JPS645746B2 - - Google Patents

Info

Publication number
JPS645746B2
JPS645746B2 JP57157589A JP15758982A JPS645746B2 JP S645746 B2 JPS645746 B2 JP S645746B2 JP 57157589 A JP57157589 A JP 57157589A JP 15758982 A JP15758982 A JP 15758982A JP S645746 B2 JPS645746 B2 JP S645746B2
Authority
JP
Japan
Prior art keywords
energy
analyzer
particle beam
charged particle
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57157589A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5946747A (ja
Inventor
Masashi Iwatsuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP57157589A priority Critical patent/JPS5946747A/ja
Publication of JPS5946747A publication Critical patent/JPS5946747A/ja
Publication of JPS645746B2 publication Critical patent/JPS645746B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/261—Details
    • H01J37/265—Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57157589A 1982-09-09 1982-09-09 荷電粒子線エネルギ−分析装置 Granted JPS5946747A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57157589A JPS5946747A (ja) 1982-09-09 1982-09-09 荷電粒子線エネルギ−分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57157589A JPS5946747A (ja) 1982-09-09 1982-09-09 荷電粒子線エネルギ−分析装置

Publications (2)

Publication Number Publication Date
JPS5946747A JPS5946747A (ja) 1984-03-16
JPS645746B2 true JPS645746B2 (enrdf_load_html_response) 1989-01-31

Family

ID=15653004

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57157589A Granted JPS5946747A (ja) 1982-09-09 1982-09-09 荷電粒子線エネルギ−分析装置

Country Status (1)

Country Link
JP (1) JPS5946747A (enrdf_load_html_response)

Also Published As

Publication number Publication date
JPS5946747A (ja) 1984-03-16

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