JPWO2007119556A1 - 圧電共振子及び圧電フィルタ - Google Patents
圧電共振子及び圧電フィルタ Download PDFInfo
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezoelectric or electrostrictive material
- H03H9/56—Monolithic crystal filters
- H03H9/564—Monolithic crystal filters implemented with thin-film techniques
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
- H03H9/02118—Means for compensation or elimination of undesirable effects of lateral leakage between adjacent resonators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/173—Air-gaps
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
- H03H2003/0414—Resonance frequency
- H03H2003/0421—Modification of the thickness of an element
- H03H2003/0428—Modification of the thickness of an element of an electrode
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
- H03H2003/0414—Resonance frequency
- H03H2003/0421—Modification of the thickness of an element
- H03H2003/0442—Modification of the thickness of an element of a non-piezoelectric layer
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
- H03H2003/0414—Resonance frequency
- H03H2003/0471—Resonance frequency of a plurality of resonators at different frequencies
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- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
Description
(発明の効果)
2…基板
2a…上面
2b…下面
3…圧電共振子
3A〜3E…圧電共振子
4…圧電共振子
4A〜4E…圧電共振子
5…圧電薄膜
6…空隙
7…空隙
8…上部電極
9…下部電極
11…質量付加膜
12…上部電極
13…下部電極
10,14…周波数調整膜
図25〜図36に、上記実施形態の圧電共振子の変形例を示す。
Claims (9)
- 第1,第2の主面を有する基板と、
前記基板の第1の主面に固定されて前記基板により支持されている第1の薄膜部と、前記基板の第1の主面から浮かされて音響的に分離されている第2の薄膜部とを有する積層薄膜とを備え、
前記積層薄膜の第2の薄膜部が、圧電薄膜と、圧電薄膜の一方主面に設けられた第1の電極と、前記圧電薄膜の他方主面に形成されており、第1の電極よりも大きい第2の電極とを有し、前記第1,第2の電極が圧電薄膜を介して重なり合っている部分により圧電振動部が構成されており、
前記圧電振動部の外周に連なる外側の領域の少なくとも一部において、前記第1の電極の周囲に設けられた質量付加膜をさらに備え、
前記第2の電極が、平面視した際に、前記圧電振動部を超えて前記質量付加膜が設けられている領域に至るように形成されている、圧電共振子。 - 前記第1の電極上に、前記圧電振動部の外周に対して内側に間隔を隔てられて設けられている段差形成膜をさらに備えることを特徴とする、請求項1に記載の圧電共振子。
- 前記第1の電極の膜厚と、第2の電極の膜厚とが異なっている、請求項1または2に記載の圧電共振子。
- 前記第2の電極の膜厚が、前記第1の電極の膜厚よりも厚くされている、請求項3に記載の圧電共振子。
- 同一基板において、請求項1〜4のいずれか1項に記載の複数の圧電共振子が構成されており、該複数の圧電共振子が電気的に接続されてフィルタ回路が構成されている、圧電フィルタ。
- 前記複数の圧電共振子の内、少なくとも1つの圧電共振子が、残りの圧電共振子と異なるように構成されている、請求項5に記載の圧電フィルタ。
- 前記少なくとも1つの圧電共振子の第2の電極の膜厚と、残りの圧電共振子の第2の電極の膜厚とが異ならされており、それによって、少なくとも1つの圧電共振子の共振周波数と、残りの圧電共振子の共振周波数とが異ならされている、請求項6に記載の圧電フィルタ。
- 前記複数の圧電共振子の内、少なくとも1つの圧電共振子において、第1の電極の膜厚と、第2の電極の膜厚とが異ならされている、請求項5〜7のいずれか1項に記載の圧電フィルタ。
- 前記複数の圧電共振子の内、少なくとも1つの前記圧電共振子において、第2の電極の膜厚が、第1の電極の膜厚よりも厚くされている、請求項8に記載の圧電フィルタ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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JP2006104195 | 2006-04-05 | ||
JP2006104195 | 2006-04-05 | ||
PCT/JP2007/056612 WO2007119556A1 (ja) | 2006-04-05 | 2007-03-28 | 圧電共振子及び圧電フィルタ |
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JPWO2007119556A1 true JPWO2007119556A1 (ja) | 2009-08-27 |
JP4661958B2 JP4661958B2 (ja) | 2011-03-30 |
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JP2008510873A Active JP4661958B2 (ja) | 2006-04-05 | 2007-03-28 | 圧電共振子及び圧電フィルタ |
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US (1) | US7649304B2 (ja) |
EP (1) | EP2003775A4 (ja) |
JP (1) | JP4661958B2 (ja) |
WO (1) | WO2007119556A1 (ja) |
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JP5013227B2 (ja) * | 2007-04-11 | 2012-08-29 | 株式会社村田製作所 | 圧電薄膜フィルタ |
JP5054491B2 (ja) | 2007-11-21 | 2012-10-24 | パナソニック株式会社 | 圧電振動子およびその製造方法 |
JP5563739B2 (ja) * | 2008-02-20 | 2014-07-30 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタ、デュープレクサ、通信モジュール、および通信装置 |
US8333112B2 (en) * | 2008-06-10 | 2012-12-18 | The Boeing Company | Frequency tuning of disc resonator gyroscopes via resonator mass perturbation based on an identified model |
JP5220503B2 (ja) * | 2008-07-23 | 2013-06-26 | 太陽誘電株式会社 | 弾性波デバイス |
DE102008045346B4 (de) * | 2008-09-01 | 2018-06-07 | Snaptrack Inc. | Duplexer und Verfahren zum Erhöhen der Isolation zwischen zwei Filtern |
WO2010095640A1 (ja) * | 2009-02-20 | 2010-08-26 | 宇部興産株式会社 | 薄膜圧電共振器およびそれを用いた薄膜圧電フィルタ |
US8291559B2 (en) * | 2009-02-24 | 2012-10-23 | Epcos Ag | Process for adapting resonance frequency of a BAW resonator |
WO2011036979A1 (ja) | 2009-09-28 | 2011-03-31 | 太陽誘電株式会社 | 弾性波デバイス |
JP5478180B2 (ja) * | 2009-09-30 | 2014-04-23 | 太陽誘電株式会社 | フィルタ |
US8456257B1 (en) * | 2009-11-12 | 2013-06-04 | Triquint Semiconductor, Inc. | Bulk acoustic wave devices and method for spurious mode suppression |
US8791776B2 (en) * | 2011-01-19 | 2014-07-29 | Wei Pang | Acoustic wave resonator having a gasket |
JP5360432B2 (ja) * | 2011-01-27 | 2013-12-04 | 株式会社村田製作所 | 圧電デバイス |
US9083302B2 (en) | 2011-02-28 | 2015-07-14 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Stacked bulk acoustic resonator comprising a bridge and an acoustic reflector along a perimeter of the resonator |
US9203374B2 (en) | 2011-02-28 | 2015-12-01 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Film bulk acoustic resonator comprising a bridge |
US9148117B2 (en) | 2011-02-28 | 2015-09-29 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Coupled resonator filter comprising a bridge and frame elements |
US9154112B2 (en) | 2011-02-28 | 2015-10-06 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Coupled resonator filter comprising a bridge |
US9136818B2 (en) | 2011-02-28 | 2015-09-15 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Stacked acoustic resonator comprising a bridge |
US9425764B2 (en) | 2012-10-25 | 2016-08-23 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Accoustic resonator having composite electrodes with integrated lateral features |
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US8575820B2 (en) * | 2011-03-29 | 2013-11-05 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Stacked bulk acoustic resonator |
US9246473B2 (en) * | 2011-03-29 | 2016-01-26 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator comprising collar, frame and perimeter distributed bragg reflector |
US9748918B2 (en) * | 2013-02-14 | 2017-08-29 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator comprising integrated structures for improved performance |
US9444426B2 (en) | 2012-10-25 | 2016-09-13 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Accoustic resonator having integrated lateral feature and temperature compensation feature |
US9525397B2 (en) | 2011-03-29 | 2016-12-20 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator comprising acoustic reflector, frame and collar |
JP5845617B2 (ja) * | 2011-04-27 | 2016-01-20 | セイコーエプソン株式会社 | 圧電素子、液体噴射ヘッドおよび液体噴射装置 |
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- 2007-03-28 WO PCT/JP2007/056612 patent/WO2007119556A1/ja active Application Filing
- 2007-03-28 JP JP2008510873A patent/JP4661958B2/ja active Active
- 2007-03-28 EP EP07740050A patent/EP2003775A4/en not_active Withdrawn
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EP2003775A9 (en) | 2009-05-06 |
US7649304B2 (en) | 2010-01-19 |
US20090001848A1 (en) | 2009-01-01 |
JP4661958B2 (ja) | 2011-03-30 |
WO2007119556A1 (ja) | 2007-10-25 |
EP2003775A2 (en) | 2008-12-17 |
EP2003775A4 (en) | 2011-04-27 |
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