JPS6411526B2 - - Google Patents

Info

Publication number
JPS6411526B2
JPS6411526B2 JP5200682A JP5200682A JPS6411526B2 JP S6411526 B2 JPS6411526 B2 JP S6411526B2 JP 5200682 A JP5200682 A JP 5200682A JP 5200682 A JP5200682 A JP 5200682A JP S6411526 B2 JPS6411526 B2 JP S6411526B2
Authority
JP
Japan
Prior art keywords
chute
air cylinder
semiconductor device
pen air
pen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP5200682A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58168251A (ja
Inventor
Masatoshi Mishima
Naohiko Urasaki
Shigeki Takeo
Iwao Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP5200682A priority Critical patent/JPS58168251A/ja
Publication of JPS58168251A publication Critical patent/JPS58168251A/ja
Publication of JPS6411526B2 publication Critical patent/JPS6411526B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chutes (AREA)
  • Feeding Of Articles To Conveyors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP5200682A 1982-03-30 1982-03-30 供給シユ−ト装置 Granted JPS58168251A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5200682A JPS58168251A (ja) 1982-03-30 1982-03-30 供給シユ−ト装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5200682A JPS58168251A (ja) 1982-03-30 1982-03-30 供給シユ−ト装置

Publications (2)

Publication Number Publication Date
JPS58168251A JPS58168251A (ja) 1983-10-04
JPS6411526B2 true JPS6411526B2 (de) 1989-02-27

Family

ID=12902731

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5200682A Granted JPS58168251A (ja) 1982-03-30 1982-03-30 供給シユ−ト装置

Country Status (1)

Country Link
JP (1) JPS58168251A (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60213041A (ja) * 1984-04-09 1985-10-25 Sanwa Electron Kk Icのピンの状態検出装置
JPH0644100Y2 (ja) * 1986-03-19 1994-11-14 旭化成工業株式会社 半導体素子の位置決め装置
JPS6335712U (de) * 1986-08-25 1988-03-08
JPH0680930B2 (ja) * 1987-02-02 1994-10-12 株式会社日立製作所 部品供給装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5511884U (de) * 1978-07-11 1980-01-25

Also Published As

Publication number Publication date
JPS58168251A (ja) 1983-10-04

Similar Documents

Publication Publication Date Title
CN107051900A (zh) 一种应用于轴承在线检测的自动化设备
DE19523969C2 (de) Bausteintransportvorrichtung und Verfahren zum wiederholten Testen von Bausteinen für IC-Handhabungseinrichtung
CN108499893A (zh) 固态硬盘测试系统上下料一体机
US4953841A (en) Machine and process for separating signatures
CN106179981A (zh) 一种用于磁环自动检测的分选设备及其实现方法
JPS633781A (ja) 不完全煙草排除装置
JPS6411526B2 (de)
US3097161A (en) Capsule inspection and separation
JPS5857735A (ja) 選別装置
JPS6227541B2 (de)
JPS628938B2 (de)
KR101084606B1 (ko) 발광 다이오드 검사 및 포장 통합장치를 이용한 발광 다이오드 포장방법
US4222488A (en) Methods and apparatus for sorting articles
JPS6229902B2 (de)
KR101460962B1 (ko) 비전검사장비의 로더장치
JPS6230695B2 (de)
JPS6044409A (ja) 半導体装置の移送装置
CN219378049U (zh) 一种汽车线圈骨架生产装置
DE102007048397B3 (de) Halbleiter-Chip-Zuführung über mehrere Wafer-Bereitstellungsebenen
JPH0717025Y2 (ja) Ic試験装置
JPS6130981Y2 (de)
KR100500917B1 (ko) 반도체패키지 튜브적재장치
JPS5933977B2 (ja) 半導体素子の個別送り装置
JPS59105332A (ja) 半導体装置用自動測定機
JPS62257375A (ja) 煙草検査方法及び装置