FIG. 5) of the workpiece holding member 30. The base material 1 mounted on the work holding member 30 is suspended from the work gripping portion 34 in a substantially vertical direction. In the first line 21 and the second line 22, the surface direction of the base material 1 is the lines 21, 22 (base In the third line 23 and the fourth line 24, the surface direction of the base material 1 is the lines 23 and 24 (the movement direction 38 of the base material 1). It moves almost horizontally in a substantially orthogonal posture. In this way, the transport device 11 has a base material in the entire transport path 20 that continues from the work supply position 25 to the work removal position 26 via the developing device 12, the pattern plating device 13, the peeling device 14, and the etching device 15. 1 is conveyed in an upright posture. In addition, although the moving direction 38 of the base material 1 (work holding member 30) of this embodiment is counterclockwise in FIG. 1, the moving direction 38 may be set in the opposite direction (clockwise).

現像装置12は、搬送経路20に沿って搬送される基材1の導電性薄膜2上に、導体パターン4とは逆パターンのめっきレジスト3を形成する(現像工程)。具体的には、導電性薄膜2上にドライフィルムレジストをラミネートし、フォトマスクを介して紫外線を照射してイメージ露光を行った後、現像液(例えば炭酸ナトリウム)を複数のスプレーノズル40から基材1の両面に向けて噴射して現像を行い、めっきレジスト3を形成する(図3参照)。   The developing device 12 forms a plating resist 3 having a pattern opposite to the conductor pattern 4 on the conductive thin film 2 of the base material 1 conveyed along the conveyance path 20 (development process). Specifically, after laminating a dry film resist on the conductive thin film 2 and performing image exposure by irradiating ultraviolet rays through a photomask, a developer (for example, sodium carbonate) is applied from a plurality of spray nozzles 40. Development is performed by spraying on both surfaces of the material 1 to form a plating resist 3 (see FIG. 3).

パターンめっき装置13は、現像装置12の下流側に配置されて第2ライン22に沿って直線状に並ぶ複数のめっき室13aを有し、各めっき室13a内において、導電性薄膜2におけるめっきレジスト3が形成されていない表面領域に、導体パターン4を形成する(パターンめっき工程)。具体的には、めっき槽(図示省略)内の所定のめっき液(例えば硫酸銅めっき液)に基材1を起立状態で浸漬しながら搬送し、搬送しながら浸漬し、電気めっきすることによって導体パターン4を形成する。   The pattern plating apparatus 13 has a plurality of plating chambers 13a arranged on the downstream side of the developing device 12 and arranged linearly along the second line 22, and in each plating chamber 13a, a plating resist in the conductive thin film 2 is provided. Conductive pattern 4 is formed in a surface region where 3 is not formed (pattern plating step). Specifically, the conductor 1 is transported while being immersed in a predetermined plating solution (for example, copper sulfate plating solution) in a plating tank (not shown) while being immersed in an upright state, immersed while being transported, and electroplated. Pattern 4 is formed.

パターンめっき装置13で行われるパターンめっき工程は、めっき前処理とめっき処理とめっき後処理とを含む。基材1は、めっき前処理用の複数の処理槽とめっき処理用の複数の処理槽(めっき槽)とめっき後処理用の複数の処理槽とを、各処理槽内の処理液に浸漬した状態で順番に移動する。第2ライン22のレール31は、基材1を各処理槽内の処理液に十分に浸漬させる高さ位置に設定され、各処理槽の前後には、処理液に対して基材1の投入(下降)及び取出し(上昇)を行う昇降装置が設けられている。昇降装置は、ワーク保持部材30を上昇させてレール31から可動部36を離脱させ、ワーク保持部材30を下流側へ所定距離移動した後に下降させて、可動部36をレール31に再び載置する。これにより、めっき前処理に到達した基材1は、処理槽の上流端で下降して処理液に浸漬して処理液内を移動し、処理槽の下流端で上昇して次の処理槽へ移動するという動作を、最初(最上流)の処理槽から最後(最下流)の処理槽まで繰り返した後、めっき処理へ移動する。めっき処理に到達した基材1は、めっき槽の上流端で下降して処理液に浸漬して処理液内を移動し、めっき槽の下流端で上昇して次のめっき槽へ移動するという動作を、最初(最上流)のめっき槽から最後(最下流)のめっき槽まで繰り返した後、めっき後処理へ移動する。めっき後処理に到達した基材1は、処理槽の上流端で下降して処理液に浸漬して処理液内を移動し、処理槽の下流端で上昇して次の処理槽へ移動するという動作を、最初(最上流)の処理槽から最後(最下流)の処理槽まで繰り返した後、第4ライン24(第2の搬送室42)へ移動する。   The pattern plating process performed in the pattern plating apparatus 13 includes pre-plating treatment, plating treatment, and post-plating treatment. The base material 1 immersed a plurality of treatment tanks for pre-plating treatment, a plurality of treatment tanks for plating treatment (plating tank), and a plurality of treatment tanks for post-plating treatment in the treatment liquid in each treatment tank. Move in order in the state. The rail 31 of the second line 22 is set at a height position where the base material 1 is sufficiently immersed in the processing liquid in each processing tank, and before and after each processing tank, the base material 1 is charged with respect to the processing liquid. An elevating device that performs (down) and takes out (up) is provided. The lifting device raises the workpiece holding member 30 to disengage the movable portion 36 from the rail 31, moves the workpiece holding member 30 downstream by a predetermined distance, and lowers the workpiece holding member 30 to place the movable portion 36 on the rail 31 again. . As a result, the base material 1 that has reached the pre-plating treatment descends at the upstream end of the treatment tank, is immersed in the treatment liquid and moves in the treatment liquid, and rises at the downstream end of the treatment tank to the next treatment tank. The operation of moving is repeated from the first (most upstream) treatment tank to the last (most downstream) treatment tank, and then moves to the plating process. The base material 1 that has reached the plating process descends at the upstream end of the plating tank, is immersed in the treatment liquid and moves in the treatment liquid, and moves up to the downstream end of the plating tank and moves to the next plating tank. Is repeated from the first (most upstream) plating tank to the last (most downstream) plating tank, and then the process moves to post-plating treatment. The base material 1 that has reached the post-plating process descends at the upstream end of the treatment tank and is immersed in the treatment liquid and moves in the treatment liquid, and rises at the downstream end of the treatment tank and moves to the next treatment tank. After the operation is repeated from the first (most upstream) processing tank to the last (most downstream) processing tank, the operation moves to the fourth line 24 (second transfer chamber 42).

剥離装置14は、パターンめっき装置13の下流側に配置され、導電性薄膜2上からめっきレジスト3を剥離する(剥離工程)。具体的には、所定の剥離液(例えばアミン系剥離液)を、上記現像装置12の場合と同様に複数のスプレーノズル(図示省略)から基材1の両面に向けて噴射して、めっきレジスト3を剥離する。   The peeling device 14 is disposed on the downstream side of the pattern plating device 13 and peels the plating resist 3 from the conductive thin film 2 (peeling step). Specifically, a predetermined stripping solution (for example, an amine-based stripping solution) is sprayed from a plurality of spray nozzles (not shown) to both surfaces of the base material 1 in the same manner as in the developing device 12 to form a plating resist. 3 is peeled off.

エッチング装置15は、剥離装置14の下流側に配置され、導体パターン4下の領域を除く導電性薄膜2を、所定のエッチング液を用いた化学エッチングにより除去する(エッチング工程)。具体的には、所定のエッチング液(処理液)を、上記現像装置12の場合と同様に複数のスプレーノズル(図示省略)から基材1の両面に向けて噴射して、導体パターン4下の領域を除く導電性薄膜2を除去する。   The etching device 15 is disposed on the downstream side of the peeling device 14 and removes the conductive thin film 2 excluding the region under the conductor pattern 4 by chemical etching using a predetermined etching solution (etching process). Specifically, a predetermined etching solution (processing solution) is sprayed toward both surfaces of the substrate 1 from a plurality of spray nozzles (not shown) in the same manner as in the developing device 12, so The conductive thin film 2 excluding the region is removed.

洗浄装置16は、各装置12,13,14,15の各処理(各工程)の下流側(現像装置12では現像処理の下流側、パターンめっき装置13ではめっき前処理の下流側とめっき処理の下流側とめっき後処理の下流側、剥離装置14では剥離処理の下流側、エッチング装置15ではエッチング処理の下流側)にそれぞれ付帯して設けられ、基材1の両面を洗浄する。具体的には、水又は温水を、上記現像装置12の場合と同様に複数のスプレーノズル(図示省略)から基材1の両面に向けて噴射して、基材1の両面を洗浄する。なお、パターンめっき装置13に付帯する洗浄装置16は、洗浄液を貯留する洗浄槽であってもよい。この場合、洗浄槽の前後には、洗浄液に対して基材1の投入及び取出しを行う昇降装置が設けられ、基材1は、洗浄液に浸漬した状態で洗浄される。   The cleaning device 16 is downstream of each processing (each process) of each device 12, 13, 14, 15 (the developing device 12 is downstream of the development processing, the pattern plating device 13 is downstream of the plating pretreatment and the plating processing. Attached to the downstream side and the downstream side of the post-plating treatment, the peeling device 14 on the downstream side of the peeling treatment, and the etching device 15 on the downstream side of the etching treatment, and cleans both surfaces of the substrate 1. Specifically, water or hot water is sprayed toward both surfaces of the substrate 1 from a plurality of spray nozzles (not shown) as in the case of the developing device 12 to clean both surfaces of the substrate 1. The cleaning device 16 attached to the pattern plating device 13 may be a cleaning tank that stores a cleaning liquid. In this case, before and after the cleaning tank, an elevating device for loading and unloading the base material 1 with respect to the cleaning liquid is provided, and the base material 1 is cleaned while being immersed in the cleaning liquid.

本実施形態によれば、ワーク供給位置25から現像工程、パターンめっき工程、剥離工程及びエッチング工程を経由してワーク取出位置26まで連続する搬送経路20の全域において、基材1が略鉛直に起立した姿勢で搬送(垂直搬送)される。このため、基材1と搬送ローラー等との接触を防止することができ、断線等の不良の発生を抑制することができる。   According to the present embodiment, the base material 1 stands substantially vertically in the entire conveyance path 20 from the work supply position 25 to the work removal position 26 via the development process, the pattern plating process, the peeling process, and the etching process. It is conveyed in the posture (vertical conveyance). For this reason, a contact with the base material 1 and a conveyance roller etc. can be prevented, and generation | occurrence | production of defects, such as a disconnection, can be suppressed.

また、各工程間を搬送経路20が連続するので、工程間で基材1の取外しや取付けを行う必要がない。このため、作業効率の低下や、工数の増大や、搬送装置の分割による装置の大型化や複雑化を招くことがなく、且つ基材1の取外し及び取付けによる不良も発生しない。   Moreover, since the conveyance path | route 20 continues between each process, it is not necessary to remove and attach the base material 1 between processes. For this reason, work efficiency is not reduced, man-hours are increased, and the size and complexity of the apparatus are not increased due to the division of the transfer apparatus, and defects due to removal and attachment of the base material 1 do not occur.

以上、本発明について、上記実施形態に基づいて説明を行ったが、本発明は上記実施形態の内容に限定をされるものではなく、当然に本発明を逸脱しない範囲では適宜の変更が可能である。   As described above, the present invention has been described based on the above embodiment, but the present invention is not limited to the content of the above embodiment, and can be appropriately changed without departing from the present invention. is there.

例えば、上記実施形態では、現像装置12からパターンめっき装置13及び剥離装置14を経由してエッチング装置15に至る搬送経路20の全域において基材1を連続的に垂直搬送したが、現像装置12からパターンめっき装置13までの範囲において基材1を垂直搬送し、他の範囲では基材1を水平搬送してもよく、また、パターンめっき装置13から剥離装置14(又はエッチング装置15)までの範囲において基材1を垂直搬送し、他の範囲では基材1を水平搬送してもよい。   For example, in the above-described embodiment, the base material 1 is continuously vertically conveyed over the entire conveyance path 20 from the developing device 12 to the etching device 15 via the pattern plating device 13 and the peeling device 14. The substrate 1 may be vertically conveyed in the range up to the pattern plating apparatus 13, and the substrate 1 may be horizontally conveyed in other ranges, and the range from the pattern plating apparatus 13 to the peeling apparatus 14 (or the etching apparatus 15). The substrate 1 may be conveyed vertically and the substrate 1 may be conveyed horizontally in other ranges.

また、搬送経路20を環状とせず、線状(例えば直線状)としてもよい。また、第1方向転換機構32及び第2方向転換機構33を設けず、レールを環状としてもよい。方向転換機構32,33を備えない搬送装置(例えば、搬送経路を線状とした場合やレールを環状とした場合など)を用いることにより、ロール材から引き出した基材を長尺状のまま連続して搬送することが可能となる。   Moreover, the conveyance path 20 may not be annular, but may be linear (for example, linear). Further, the rails may be annular without providing the first direction changing mechanism 32 and the second direction changing mechanism 33. By using a transport device that does not include the direction changing mechanisms 32 and 33 (for example, when the transport path is linear or when the rail is annular), the base material drawn out from the roll material is continuously long. And can be transported.

本発明は、プリント配線板等の導体形成装置及び導体製造方法として広く用いることができる。   The present invention can be widely used as a conductor forming apparatus such as a printed wiring board and a conductor manufacturing method.

1:基材(基板、処理対象物)
2:導電性薄膜
3:めっきレジスト
4:導体パターン
10:導体形成装置
11:搬送装置(搬送手段)
12:現像装置
13:パターンめっき装置
14:剥離装置
15:エッチング装置
16:洗浄装置
20:搬送経路
21:第1ライン
22:第2ライン
23:第3ライン
24:第4ライン
25:ワーク供給位置
26:ワーク取出位置
30:ワーク保持部材
31:レール
32:第1方向転換機構
33:第2方向転換機構
41:第1の搬送室
42:第2の搬送室
43:噴霧ノズル(第1の加湿手段)
44:噴霧ノズル(第2の加湿手段)
M:作業者
1: Base material (substrate, processing object)
2: Conductive thin film 3: Plating resist 4: Conductor pattern 10: Conductor forming device 11: Conveying device (conveying means)
12: Development device 13: Pattern plating device 14: Peeling device 15: Etching device 16: Cleaning device 20: Transfer route 21: First line 22: Second line 23: Third line 24: Fourth line 25: Work supply position 26: Work removal position 30: Work holding member 31: Rail 32: First direction changing mechanism 33: Second direction changing mechanism 41: First transfer chamber 42: Second transfer chamber 43: Spray nozzle (first humidification) means)
44: Spray nozzle (second humidifying means)
M: Worker

本発明の第4の態様の導体形成装置は、第1又は第3の態様の導体形成装置であって、現像装置とパターンめっき装置との間に配置され、搬送経路に沿って搬送される処理対象物が通過する第1の搬送室を備える。第1の搬送室には、処理対象物の乾燥を防止するために第1の搬送室を加湿する第1の加湿手段が設けられている。
The conductor forming apparatus according to the fourth aspect of the present invention is the conductor forming apparatus according to the first or third aspect, and is disposed between the developing device and the pattern plating apparatus and conveyed along the conveying path. A first transfer chamber through which the object passes is provided. The first transfer chamber is provided with a first humidifying means for humidifying the first transfer chamber in order to prevent the processing object from drying.

本発明の第1の態様の導体形成装置では、搬送手段は、現像装置からパターンめっき装置及び剥離装置を経由してエッチング装置に至る搬送経路のうち、少なくとも現像装置からパターンめっき装置までの範囲において、搬送経路に設けられたレールに沿って移動可能な可動部と、処理対象物の上部を着脱自在に把持する把持部と、可動部と把持部とを連結するアーム部とを有し、処理対象物を略鉛直に起立した姿勢でレールに沿って連続的に搬送する。 In the conductor forming apparatus according to the first aspect of the present invention, the conveying means is at least in the range from the developing apparatus to the pattern plating apparatus in the conveying path from the developing apparatus to the etching apparatus via the pattern plating apparatus and the peeling apparatus. A movable part movable along a rail provided in the conveyance path, a grip part for detachably gripping the upper part of the processing object, and an arm part for connecting the movable part and the grip part. The object is continuously conveyed along the rail in an upright posture.

本発明の第1の態様の導体製造方法では、現像工程からパターンめっき工程及び剥離工程を経由してエッチング工程に至る搬送経路のうち、少なくとも現像工程からパターンめっき工程までの範囲において、搬送経路に設けられたレールに沿って移動可能な可動部と、処理対象物の上部を着脱自在に把持する把持部と、可動部と把持部とを連結するアーム部とを有する搬送手段によって、処理対象物を略鉛直に起立した姿勢でレールに沿って連続的に搬送する。 In the conductor manufacturing method of the first aspect of the present invention, among the transport paths from the development process to the etching process via the pattern plating process and the peeling process, at least in the range from the development process to the pattern plating process , An object to be processed is provided by a conveying means having a movable part movable along a provided rail, a grip part for detachably holding an upper part of the object to be processed, and an arm part for connecting the movable part and the grip part . Is continuously transported along the rails in a substantially vertically standing posture.

本発明の第2の態様の導体形成装置では、搬送手段は、現像装置からパターンめっき装置及び剥離装置を経由してエッチング装置に至る搬送経路のうち、少なくともパターンめっき装置から剥離装置までの範囲において、搬送経路に設けられたレールに沿って移動可能な可動部と、処理対象物の上部を着脱自在に把持する把持部と、可動部と把持部とを連結するアーム部とを有し、処理対象物を略鉛直に起立した姿勢でレールに沿って連続的に搬送する。 In the conductor forming apparatus according to the second aspect of the present invention, the conveying means is at least in the range from the pattern plating apparatus to the peeling apparatus in the conveyance path from the developing apparatus to the etching apparatus via the pattern plating apparatus and the peeling apparatus. A movable part movable along a rail provided in the conveyance path, a grip part for detachably gripping the upper part of the processing object, and an arm part for connecting the movable part and the grip part. The object is continuously conveyed along the rail in an upright posture.

本発明の第2の態様の導体製造方法では、現像工程からパターンめっき工程及び剥離工程を経由してエッチング工程に至る搬送経路のうち、少なくともパターンめっき工程から剥離工程までの範囲において、搬送経路に設けられたレールに沿って移動可能な可動部と、処理対象物の上部を着脱自在に把持する把持部と、可動部と把持部とを連結するアーム部とを有する搬送手段によって、処理対象物を略鉛直に起立した姿勢でレールに沿って連続的に搬送する。 In the conductor manufacturing method of the second aspect of the present invention, at least in the range from the pattern plating step to the peeling step, the transfer route from the development step to the etching step via the pattern plating step and the peeling step An object to be processed is provided by a conveying means having a movable part movable along a provided rail, a grip part for detachably holding an upper part of the object to be processed, and an arm part for connecting the movable part and the grip part . Is continuously transported along the rails in a substantially vertically standing posture.

本発明の第3の態様の導体形成装置では、搬送手段は、現像装置からパターンめっき装置及び剥離装置を経由してエッチング装置に至る搬送経路の全域において、可動部と把持部とアーム部とを有し、処理対象物を略鉛直に起立した姿勢でレールに沿って連続的に搬送する。

In the conductor forming apparatus according to the third aspect of the present invention, the conveying means includes the movable portion, the gripping portion, and the arm portion in the entire conveying path from the developing device to the etching device via the pattern plating device and the peeling device. The processing object is continuously conveyed along the rail in a posture in which the processing object stands substantially vertically.

Claims (6)

絶縁性の基板の表面に導電性薄膜を有する処理対象物を、所定の搬送経路に沿って上流側から下流側へ搬送する搬送手段と、
前記搬送経路に沿って搬送される前記処理対象物の前記導電性薄膜上に、導体パターンとは逆パターンのめっきレジストを形成する現像装置と、
前記現像装置の下流側に配置され、前記導電性薄膜における前記めっきレジストが形成されていない表面領域に、前記導体パターンを形成するパターンめっき装置と、
前記パターンめっき装置の下流側に配置され、前記導電性薄膜上からめっきレジストを剥離する剥離装置と、
前記剥離装置の下流側に配置され、前記導体パターン下の領域を除く前記導電性薄膜を、所定のエッチング液を用いた化学エッチングにより除去するエッチング装置と、を備え、
前記搬送手段は、前記現像装置から前記パターンめっき装置及び前記剥離装置を経由して前記エッチング装置に至る前記搬送経路のうち、少なくとも前記現像装置から前記パターンめっき装置までの範囲において、前記処理対象物を略鉛直に起立した姿勢で連続的に搬送する
ことを特徴とする導体形成装置。
A transport means for transporting a processing object having a conductive thin film on the surface of an insulating substrate from an upstream side to a downstream side along a predetermined transport path;
A developing device that forms a plating resist having a pattern opposite to the conductor pattern on the conductive thin film of the processing object conveyed along the conveyance path;
A pattern plating apparatus that is disposed on the downstream side of the developing device and forms the conductor pattern on a surface region of the conductive thin film where the plating resist is not formed;
A peeling device that is disposed on the downstream side of the pattern plating device and peels a plating resist from the conductive thin film;
An etching apparatus that is disposed on the downstream side of the peeling apparatus and removes the conductive thin film excluding the region under the conductor pattern by chemical etching using a predetermined etching solution,
The conveying means includes the processing object in at least a range from the developing device to the pattern plating device in the conveyance path from the developing device to the etching device via the pattern plating device and the peeling device. A conductor forming apparatus characterized by continuously transporting a wire in an upright posture.
請求項1に記載の導体形成装置であって、
前記現像工程と前記パターンめっき装置との間に配置され、前記搬送経路に沿って搬送される前記処理対象物が通過する搬送室を備え、
前記搬送室には、前記処理対象物の乾燥を防止するために前記搬送室を加湿する加湿手段が設けられている
ことを特徴とする導体形成装置。
The conductor forming apparatus according to claim 1,
A transfer chamber disposed between the development step and the pattern plating apparatus, through which the object to be processed transferred along the transfer path passes;
The conductor forming apparatus, wherein the transfer chamber is provided with humidifying means for humidifying the transfer chamber in order to prevent drying of the processing object.
請求項1又は請求項2に記載の導体形成装置であって、
前記搬送手段は、前記現像装置から前記パターンめっき装置及び前記剥離装置を経由して前記エッチング装置に至る前記搬送経路の全域において、前記処理対象物を略鉛直に起立した姿勢で連続的に搬送する
ことを特徴とする導体形成装置。
The conductor forming device according to claim 1 or 2,
The transport means continuously transports the processing object in an upright posture in the entire region of the transport path from the developing device to the etching device via the pattern plating device and the peeling device. The conductor formation apparatus characterized by the above-mentioned.
絶縁性の基板の表面に導電性薄膜を有する処理対象物を、所定の搬送経路に沿って上流側から下流側へ搬送する搬送手段と、
前記搬送経路に沿って搬送される前記処理対象物の前記導電性薄膜上に、導体パターンとは逆パターンのめっきレジストを形成する現像装置と、
前記現像装置の下流側に配置され、前記導電性薄膜における前記めっきレジストが形成されていない表面領域に、前記導体パターンを形成するパターンめっき装置と、
前記パターンめっき装置の下流側に配置され、前記導電性薄膜上からめっきレジストを剥離する剥離装置と、
前記剥離装置の下流側に配置され、前記導体パターン下の領域を除く前記導電性薄膜を、所定のエッチング液を用いた化学エッチングにより除去するエッチング装置と、を備え、
前記搬送手段は、前記現像装置から前記パターンめっき装置及び前記剥離装置を経由して前記エッチング装置に至る前記搬送経路のうち、少なくとも前記パターンめっき装置から前記剥離装置までの範囲において、前記処理対象物を略鉛直に起立した姿勢で連続的に搬送する
ことを特徴とする導体形成装置。
A transport means for transporting a processing object having a conductive thin film on the surface of an insulating substrate from an upstream side to a downstream side along a predetermined transport path;
A developing device that forms a plating resist having a pattern opposite to the conductor pattern on the conductive thin film of the processing object conveyed along the conveyance path;
A pattern plating apparatus that is disposed on the downstream side of the developing device and forms the conductor pattern on a surface region of the conductive thin film where the plating resist is not formed;
A peeling device that is disposed on the downstream side of the pattern plating device and peels a plating resist from the conductive thin film;
An etching apparatus that is disposed on the downstream side of the peeling apparatus and removes the conductive thin film excluding the region under the conductor pattern by chemical etching using a predetermined etching solution,
The conveying means is the processing object in a range from the developing device to the etching device through the pattern plating device and the peeling device at least in the range from the pattern plating device to the peeling device. A conductor forming apparatus characterized by continuously transporting a wire in an upright posture.
絶縁性の基板の表面に導電性薄膜を有し所定の搬送経路に沿って搬送される処理対象物の前記導電性薄膜上に、導体パターンとは逆パターンのめっきレジストを形成する現像工程と、
前記現像工程から前記搬送経路に沿って搬送される前記処理対象物の前記導電性薄膜における前記めっきレジストが形成されていない表面領域に、前記導体パターンを形成するパターンめっき工程と、
前記パターンめっき工程から前記搬送経路に沿って搬送される前記処理対象物の前記導電性薄膜上から前記めっきレジストを剥離する剥離工程と、
前記剥離工程から前記搬送経路に沿って搬送される前記処理対象物の前記導体パターン下の領域を除く前記導電性薄膜を、所定のエッチング液を用いた化学エッチングにより除去するエッチング工程と、を備え、
前記現像工程から前記パターンめっき工程及び前記剥離工程を経由して前記エッチング工程に至る前記搬送経路のうち、少なくとも前記現像工程から前記パターンめっき工程までの範囲において、前記処理対象物を略鉛直に起立した姿勢で連続的に搬送する
ことを特徴とする導体製造方法。
A development step of forming a plating resist having a pattern opposite to the conductor pattern on the conductive thin film of the object to be processed which has a conductive thin film on the surface of the insulating substrate and is transported along a predetermined transport path;
A pattern plating step of forming the conductor pattern on a surface region where the plating resist is not formed in the conductive thin film of the processing object to be transported along the transport path from the development step;
A peeling step of peeling the plating resist from the conductive thin film of the object to be processed conveyed along the conveyance path from the pattern plating step;
An etching step of removing the conductive thin film excluding a region under the conductor pattern of the processing object conveyed along the conveyance path from the peeling step by chemical etching using a predetermined etching solution. ,
The processing object stands up substantially vertically in at least the range from the development step to the pattern plating step in the transport path from the development step to the etching step via the pattern plating step and the peeling step. A conductor manufacturing method characterized by continuously transporting in a fixed posture.
絶縁性の基板の表面に導電性薄膜を有し所定の搬送経路に沿って搬送される処理対象物の前記導電性薄膜上に、導体パターンとは逆パターンのめっきレジストを形成する現像工程と、
前記現像工程から前記搬送経路に沿って搬送される前記処理対象物の前記導電性薄膜における前記めっきレジストが形成されていない表面領域に、前記導体パターンを形成するパターンめっき工程と、
前記パターンめっき工程から前記搬送経路に沿って搬送される前記処理対象物の前記導電性薄膜上から前記めっきレジストを剥離する剥離工程と、
前記剥離工程から前記搬送経路に沿って搬送される前記処理対象物の前記導体パターン下の領域を除く前記導電性薄膜を、所定のエッチング液を用いた化学エッチングにより除去するエッチング工程と、を備え、
前記現像工程から前記パターンめっき工程及び前記剥離工程を経由して前記エッチング工程に至る前記搬送経路のうち、少なくとも前記パターンめっき工程から前記剥離工程までの範囲において、前記処理対象物を略鉛直に起立した姿勢で連続的に搬送する
ことを特徴とする導体製造方法。
A development step of forming a plating resist having a pattern opposite to the conductor pattern on the conductive thin film of the object to be processed which has a conductive thin film on the surface of the insulating substrate and is transported along a predetermined transport path;
A pattern plating step of forming the conductor pattern on a surface region where the plating resist is not formed in the conductive thin film of the processing object to be transported along the transport path from the development step;
A peeling step of peeling the plating resist from the conductive thin film of the object to be processed conveyed along the conveyance path from the pattern plating step;
An etching step of removing the conductive thin film excluding a region under the conductor pattern of the processing object conveyed along the conveyance path from the peeling step by chemical etching using a predetermined etching solution. ,
The processing object stands up substantially vertically in the range from the pattern plating step to the peeling step at least in the transport path from the developing step to the etching step via the pattern plating step and the peeling step. A conductor manufacturing method characterized by continuously transporting in a fixed posture.
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JP2002114361A (en) * 2000-10-10 2002-04-16 C Uyemura & Co Ltd Carrying direction converting device for planar work
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