JPWO2010095551A1 - 矩形板状物の外形形状測定方法、及び撮像手段の相対位置校正方法 - Google Patents

矩形板状物の外形形状測定方法、及び撮像手段の相対位置校正方法 Download PDF

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JPWO2010095551A1
JPWO2010095551A1 JP2011500568A JP2011500568A JPWO2010095551A1 JP WO2010095551 A1 JPWO2010095551 A1 JP WO2010095551A1 JP 2011500568 A JP2011500568 A JP 2011500568A JP 2011500568 A JP2011500568 A JP 2011500568A JP WO2010095551 A1 JPWO2010095551 A1 JP WO2010095551A1
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JP
Japan
Prior art keywords
rectangular plate
corners
calibration
glass plate
squareness
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Ceased
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JP2011500568A
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English (en)
Japanese (ja)
Inventor
秀人 谷
秀人 谷
静則 金子
静則 金子
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AGC Inc
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Asahi Glass Co Ltd
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Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Publication of JPWO2010095551A1 publication Critical patent/JPWO2010095551A1/ja
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/043—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2011500568A 2009-02-18 2010-02-10 矩形板状物の外形形状測定方法、及び撮像手段の相対位置校正方法 Ceased JPWO2010095551A1 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2009035732 2009-02-18
JP2009035732 2009-02-18
PCT/JP2010/051975 WO2010095551A1 (ja) 2009-02-18 2010-02-10 矩形板状物の外形形状測定方法、及び撮像手段の相対位置校正方法

Publications (1)

Publication Number Publication Date
JPWO2010095551A1 true JPWO2010095551A1 (ja) 2012-08-23

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ID=42633834

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JP2011500568A Ceased JPWO2010095551A1 (ja) 2009-02-18 2010-02-10 矩形板状物の外形形状測定方法、及び撮像手段の相対位置校正方法

Country Status (5)

Country Link
JP (1) JPWO2010095551A1 (ko)
KR (1) KR101442895B1 (ko)
CN (1) CN102301201B (ko)
TW (1) TW201100744A (ko)
WO (1) WO2010095551A1 (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013163626A (ja) * 2012-02-13 2013-08-22 Asahi Glass Co Ltd 板状物の切線加工装置及び板状物の切線加工方法、ならびにガラス板の製造装置及びガラス板の製造方法
JP2013184838A (ja) * 2012-03-06 2013-09-19 Asahi Glass Co Ltd 板状物の切線加工装置及び板状物の切線加工方法、ならびにガラス板の製造装置及びガラス板の製造方法
CN102929105A (zh) * 2012-11-13 2013-02-13 美迪亚印刷设备（杭州）有限公司 曝光质量检测方法
CN108474647B (zh) * 2015-12-25 2020-08-04 松下知识产权经营株式会社 尺寸测量装置、包裹柜系统和尺寸测量方法
DE102016001995A1 (de) 2016-02-19 2017-08-24 Siempelkamp Logistics & Service GmbH Vorrichtung und Verfahren zum Beschneiden und Vermessen einer Platte
CN110345876B (zh) * 2019-06-10 2022-01-25 重庆惠科金渝光电科技有限公司 偏光板材检测装置及偏光板材检测方法、可读存储介质

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0552526A (ja) * 1991-08-29 1993-03-02 Nkk Corp シート寸法測定装置
JPH06147836A (ja) * 1992-11-13 1994-05-27 Nkk Corp シート寸法測定装置
JP2000258121A (ja) * 1999-03-12 2000-09-22 Tdk Corp 複数カメラ校正用のマスター基板及び画像認識カメラの校正方法
JP2003139510A (ja) * 2001-11-05 2003-05-14 Nippon Reliance Kk シート状の切断物測長方法および装置
JP2005227260A (ja) * 2004-01-16 2005-08-25 Fuji Photo Film Co Ltd シート形状測定方法及び装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH688755A5 (fr) * 1993-07-22 1998-02-27 Gianfranco Passoni Machine de mesure optique à caméra vidéo mobile, pour analyse électronique à haute vitesse des contours des objets.
KR100201739B1 (ko) * 1995-05-18 1999-06-15 타테이시 요시오 물체 관측 방법 및 그 방법을 이용한 물체 관측장치와,이 장치를 이용한 교통흐름 계측장치 및 주차장 관측장치
AU2002213943A1 (en) * 2000-09-22 2002-04-02 Werth Messtechnik Gmbh Method for measuring the geometry of an object by means of co-ordination measuring device
CN1533495A (zh) * 2001-07-17 2004-09-29 ������������ʽ���� 形状测定装置
FR2895535B1 (fr) * 2005-12-22 2008-02-15 Renault Sas Dispositif electronique de commutation de charge electrique commande par microcontroleur
CN100523720C (zh) * 2006-06-08 2009-08-05 邱大明 光学非接触式三维形状测量仪

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0552526A (ja) * 1991-08-29 1993-03-02 Nkk Corp シート寸法測定装置
JPH06147836A (ja) * 1992-11-13 1994-05-27 Nkk Corp シート寸法測定装置
JP2000258121A (ja) * 1999-03-12 2000-09-22 Tdk Corp 複数カメラ校正用のマスター基板及び画像認識カメラの校正方法
JP2003139510A (ja) * 2001-11-05 2003-05-14 Nippon Reliance Kk シート状の切断物測長方法および装置
JP2005227260A (ja) * 2004-01-16 2005-08-25 Fuji Photo Film Co Ltd シート形状測定方法及び装置

Also Published As

Publication number Publication date
CN102301201B (zh) 2013-02-27
CN102301201A (zh) 2011-12-28
KR101442895B1 (ko) 2014-09-19
WO2010095551A1 (ja) 2010-08-26
KR20110126601A (ko) 2011-11-23
TW201100744A (en) 2011-01-01

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