JPS6461949A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS6461949A
JPS6461949A JP21981687A JP21981687A JPS6461949A JP S6461949 A JPS6461949 A JP S6461949A JP 21981687 A JP21981687 A JP 21981687A JP 21981687 A JP21981687 A JP 21981687A JP S6461949 A JPS6461949 A JP S6461949A
Authority
JP
Japan
Prior art keywords
openings
oxide film
diffusion
insulating film
fine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21981687A
Other languages
Japanese (ja)
Inventor
Shigeru Harada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP21981687A priority Critical patent/JPS6461949A/en
Publication of JPS6461949A publication Critical patent/JPS6461949A/en
Pending legal-status Critical Current

Links

Landscapes

  • Bipolar Transistors (AREA)

Abstract

PURPOSE:To form a collector buried diffusion layer of a uniform thickness and contrive to make a layer fine, by making openings of fine patterns on an oxide film which is formed on a substrate. CONSTITUTION:An oxide film 10 is formed at the surface of a semiconductor substrate 1 and the oxide film 10 of a region where the collector buried diffusion layer 21 is formed has openings so that the fine openings 22 are spread all over the oxide film 10 by using the processes of photolithography and etching. After that, a coated insulating film 11 containing P, As, Sb, and the like is applied to the full face of the oxide film 10 and the openings 22. The coated insulating film 11 acts as a impurity diffusion source for forming the N-type collector buried layer 21. Since impurity elements are diffused thermally by the coated insulating film 11, heat-treatment is performed at a temperature around 800-1100 deg.C and the above diffusion layer 21 is formed in the substrate 1. In this way, the coated insulating film 11 is embedded in the fine openings 22 almost uniformly and as a result, all the supply of the impurity elements reaches the sane level at the openings of the oxide film 10 for impurity diffusion masks and then impurities diffuse uniformly through thermal diffusion and the amount of diffusion in the transverse direction becomes small.
JP21981687A 1987-09-02 1987-09-02 Manufacture of semiconductor device Pending JPS6461949A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21981687A JPS6461949A (en) 1987-09-02 1987-09-02 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21981687A JPS6461949A (en) 1987-09-02 1987-09-02 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS6461949A true JPS6461949A (en) 1989-03-08

Family

ID=16741485

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21981687A Pending JPS6461949A (en) 1987-09-02 1987-09-02 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS6461949A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000294565A (en) * 1999-04-08 2000-10-20 Seiko Instruments Inc Manufacture of bipolar transistor and semiconductor integrated circuit device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000294565A (en) * 1999-04-08 2000-10-20 Seiko Instruments Inc Manufacture of bipolar transistor and semiconductor integrated circuit device

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