JPS6479874A - Device for inspecting external appearance of electronic parts - Google Patents
Device for inspecting external appearance of electronic partsInfo
- Publication number
- JPS6479874A JPS6479874A JP62236565A JP23656587A JPS6479874A JP S6479874 A JPS6479874 A JP S6479874A JP 62236565 A JP62236565 A JP 62236565A JP 23656587 A JP23656587 A JP 23656587A JP S6479874 A JPS6479874 A JP S6479874A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- electronic parts
- recognizing device
- parts
- external appearance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62236565A JP2684656B2 (ja) | 1987-09-21 | 1987-09-21 | 電子部品の外観検査方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62236565A JP2684656B2 (ja) | 1987-09-21 | 1987-09-21 | 電子部品の外観検査方法 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7127836A Division JP2776299B2 (ja) | 1995-05-26 | 1995-05-26 | 電子部品の外観検査方法 |
JP7127837A Division JPH085572A (ja) | 1995-05-26 | 1995-05-26 | 電子部品の外観検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6479874A true JPS6479874A (en) | 1989-03-24 |
JP2684656B2 JP2684656B2 (ja) | 1997-12-03 |
Family
ID=17002518
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62236565A Expired - Fee Related JP2684656B2 (ja) | 1987-09-21 | 1987-09-21 | 電子部品の外観検査方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2684656B2 (ja) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4139189A1 (de) * | 1990-11-29 | 1992-06-11 | Matsushita Electric Ind Co Ltd | Verfahren zur pruefung der aeusseren beschaffenheit von objekten |
US5166753A (en) * | 1989-07-17 | 1992-11-24 | Matsushita Electric Industrial Co., Ltd. | Method for inspecting electronic devices mounted on a circuit board |
JPH06176132A (ja) * | 1992-12-04 | 1994-06-24 | Iwaki Electron Corp Ltd | 検査エリア補正方法 |
US5598345A (en) * | 1990-11-29 | 1997-01-28 | Matsushita Electric Industrial Co., Ltd. | Method and apparatus for inspecting solder portions |
JP2006024086A (ja) * | 2004-07-09 | 2006-01-26 | Gastar Corp | ワークの組立検査装置および組立検査方法 |
JP2015133406A (ja) * | 2014-01-14 | 2015-07-23 | オムロン株式会社 | 品質管理装置、品質管理方法、およびプログラム |
WO2019021365A1 (ja) * | 2017-07-25 | 2019-01-31 | ヤマハ発動機株式会社 | 部品実装装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5649462A (en) * | 1979-09-26 | 1981-05-06 | Toyo Denso Co Ltd | Rolling diaphragm |
JPS58197738A (ja) * | 1982-05-13 | 1983-11-17 | Nec Corp | ペレツトマ−カ |
JPS62182810A (ja) * | 1986-02-05 | 1987-08-11 | Omron Tateisi Electronics Co | 自動検査装置における基準基板デ−タの教示方法 |
JPS62212000A (ja) * | 1986-03-12 | 1987-09-17 | 三洋電機株式会社 | 部品装着検出装置 |
-
1987
- 1987-09-21 JP JP62236565A patent/JP2684656B2/ja not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5649462A (en) * | 1979-09-26 | 1981-05-06 | Toyo Denso Co Ltd | Rolling diaphragm |
JPS58197738A (ja) * | 1982-05-13 | 1983-11-17 | Nec Corp | ペレツトマ−カ |
JPS62182810A (ja) * | 1986-02-05 | 1987-08-11 | Omron Tateisi Electronics Co | 自動検査装置における基準基板デ−タの教示方法 |
JPS62212000A (ja) * | 1986-03-12 | 1987-09-17 | 三洋電機株式会社 | 部品装着検出装置 |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5166753A (en) * | 1989-07-17 | 1992-11-24 | Matsushita Electric Industrial Co., Ltd. | Method for inspecting electronic devices mounted on a circuit board |
DE4139189A1 (de) * | 1990-11-29 | 1992-06-11 | Matsushita Electric Ind Co Ltd | Verfahren zur pruefung der aeusseren beschaffenheit von objekten |
US5598345A (en) * | 1990-11-29 | 1997-01-28 | Matsushita Electric Industrial Co., Ltd. | Method and apparatus for inspecting solder portions |
DE4139189C2 (de) * | 1990-11-29 | 2003-08-28 | Matsushita Electric Ind Co Ltd | Vorrichtung zur optischen Lötstellenprüfung |
JPH06176132A (ja) * | 1992-12-04 | 1994-06-24 | Iwaki Electron Corp Ltd | 検査エリア補正方法 |
JP2006024086A (ja) * | 2004-07-09 | 2006-01-26 | Gastar Corp | ワークの組立検査装置および組立検査方法 |
JP2015133406A (ja) * | 2014-01-14 | 2015-07-23 | オムロン株式会社 | 品質管理装置、品質管理方法、およびプログラム |
WO2019021365A1 (ja) * | 2017-07-25 | 2019-01-31 | ヤマハ発動機株式会社 | 部品実装装置 |
JPWO2019021365A1 (ja) * | 2017-07-25 | 2020-01-16 | ヤマハ発動機株式会社 | 部品実装装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2684656B2 (ja) | 1997-12-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |