JPWO2015030199A1 - 太陽電池素子およびその製造方法 - Google Patents
太陽電池素子およびその製造方法 Download PDFInfo
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- 238000004519 manufacturing process Methods 0.000 title claims description 17
- 239000011521 glass Substances 0.000 claims abstract description 131
- 239000000758 substrate Substances 0.000 claims abstract description 130
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 118
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 116
- 239000010703 silicon Substances 0.000 claims abstract description 116
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 73
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 claims abstract description 66
- 229910052714 tellurium Inorganic materials 0.000 claims abstract description 65
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 60
- XHCLAFWTIXFWPH-UHFFFAOYSA-N [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] XHCLAFWTIXFWPH-UHFFFAOYSA-N 0.000 claims abstract description 59
- 229910001935 vanadium oxide Inorganic materials 0.000 claims abstract description 59
- 229910052810 boron oxide Inorganic materials 0.000 claims abstract description 57
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 claims abstract description 57
- 239000004065 semiconductor Substances 0.000 claims abstract description 44
- 238000000034 method Methods 0.000 claims description 42
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- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 claims description 14
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- 239000002019 doping agent Substances 0.000 description 10
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 9
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- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 8
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- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 6
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 6
- 229910052581 Si3N4 Inorganic materials 0.000 description 6
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 6
- 238000005530 etching Methods 0.000 description 5
- 150000004767 nitrides Chemical class 0.000 description 5
- 229910052698 phosphorus Inorganic materials 0.000 description 5
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- HTUMBQDCCIXGCV-UHFFFAOYSA-N lead oxide Chemical compound [O-2].[Pb+2] HTUMBQDCCIXGCV-UHFFFAOYSA-N 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
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- 239000000243 solution Substances 0.000 description 4
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 3
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- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
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- 239000012808 vapor phase Substances 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 229910015902 Bi 2 O 3 Inorganic materials 0.000 description 2
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 2
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 230000003667 anti-reflective effect Effects 0.000 description 2
- ILAHWRKJUDSMFH-UHFFFAOYSA-N boron tribromide Chemical compound BrB(Br)Br ILAHWRKJUDSMFH-UHFFFAOYSA-N 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- -1 composed of aluminum Chemical compound 0.000 description 2
- 229910021419 crystalline silicon Inorganic materials 0.000 description 2
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- 230000002093 peripheral effect Effects 0.000 description 2
- RLOWWWKZYUNIDI-UHFFFAOYSA-N phosphinic chloride Chemical compound ClP=O RLOWWWKZYUNIDI-UHFFFAOYSA-N 0.000 description 2
- XHXFXVLFKHQFAL-UHFFFAOYSA-N phosphoryl trichloride Chemical compound ClP(Cl)(Cl)=O XHXFXVLFKHQFAL-UHFFFAOYSA-N 0.000 description 2
- 238000000682 scanning probe acoustic microscopy Methods 0.000 description 2
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000011863 silicon-based powder Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 2
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- 238000007740 vapor deposition Methods 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical compound CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- ZOXJGFHDIHLPTG-BJUDXGSMSA-N Boron-10 Chemical compound [10B] ZOXJGFHDIHLPTG-BJUDXGSMSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
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- 229920000180 alkyd Polymers 0.000 description 1
- WUOACPNHFRMFPN-UHFFFAOYSA-N alpha-terpineol Chemical compound CC1=CCC(C(C)(C)O)CC1 WUOACPNHFRMFPN-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
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- 230000002950 deficient Effects 0.000 description 1
- SQIFACVGCPWBQZ-UHFFFAOYSA-N delta-terpineol Natural products CC(C)(O)C1CCC(=C)CC1 SQIFACVGCPWBQZ-UHFFFAOYSA-N 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
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- 238000001312 dry etching Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000011817 metal compound particle Substances 0.000 description 1
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- 239000000523 sample Substances 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical class [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 150000003378 silver Chemical class 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 229940116411 terpineol Drugs 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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Abstract
Description
本実施形態の太陽電池素子に用いる電極用の導電性ペーストは、例えば、アルミニウムを主成分とするアルミニウム粉末と、少なくとも酸化バナジウム、酸化テルルおよび酸化ボロンを含むガラス成分と、有機ビヒクルとを有している。そして、ガラス成分においては、酸化バナジウムの含有量は、酸化テルルの含有量と酸化ボロンの含有量との和よりも少ない。また、この導電性ペーストのガラス成分は、ガラス成分を100質量部とした場合に、酸化バナジウムを5〜33質量部、酸化テルルを4〜30質量部、および酸化ボロンを4〜18質量部含有していてもよい。
本実施形態の太陽電池素子10の基本構成について説明する。太陽電池素子10は、第1主面である裏面1bと、裏面1bの反対側に位置する第2主面である表面1aを有している。また、太陽電池素子10は、例えば、p型半導体領域が最も裏面1b側に位置するとともに、n型半導体領域が最も表面1a側に位置するように、p型半導体領域およびn型半導体領域が積み重ねられているシリコン基板1を有している。また、太陽電池素子10は、シリコン基板1のp型半導体領域の上に配置された電極をさらに有している。
次に、太陽電池素子10の製造方法について説明する。上述したように、太陽電池素子10は半導体基板であるシリコン基板1と、このシリコン基板1の一主面上の第1領域に配置された反射防止層4と、シリコン基板1の一主面上の第2領域に配置された、上記の導電性ペーストを焼成してなる電極とを備えている。このように構成された太陽電池素子10を製造する場合、シリコン基板1の一主面上に反射防止層4を形成する第1工程と、上述した導電性ペーストを反射防止層4上に配置する第2工程と、上述した導電性ペーストを焼成してこの導電性ペーストの下に位置している反射防止層4を除去することによって、反射防止層4をシリコン基板1の第1領域に配置させるとともにシリコン基板1の第2領域に電極を形成する第3工程とを含む。
なお、本発明は上記実施形態に限定されるものではなく、以下のように、本発明の範囲内で多くの修正および変更が可能である。
1a :表面
1b :裏面
2 :第1半導体層
3 :第2半導体層
4 :反射防止層
5 :表面電極
5a :表面出力取出電極
5b :表面集電電極
5c :補助電極
6 :裏面電極
6a :裏面出力取出電極
6b :裏面集電電極
7 :BSF領域
10 :太陽電池素子
Claims (8)
- 表面にp型半導体領域を有するシリコン基板と、前記p型半導体領域の上に配置されたアルミニウムを主成分とする電極とを備えている太陽電池素子であって、
前記電極は、酸化バナジウム、酸化テルルおよび酸化ボロンを含むガラス成分を有しており、該ガラス成分において、酸化バナジウムの含有量は、酸化テルルの含有量と酸化ボロンの含有量との和よりも少ない太陽電池素子。 - 前記電極の前記ガラス成分は、該ガラス成分を100質量部とした場合に、酸化ボロンを4〜18質量部含有している請求項1に記載の太陽電池素子。
- 表面にp型半導体領域を有するシリコン基板と、前記p型半導体領域の上に配置されたアルミニウムを主成分とする電極とを備えている太陽電池素子であって、
前記電極は、酸化バナジウム、酸化テルルおよび酸化ボロンを含むガラス成分を有しており、該ガラス成分は、該ガラス成分を100質量部とした場合に、酸化バナジウムを5〜33質量部、酸化テルルを4〜30質量部、および酸化ボロンを4〜18質量部含有している太陽電池素子。 - 前記電極の前記ガラス成分は、該ガラス成分を100質量部とした場合に、酸化バナジウムを16〜29質量部、酸化テルルを13〜25質量部、および酸化ボロンを7〜13質量部含有している請求項1乃至3のいずれかに記載の太陽電池素子。
- 前記電極の前記ガラス成分はさらに酸化鉛を含有しており、該酸化鉛含有ガラス成分を100質量部とした場合に、酸化鉛を10〜72質量部含有している請求項1乃至4のいずれかに記載の太陽電池素子。
- 前記電極は、アルミニウムを100質量部とした場合に、酸化バナジウムを0.01〜0.34質量部または酸化テルルを0.01〜0.30質量部含有している請求項1乃至4のいずれかに記載の太陽電池素子。
- 表面にp型半導体領域を有するシリコン基板と、前記p型半導体領域の上に配置されたアルミニウムを主成分とする電極とを備えている太陽電池素子の製造方法であって、
前記シリコン基板の前記p型半導体領域の上に、酸化バナジウム、酸化テルルおよび酸化ボロンを含むガラス成分を有しており、該ガラス成分において酸化バナジウムの含有量が酸化テルルの含有量と酸化ボロンの含有量との和よりも少ない、アルミニウムを主成分とする粉末および有機ビヒクルを有する導電性ペーストを印刷する印刷工程と、
前記導電性ペーストを焼成して、前記シリコン基板の前記p型半導体領域の上に前記電極を形成する電極形成工程とを有する太陽電池素子の製造方法。 - 表面にp型半導体領域を有するシリコン基板と、前記p型半導体領域の上に配置されたアルミニウムを主成分とする電極とを備えている太陽電池素子の製造方法であって、
前記シリコン基板の前記p型半導体領域の上に、酸化バナジウム、酸化テルルおよび酸化ボロンを含むガラス成分を有しており、該ガラス成分が、該ガラス成分を100質量部とした場合に、酸化バナジウムを5〜33質量部、酸化テルルを4〜30質量部、および酸化ボロンを4〜18質量部含有している、アルミニウムを主成分とする粉末および有機ビヒクルを有する導電性ペーストを印刷する印刷工程と、
前記導電性ペーストを焼成して、前記シリコン基板の前記p型半導体領域の上に前記電極を形成する電極形成工程とを有する太陽電池素子の製造方法。
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