JPS6419160U - - Google Patents

Info

Publication number
JPS6419160U
JPS6419160U JP1988090072U JP9007288U JPS6419160U JP S6419160 U JPS6419160 U JP S6419160U JP 1988090072 U JP1988090072 U JP 1988090072U JP 9007288 U JP9007288 U JP 9007288U JP S6419160 U JPS6419160 U JP S6419160U
Authority
JP
Japan
Prior art keywords
measuring
sample
ray
anode
predetermined element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1988090072U
Other languages
English (en)
Other versions
JPH0334681Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS6419160U publication Critical patent/JPS6419160U/ja
Application granted granted Critical
Publication of JPH0334681Y2 publication Critical patent/JPH0334681Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/10—Power supply arrangements for feeding the X-ray tube
    • H05G1/12—Power supply arrangements for feeding the X-ray tube with dc or rectified single-phase ac or double-phase
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Description

【図面の簡単な説明】
第１図は本考案装置のＸ線管の主要部分とサン
プルホルダーと測定装置とを概略的に示す。第２
図は第１図に示すＸ線管の電流供給ユニツトを示
す。 図中符号、１……ケーシング、２……陰極、３
……陽極、４，７……平衡フイルター、５……サ
ンプルホルダー、５′……サンプル、６……測定
装置、８……カスケードカツプリング、９……ト
ランスフオーマー、１０……Ｄ．Ｃ．バツテリー
、１１……電流パルス、１２……トランジスタ、
１３……増幅器。

Claims (1)

  1. 【実用新案登録請求の範囲】 (1) 低出力Ｘ線管と、電流供給装置と、サンプ
    ルホルダーと、例えば半導体測定器、ガイガー計
    数管、又は比例検出器の如き気体放電管でありう
    る測定装置とを有し、Ｘ線照射により固有Ｘ線ラ
    インを生ずる所定元素を含むサンプル中の該元素
    の量をＸ線により測定する装置において、ベリリ
    ウム板上に被覆され、且つ固有Ｘ線ラインＫαと
    Ｋβとを有する明確に限定された陽極材料の薄層
    からなるＸ線管内の陽極３と、前記陽極３の一側
    に位置する前記Ｘ線管の陰極２と、陽極を通つて
    透過されたＸ線のみがサンプルに指向されるよう
    に、Ｘ線管の窓の外側で前記陽極の他方の側にあ
    るサンプル５′を保持するサンプルホルダー５と
    からなり、かつサンプルからの蛍光放射線を受け
    取るように配置されかつその吸収端が異なる波長
    の所にあるが、その吸収特性は、二つのフイルタ
    ー部材の最短の波長の吸収端より短い波長に対し
    ても、又二つのフイルター部材の最長の波長の吸
    収端より長い波長に対しても同一である二つのフ
    イルター部材からなるバランスフイルター４，７
    を有することを特徴とするサンプル内の所定元素
    の含有量をＸ線により測定する装置。 (2) 前記陽極材料３は前記Ｘ線管の窓を構成す
    ることを特徴とする前項１記載のサンプル内の所
    定元素の含有量をＸ線により測定する装置。 (3) 前記測定装置は気体放電管６を有すること
    を特徴とする前項１または２記載のサンプル内の
    所定元素の含有量をＸ線により測定する装置。
JP1988090072U 1978-06-21 1988-07-08 Expired JPH0334681Y2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7807078A SE415804B (sv) 1978-06-21 1978-06-21 Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet

Publications (2)

Publication Number Publication Date
JPS6419160U true JPS6419160U (ja) 1989-01-31
JPH0334681Y2 JPH0334681Y2 (ja) 1991-07-23

Family

ID=20335268

Family Applications (2)

Application Number Title Priority Date Filing Date
JP7575179A Pending JPS552991A (en) 1978-06-21 1979-06-18 Measurement of specific element content by x ray radiation and apparatus therefor
JP1988090072U Expired JPH0334681Y2 (ja) 1978-06-21 1988-07-08

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP7575179A Pending JPS552991A (en) 1978-06-21 1979-06-18 Measurement of specific element content by x ray radiation and apparatus therefor

Country Status (11)

Country Link
US (1) US4344181A (ja)
JP (2) JPS552991A (ja)
AU (1) AU522334B2 (ja)
CA (1) CA1139021A (ja)
DE (1) DE2924244C2 (ja)
FI (1) FI72814C (ja)
FR (1) FR2429425A1 (ja)
GB (1) GB2025040B (ja)
NL (1) NL7904500A (ja)
SE (1) SE415804B (ja)
ZA (1) ZA793095B (ja)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE428974B (sv) * 1979-02-07 1983-08-01 Nils Johannes Baecklund Sett att medelst rontgenstralning meta halten av ett forutbestemt emne i ett prov
US4484341A (en) * 1981-10-02 1984-11-20 Radiation Dynamics, Inc. Method and apparatus for selectively radiating materials with electrons and X-rays
US4731804A (en) * 1984-12-31 1988-03-15 North American Philips Corporation Window configuration of an X-ray tube
FR2600422B1 (fr) * 1986-05-29 1989-10-13 Instruments Sa Appareil et procede d'analyses chimiques locales a la surface de materiaux solides par spectroscopie de photo-electrons x
GB8621983D0 (en) * 1986-09-12 1986-10-22 K X Technology Ltd Ore analysis
US5369679A (en) * 1990-09-05 1994-11-29 Photoelectron Corporation Low power x-ray source with implantable probe for treatment of brain tumors
US5153900A (en) * 1990-09-05 1992-10-06 Photoelectron Corporation Miniaturized low power x-ray source
US5452720A (en) * 1990-09-05 1995-09-26 Photoelectron Corporation Method for treating brain tumors
US5428658A (en) * 1994-01-21 1995-06-27 Photoelectron Corporation X-ray source with flexible probe
US5115457A (en) * 1990-10-01 1992-05-19 E. I. Du Pont De Nemours And Company Method of determining titanium dioxide content in paint
US6377846B1 (en) 1997-02-21 2002-04-23 Medtronic Ave, Inc. Device for delivering localized x-ray radiation and method of manufacture
WO1997007740A1 (en) 1995-08-24 1997-03-06 Interventional Innovations Corporation X-ray catheter
DE69823406T2 (de) * 1997-02-21 2005-01-13 Medtronic AVE, Inc., Santa Rosa Röntgenvorrichtung versehen mit einer Dehnungsstruktur zur lokalen Bestrahlung des Inneren eines Körpers
FI102697B (fi) * 1997-06-26 1999-01-29 Metorex Internat Oy Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärje stely ja röntgenputki
US5854822A (en) * 1997-07-25 1998-12-29 Xrt Corp. Miniature x-ray device having cold cathode
US6108402A (en) * 1998-01-16 2000-08-22 Medtronic Ave, Inc. Diamond vacuum housing for miniature x-ray device
US6069938A (en) * 1998-03-06 2000-05-30 Chornenky; Victor Ivan Method and x-ray device using pulse high voltage source
US6195411B1 (en) 1999-05-13 2001-02-27 Photoelectron Corporation Miniature x-ray source with flexible probe
JP2003142294A (ja) * 2001-10-31 2003-05-16 Ge Medical Systems Global Technology Co Llc 高電圧発生回路およびｘ線発生装置
EP2111239B1 (en) 2006-12-15 2013-03-06 Lifebond Ltd. Gelatin-transglutaminase hemostatic dressings and sealants
US20100008989A1 (en) 2008-06-12 2010-01-14 Ishay Attar Process for manufacture of gelatin solutions and products thereof
EP2303341A2 (en) * 2008-06-18 2011-04-06 Lifebond Ltd A method for enzymatic cross-linking of a protein
EP2303344A2 (en) * 2008-06-18 2011-04-06 Lifebond Ltd Methods and devices for use with sealants
CN102124058B (zh) * 2008-06-18 2014-05-28 生命连结有限公司 改进的交联组合物
EP2515957B1 (en) 2009-12-22 2015-07-29 Lifebond Ltd Modification of enzymatic crosslinkers for controlling properties of crosslinked matrices
DK2600910T3 (en) 2010-08-05 2016-04-04 Lifebond Ltd Wound dressings and adhesives COMPREHENSIVE DRYING FORMATIONS
US11998654B2 (en) 2018-07-12 2024-06-04 Bard Shannon Limited Securing implants and medical devices

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5051391A (ja) * 1973-09-06 1975-05-08
JPS5074390U (ja) * 1973-11-06 1975-06-28
JPS5139580U (ja) * 1974-09-18 1976-03-24

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL92853C (ja) * 1952-02-20
US2999937A (en) * 1958-10-20 1961-09-12 Philips Corp X-ray apparatus
DE1773759A1 (de) * 1968-07-03 1972-03-16 Vnii Raswedotschnoj Geofisiki Vorrichtung fuer Roentgenspektralanalyse
JPS5435078B1 (ja) * 1970-07-30 1979-10-31
US4048496A (en) * 1972-05-08 1977-09-13 Albert Richard D Selectable wavelength X-ray source, spectrometer and assay method
US3925660A (en) * 1972-05-08 1975-12-09 Richard D Albert Selectable wavelength X-ray source, spectrometer and assay method
JPS5139580B2 (ja) * 1973-02-08 1976-10-28
US3963922A (en) * 1975-06-09 1976-06-15 Nuclear Semiconductor X-ray fluorescence device
GB1537099A (en) * 1976-06-15 1978-12-29 United Scient Corp X-ray fluorescence device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5051391A (ja) * 1973-09-06 1975-05-08
JPS5074390U (ja) * 1973-11-06 1975-06-28
JPS5139580U (ja) * 1974-09-18 1976-03-24

Also Published As

Publication number Publication date
ZA793095B (en) 1980-08-27
US4344181A (en) 1982-08-10
AU522334B2 (en) 1982-05-27
FR2429425A1 (fr) 1980-01-18
FI72814C (fi) 1987-07-10
SE415804B (sv) 1980-10-27
SE7807078L (sv) 1979-12-22
FI72814B (fi) 1987-03-31
GB2025040A (en) 1980-01-16
FI791817A (fi) 1979-12-22
NL7904500A (nl) 1979-12-28
DE2924244A1 (de) 1980-01-03
JPS552991A (en) 1980-01-10
DE2924244C2 (de) 1987-05-07
FR2429425B1 (ja) 1985-04-26
CA1139021A (en) 1983-01-04
GB2025040B (en) 1982-11-17
AU4823679A (en) 1980-01-03
JPH0334681Y2 (ja) 1991-07-23

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