JPWO2008107931A1 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JPWO2008107931A1
JPWO2008107931A1 JP2009502346A JP2009502346A JPWO2008107931A1 JP WO2008107931 A1 JPWO2008107931 A1 JP WO2008107931A1 JP 2009502346 A JP2009502346 A JP 2009502346A JP 2009502346 A JP2009502346 A JP 2009502346A JP WO2008107931 A1 JPWO2008107931 A1 JP WO2008107931A1
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JP
Japan
Prior art keywords
ions
ion optical
ion
mass spectrometer
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2009502346A
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English (en)
Japanese (ja)
Inventor
克 西口
克 西口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of JPWO2008107931A1 publication Critical patent/JPWO2008107931A1/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2009502346A 2007-03-05 2007-03-05 質量分析装置 Pending JPWO2008107931A1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/000167 WO2008107931A1 (fr) 2007-03-05 2007-03-05 Spectromètre de masse

Publications (1)

Publication Number Publication Date
JPWO2008107931A1 true JPWO2008107931A1 (ja) 2010-06-03

Family

ID=39737837

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009502346A Pending JPWO2008107931A1 (ja) 2007-03-05 2007-03-05 質量分析装置

Country Status (2)

Country Link
JP (1) JPWO2008107931A1 (fr)
WO (1) WO2008107931A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5419047B2 (ja) 2010-03-19 2014-02-19 株式会社島津製作所 質量分析データ処理方法及び質量分析装置
WO2022049388A1 (fr) * 2020-09-03 2022-03-10 HGSG Ltd Spectromètre de masse et procédé
GB2598591A (en) * 2020-09-03 2022-03-09 HGSG Ltd Mass spectrometer and method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3539848B2 (ja) * 1997-10-30 2004-07-07 日本電子株式会社 飛行時間型質量分析計におけるイオン光学系
JP3392345B2 (ja) * 1998-04-09 2003-03-31 住友重機械工業株式会社 飛行時間型質量分析装置

Also Published As

Publication number Publication date
WO2008107931A1 (fr) 2008-09-12

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