JPS5435078B1 - - Google Patents

Info

Publication number
JPS5435078B1
JPS5435078B1 JP6686770A JP6686770A JPS5435078B1 JP S5435078 B1 JPS5435078 B1 JP S5435078B1 JP 6686770 A JP6686770 A JP 6686770A JP 6686770 A JP6686770 A JP 6686770A JP S5435078 B1 JPS5435078 B1 JP S5435078B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6686770A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6686770A priority Critical patent/JPS5435078B1/ja
Priority to DE19712136460 priority patent/DE2136460A1/de
Priority to FR7127859A priority patent/FR2099373A5/fr
Priority to GB3607671A priority patent/GB1354177A/en
Priority to US00167373A priority patent/US3732426A/en
Publication of JPS5435078B1 publication Critical patent/JPS5435078B1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/56—Arrangements for controlling cross-section of ray or beam; Arrangements for correcting aberration of beam, e.g. due to lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/147—Spot size control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP6686770A 1970-07-30 1970-07-30 Pending JPS5435078B1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP6686770A JPS5435078B1 (ja) 1970-07-30 1970-07-30
DE19712136460 DE2136460A1 (de) 1970-07-30 1971-07-21 Röntgenstrahlenquelle
FR7127859A FR2099373A5 (ja) 1970-07-30 1971-07-29
GB3607671A GB1354177A (en) 1970-07-30 1971-07-30 X-ray source
US00167373A US3732426A (en) 1970-07-30 1971-07-30 X-ray source for generating an x-ray beam having selectable sectional shapes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6686770A JPS5435078B1 (ja) 1970-07-30 1970-07-30

Publications (1)

Publication Number Publication Date
JPS5435078B1 true JPS5435078B1 (ja) 1979-10-31

Family

ID=13328226

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6686770A Pending JPS5435078B1 (ja) 1970-07-30 1970-07-30

Country Status (5)

Country Link
US (1) US3732426A (ja)
JP (1) JPS5435078B1 (ja)
DE (1) DE2136460A1 (ja)
FR (1) FR2099373A5 (ja)
GB (1) GB1354177A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007043412A1 (ja) * 2005-10-07 2007-04-19 Hamamatsu Photonics K.K. Ｘ線管及びそれを含むｘ線源
US10825640B2 (en) 2018-04-12 2020-11-03 Hamamatsu Photonics K.K. X-ray tube

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3962583A (en) * 1974-12-30 1976-06-08 The Machlett Laboratories, Incorporated X-ray tube focusing means
SE415804B (sv) * 1978-06-21 1980-10-27 Nils Johannes Baecklund Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet
FR2534066B1 (fr) * 1982-10-05 1989-09-08 Thomson Csf Tube a rayons x produisant un faisceau a haut rendement, notamment en forme de pinceau
DE3401749A1 (de) * 1984-01-19 1985-08-01 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikeinrichtung mit einer roentgenroehre
DE19639920C2 (de) * 1996-09-27 1999-08-26 Siemens Ag Röntgenröhre mit variablem Fokus
GB9620160D0 (en) * 1996-09-27 1996-11-13 Bede Scient Instr Ltd X-ray generator
US6236713B1 (en) 1998-10-27 2001-05-22 Litton Systems, Inc. X-ray tube providing variable imaging spot size
US7826595B2 (en) * 2000-10-06 2010-11-02 The University Of North Carolina Micro-focus field emission x-ray sources and related methods
WO2011124237A1 (de) * 2010-04-09 2011-10-13 Ge Sensing & Inspection Technologies Gmbh Kathodenelement für eine mikrofokus-röntgenröhre
US9748070B1 (en) 2014-09-17 2017-08-29 Bruker Jv Israel Ltd. X-ray tube anode
US11302508B2 (en) 2018-11-08 2022-04-12 Bruker Technologies Ltd. X-ray tube

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2866902A (en) * 1955-07-05 1958-12-30 High Voltage Engineering Corp Method of and apparatus for irradiating matter with high energy electrons
IT584331A (ja) * 1955-10-29
US2849634A (en) * 1956-07-09 1958-08-26 Vickers Electrical Co Ltd Linear electron accelerators
US2919381A (en) * 1956-07-25 1959-12-29 Farrand Optical Co Inc Electron lens
DE1064168B (de) * 1958-06-20 1959-08-27 Zeiss Carl Fa Einrichtung zur Erzeugung und Formung eines Ladungstraegerstrahles
US2944175A (en) * 1959-03-26 1960-07-05 Motorola Inc Television receiver
US3376449A (en) * 1967-01-20 1968-04-02 Ion Physics Corp Electrostatic quadrapole lens assembly with transverse intermediate termination elements of resistive material joining together the quadrapole electrodes for preventing beam aberration

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007043412A1 (ja) * 2005-10-07 2007-04-19 Hamamatsu Photonics K.K. Ｘ線管及びそれを含むｘ線源
US10825640B2 (en) 2018-04-12 2020-11-03 Hamamatsu Photonics K.K. X-ray tube

Also Published As

Publication number Publication date
FR2099373A5 (ja) 1972-03-10
US3732426A (en) 1973-05-08
DE2136460A1 (de) 1972-03-09
GB1354177A (en) 1974-06-05

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