JPS6447040A - Probe card - Google Patents
Probe cardInfo
- Publication number
- JPS6447040A JPS6447040A JP62205483A JP20548387A JPS6447040A JP S6447040 A JPS6447040 A JP S6447040A JP 62205483 A JP62205483 A JP 62205483A JP 20548387 A JP20548387 A JP 20548387A JP S6447040 A JPS6447040 A JP S6447040A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- probe card
- semiconductor chip
- marker
- hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
PURPOSE:To render a probe card suitable for an automated process by a method wherein a hole is provided in a substrate through which a marker runs to provide a semiconductor chip with prescribed markings and a transparent material is employed to constitute a region including at least the middle section of the substrate. CONSTITUTION:In a probe card of this design, a substrate 1 is built of a transparent material, a marker 8 goes through a hole 6 provided in the substrate 1, and the marker 8 attaches markings on a semiconductor chip 13. A chip position recognizing pattern 5 is drawn on the substrate 1, a pattern 10 wherein scribe lines 11 cross each other on the semiconductor chip 13 is aligned with the chip position recognizing pattern 5, and the alignment is trimmed by a sensor 9. Probe card terminals 3 for electrical contact with the semiconductor chip 13 radiate on the rear surface of the substrate 1, the terminals 3 are connected respectively to tester-side probe card terminals 2 through the intermediary of wires 4 on the substrate 1, said chip position recognizing pattern 5 is formed on the substrate 1, and said hole 6 is provided obliquely.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62205483A JPS6447040A (en) | 1987-08-18 | 1987-08-18 | Probe card |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62205483A JPS6447040A (en) | 1987-08-18 | 1987-08-18 | Probe card |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6447040A true JPS6447040A (en) | 1989-02-21 |
Family
ID=16507600
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62205483A Pending JPS6447040A (en) | 1987-08-18 | 1987-08-18 | Probe card |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6447040A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100851491B1 (en) * | 2006-12-21 | 2008-08-08 | 주식회사 포스코 | Apparatus for measuring frictional wear of oil ring |
-
1987
- 1987-08-18 JP JP62205483A patent/JPS6447040A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100851491B1 (en) * | 2006-12-21 | 2008-08-08 | 주식회사 포스코 | Apparatus for measuring frictional wear of oil ring |
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