JPS6461949A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS6461949A JPS6461949A JP21981687A JP21981687A JPS6461949A JP S6461949 A JPS6461949 A JP S6461949A JP 21981687 A JP21981687 A JP 21981687A JP 21981687 A JP21981687 A JP 21981687A JP S6461949 A JPS6461949 A JP S6461949A
- Authority
- JP
- Japan
- Prior art keywords
- openings
- oxide film
- diffusion
- insulating film
- fine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Bipolar Transistors (AREA)
Abstract
PURPOSE:To form a collector buried diffusion layer of a uniform thickness and contrive to make a layer fine, by making openings of fine patterns on an oxide film which is formed on a substrate. CONSTITUTION:An oxide film 10 is formed at the surface of a semiconductor substrate 1 and the oxide film 10 of a region where the collector buried diffusion layer 21 is formed has openings so that the fine openings 22 are spread all over the oxide film 10 by using the processes of photolithography and etching. After that, a coated insulating film 11 containing P, As, Sb, and the like is applied to the full face of the oxide film 10 and the openings 22. The coated insulating film 11 acts as a impurity diffusion source for forming the N-type collector buried layer 21. Since impurity elements are diffused thermally by the coated insulating film 11, heat-treatment is performed at a temperature around 800-1100 deg.C and the above diffusion layer 21 is formed in the substrate 1. In this way, the coated insulating film 11 is embedded in the fine openings 22 almost uniformly and as a result, all the supply of the impurity elements reaches the sane level at the openings of the oxide film 10 for impurity diffusion masks and then impurities diffuse uniformly through thermal diffusion and the amount of diffusion in the transverse direction becomes small.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21981687A JPS6461949A (en) | 1987-09-02 | 1987-09-02 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21981687A JPS6461949A (en) | 1987-09-02 | 1987-09-02 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6461949A true JPS6461949A (en) | 1989-03-08 |
Family
ID=16741485
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21981687A Pending JPS6461949A (en) | 1987-09-02 | 1987-09-02 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6461949A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000294565A (en) * | 1999-04-08 | 2000-10-20 | Seiko Instruments Inc | Manufacture of bipolar transistor and semiconductor integrated circuit device |
-
1987
- 1987-09-02 JP JP21981687A patent/JPS6461949A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000294565A (en) * | 1999-04-08 | 2000-10-20 | Seiko Instruments Inc | Manufacture of bipolar transistor and semiconductor integrated circuit device |
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