JPS6479874A - Device for inspecting external appearance of electronic parts - Google Patents

Device for inspecting external appearance of electronic parts

Info

Publication number
JPS6479874A
JPS6479874A JP62236565A JP23656587A JPS6479874A JP S6479874 A JPS6479874 A JP S6479874A JP 62236565 A JP62236565 A JP 62236565A JP 23656587 A JP23656587 A JP 23656587A JP S6479874 A JPS6479874 A JP S6479874A
Authority
JP
Japan
Prior art keywords
substrate
electronic parts
recognizing device
parts
external appearance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62236565A
Other languages
English (en)
Other versions
JP2684656B2 (ja
Inventor
Nobushi Tokura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP62236565A priority Critical patent/JP2684656B2/ja
Publication of JPS6479874A publication Critical patent/JPS6479874A/ja
Application granted granted Critical
Publication of JP2684656B2 publication Critical patent/JP2684656B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Optical Devices Or Fibers (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP62236565A 1987-09-21 1987-09-21 電子部品の外観検査方法 Expired - Fee Related JP2684656B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62236565A JP2684656B2 (ja) 1987-09-21 1987-09-21 電子部品の外観検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62236565A JP2684656B2 (ja) 1987-09-21 1987-09-21 電子部品の外観検査方法

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP7127836A Division JP2776299B2 (ja) 1995-05-26 1995-05-26 電子部品の外観検査方法
JP7127837A Division JPH085572A (ja) 1995-05-26 1995-05-26 電子部品の外観検査方法

Publications (2)

Publication Number Publication Date
JPS6479874A true JPS6479874A (en) 1989-03-24
JP2684656B2 JP2684656B2 (ja) 1997-12-03

Family

ID=17002518

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62236565A Expired - Fee Related JP2684656B2 (ja) 1987-09-21 1987-09-21 電子部品の外観検査方法

Country Status (1)

Country Link
JP (1) JP2684656B2 (ja)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4139189A1 (de) * 1990-11-29 1992-06-11 Matsushita Electric Ind Co Ltd Verfahren zur pruefung der aeusseren beschaffenheit von objekten
US5166753A (en) * 1989-07-17 1992-11-24 Matsushita Electric Industrial Co., Ltd. Method for inspecting electronic devices mounted on a circuit board
JPH06176132A (ja) * 1992-12-04 1994-06-24 Iwaki Electron Corp Ltd 検査エリア補正方法
US5598345A (en) * 1990-11-29 1997-01-28 Matsushita Electric Industrial Co., Ltd. Method and apparatus for inspecting solder portions
JP2006024086A (ja) * 2004-07-09 2006-01-26 Gastar Corp ワークの組立検査装置および組立検査方法
JP2015133406A (ja) * 2014-01-14 2015-07-23 オムロン株式会社 品質管理装置、品質管理方法、およびプログラム
WO2019021365A1 (ja) * 2017-07-25 2019-01-31 ヤマハ発動機株式会社 部品実装装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5649462A (en) * 1979-09-26 1981-05-06 Toyo Denso Co Ltd Rolling diaphragm
JPS58197738A (ja) * 1982-05-13 1983-11-17 Nec Corp ペレツトマ−カ
JPS62182810A (ja) * 1986-02-05 1987-08-11 Omron Tateisi Electronics Co 自動検査装置における基準基板デ−タの教示方法
JPS62212000A (ja) * 1986-03-12 1987-09-17 三洋電機株式会社 部品装着検出装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5649462A (en) * 1979-09-26 1981-05-06 Toyo Denso Co Ltd Rolling diaphragm
JPS58197738A (ja) * 1982-05-13 1983-11-17 Nec Corp ペレツトマ−カ
JPS62182810A (ja) * 1986-02-05 1987-08-11 Omron Tateisi Electronics Co 自動検査装置における基準基板デ−タの教示方法
JPS62212000A (ja) * 1986-03-12 1987-09-17 三洋電機株式会社 部品装着検出装置

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5166753A (en) * 1989-07-17 1992-11-24 Matsushita Electric Industrial Co., Ltd. Method for inspecting electronic devices mounted on a circuit board
DE4139189A1 (de) * 1990-11-29 1992-06-11 Matsushita Electric Ind Co Ltd Verfahren zur pruefung der aeusseren beschaffenheit von objekten
US5598345A (en) * 1990-11-29 1997-01-28 Matsushita Electric Industrial Co., Ltd. Method and apparatus for inspecting solder portions
DE4139189C2 (de) * 1990-11-29 2003-08-28 Matsushita Electric Ind Co Ltd Vorrichtung zur optischen Lötstellenprüfung
JPH06176132A (ja) * 1992-12-04 1994-06-24 Iwaki Electron Corp Ltd 検査エリア補正方法
JP2006024086A (ja) * 2004-07-09 2006-01-26 Gastar Corp ワークの組立検査装置および組立検査方法
JP2015133406A (ja) * 2014-01-14 2015-07-23 オムロン株式会社 品質管理装置、品質管理方法、およびプログラム
WO2019021365A1 (ja) * 2017-07-25 2019-01-31 ヤマハ発動機株式会社 部品実装装置
JPWO2019021365A1 (ja) * 2017-07-25 2020-01-16 ヤマハ発動機株式会社 部品実装装置

Also Published As

Publication number Publication date
JP2684656B2 (ja) 1997-12-03

Similar Documents

Publication Publication Date Title
JPH0310041B2 (ja)
CN102679236B (zh) 照明系统、包含该照明系统的自动光学检测装置及其方法
CN101694278A (zh) 用于自动光学检查机的光源装置
JPS6479874A (en) Device for inspecting external appearance of electronic parts
CN105044118A (zh) 一种aoi光源
CN204924968U (zh) 一种aoi光源
CA1318414C (en) Optical inspection system for solder joints and inspection method
US6765185B2 (en) Computer vision recognition of metallic objects against a poorly contrasting background
KR920003641Y1 (ko) 불량품 판정화상 처리장치
CN205606313U (zh) 多边形光学检测光源结构
JPH07135400A (ja) 実装部品の検査方法
JPH029506B2 (ja)
CN217877539U (zh) 一种用于贴片元件载带的视觉自动检测装置
JPH0933445A (ja) 印刷配線板検査装置用の照明装置
JPH03192800A (ja) プリント基板の部品実装認識方法
JPH0678856U (ja) 照明装置
KR20000025764A (ko) 반도체소자 검사용 엘이디 조명장치
JPH0526580Y2 (ja)
JPS5970947A (ja) 印刷配線基板のパタ−ン検出方法
JPH0534105Y2 (ja)
JPH0423360Y2 (ja)
JPS57207853A (en) Lighting device for inspecting thin plate having semitransmission characteristics
JPS617404A (ja) 位置検出装置
JPS645029A (en) Appearance inspection equipment
JP2868739B2 (ja) 基板マーク検出方法及びその装置

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees