JPS6441257A - Lsi - Google Patents

Lsi

Info

Publication number
JPS6441257A
JPS6441257A JP62196249A JP19624987A JPS6441257A JP S6441257 A JPS6441257 A JP S6441257A JP 62196249 A JP62196249 A JP 62196249A JP 19624987 A JP19624987 A JP 19624987A JP S6441257 A JPS6441257 A JP S6441257A
Authority
JP
Japan
Prior art keywords
signal
internal signal
states
wires
signal wires
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62196249A
Other languages
Japanese (ja)
Inventor
Makoto Yamauchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62196249A priority Critical patent/JPS6441257A/en
Publication of JPS6441257A publication Critical patent/JPS6441257A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To observe directly the states of a good number of internal signal wires, by providing an LSI with a signal selecting circuit which inputs a plurality of internal signal wires and selectively outputs them. CONSTITUTION:A signal selecting circuit 16 selects one or more of internal signal wires 21, according to selection signal input from a plurality of external input terminals 12, and outputs them to a part of terminals among external output terminals 13. When the selection signal is applied to external input terminal 12-(N-2)-12-N according to an internal signal wire 22 to be obserbed, its signal state is applied to an external output terminal 13-M. In order to investigate the states of two or more internal signal wires, the selection signal is switched in the manner of time division according to the requirements. Thereby, states of a good number of internal signal wires 22 can be directly observed.
JP62196249A 1987-08-07 1987-08-07 Lsi Pending JPS6441257A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62196249A JPS6441257A (en) 1987-08-07 1987-08-07 Lsi

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62196249A JPS6441257A (en) 1987-08-07 1987-08-07 Lsi

Publications (1)

Publication Number Publication Date
JPS6441257A true JPS6441257A (en) 1989-02-13

Family

ID=16354664

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62196249A Pending JPS6441257A (en) 1987-08-07 1987-08-07 Lsi

Country Status (1)

Country Link
JP (1) JPS6441257A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0921848A (en) * 1995-07-07 1997-01-21 Nec Corp Observation method of internal signal in integrated circuit
US6700402B2 (en) 2001-05-10 2004-03-02 Canon Kabushiki Kaisha Output control circuit and output control method
JP2007042876A (en) * 2005-08-03 2007-02-15 Nec Corp Semiconductor integrated circuit and method for monitoring internal signal for it

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6298657A (en) * 1985-10-24 1987-05-08 Nec Corp Integrated circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6298657A (en) * 1985-10-24 1987-05-08 Nec Corp Integrated circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0921848A (en) * 1995-07-07 1997-01-21 Nec Corp Observation method of internal signal in integrated circuit
US6700402B2 (en) 2001-05-10 2004-03-02 Canon Kabushiki Kaisha Output control circuit and output control method
JP2007042876A (en) * 2005-08-03 2007-02-15 Nec Corp Semiconductor integrated circuit and method for monitoring internal signal for it

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