JPS6432651A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS6432651A
JPS6432651A JP18753887A JP18753887A JPS6432651A JP S6432651 A JPS6432651 A JP S6432651A JP 18753887 A JP18753887 A JP 18753887A JP 18753887 A JP18753887 A JP 18753887A JP S6432651 A JPS6432651 A JP S6432651A
Authority
JP
Japan
Prior art keywords
connecting hole
wiring electrode
substrate
glass film
phosphorus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18753887A
Other languages
Japanese (ja)
Inventor
Naotaka Hashimoto
Yoshio Sakai
Atsuyoshi Koike
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP18753887A priority Critical patent/JPS6432651A/en
Publication of JPS6432651A publication Critical patent/JPS6432651A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent adhesion on the surface of a substrate of outward diffused boron and phosphorus, and to obtain the excellent connection of a wiring electrode by heating and fluidizing a borophosphate glass film under the state in which an inter-layer oxide film through a vapor growth method is left on the bottom of a connecting hole. CONSTITUTION:A connecting hole 17 for forming a wiring electrode is bored to a borophosphate glass film 15 as an upper layer so that an inter-layer oxide film 12 to which an impurity such as boron, phosphorus, etc., is not added is left on a semiconductor substrate 11. The glass film 15 is fluidized through heat treatment a high temperature, and the periphery of the connecting hole 17 is smoothed. Anisotropic whole-surface etching is executed to the glass film 15, and the main surface of the substrate 11 is exposed only in the region of the connecting hole 17. A wiring electrode 18 is shaped into the connecting hole 17. Accordingly, adhesion onto the surface of the substrate 11 of outward diffused boron and phosphorus is prevented, thus acquiring the excellent connection of the wiring electrode.
JP18753887A 1987-07-29 1987-07-29 Manufacture of semiconductor device Pending JPS6432651A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18753887A JPS6432651A (en) 1987-07-29 1987-07-29 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18753887A JPS6432651A (en) 1987-07-29 1987-07-29 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS6432651A true JPS6432651A (en) 1989-02-02

Family

ID=16207841

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18753887A Pending JPS6432651A (en) 1987-07-29 1987-07-29 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS6432651A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0377321A (en) * 1989-08-19 1991-04-02 Fuji Electric Co Ltd Formation of electrode connecting hole in semiconductor device
US5292684A (en) * 1992-03-28 1994-03-08 Hyundai Electronics Industries Co., Ltd. Semiconductor device with improved contact and method of making the same
JP2007329279A (en) * 2006-06-07 2007-12-20 Denso Corp Method for manufacturing semiconductor device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0377321A (en) * 1989-08-19 1991-04-02 Fuji Electric Co Ltd Formation of electrode connecting hole in semiconductor device
US5292684A (en) * 1992-03-28 1994-03-08 Hyundai Electronics Industries Co., Ltd. Semiconductor device with improved contact and method of making the same
JP2007329279A (en) * 2006-06-07 2007-12-20 Denso Corp Method for manufacturing semiconductor device

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