JPS6366020B2 - - Google Patents

Info

Publication number
JPS6366020B2
JPS6366020B2 JP6707979A JP6707979A JPS6366020B2 JP S6366020 B2 JPS6366020 B2 JP S6366020B2 JP 6707979 A JP6707979 A JP 6707979A JP 6707979 A JP6707979 A JP 6707979A JP S6366020 B2 JPS6366020 B2 JP S6366020B2
Authority
JP
Japan
Prior art keywords
light source
light
image
optical sensor
exposure table
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6707979A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55159539A (en
Inventor
Yukitaka Myata
Seiji Goshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP6707979A priority Critical patent/JPS55159539A/ja
Publication of JPS55159539A publication Critical patent/JPS55159539A/ja
Publication of JPS6366020B2 publication Critical patent/JPS6366020B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/20Manufacture of screens on or from which an image or pattern is formed, picked up, converted or stored; Applying coatings to the vessel

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Formation Of Various Coating Films On Cathode Ray Tubes And Lamps (AREA)
JP6707979A 1979-05-30 1979-05-30 Source position meter for exposure base Granted JPS55159539A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6707979A JPS55159539A (en) 1979-05-30 1979-05-30 Source position meter for exposure base

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6707979A JPS55159539A (en) 1979-05-30 1979-05-30 Source position meter for exposure base

Publications (2)

Publication Number Publication Date
JPS55159539A JPS55159539A (en) 1980-12-11
JPS6366020B2 true JPS6366020B2 (cg-RX-API-DMAC7.html) 1988-12-19

Family

ID=13334498

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6707979A Granted JPS55159539A (en) 1979-05-30 1979-05-30 Source position meter for exposure base

Country Status (1)

Country Link
JP (1) JPS55159539A (cg-RX-API-DMAC7.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5778126A (en) * 1980-10-31 1982-05-15 Matsushita Electric Industrial Co Ltd Metallized film condenser
JPS58223701A (ja) * 1982-06-23 1983-12-26 Toshiba Corp 光源位置測定装置
JPS5911047U (ja) * 1982-07-14 1984-01-24 河西工業株式会社 電話機設置台付サイドトリム
JP2602206B2 (ja) * 1986-01-14 1997-04-23 松下電工株式会社 配線用遮断器
JP2782668B2 (ja) * 1994-05-18 1998-08-06 関西日本電気株式会社 露光装置
JPH08264122A (ja) * 1995-03-28 1996-10-11 Nec Kansai Ltd アライメント測定装置及びその使用方法

Also Published As

Publication number Publication date
JPS55159539A (en) 1980-12-11

Similar Documents

Publication Publication Date Title
US5153916A (en) Method and apparatus for detecting focal plane
JP2002116013A (ja) 非接触型外形測定装置
JPH02174492A (ja) カラーcrtのコンバーゼンス測定装置
US6219442B1 (en) Apparatus and method for measuring distortion of a visible pattern on a substrate by viewing predetermined portions thereof
KR880010457A (ko) 콘버젼스 측정 및 보정 판정 방법과 장치
JPS6366020B2 (cg-RX-API-DMAC7.html)
US3678192A (en) Method and apparatus for digital measurement with an industrial television
GB2064102A (en) Improvements in electro- optical dimension measurement
US10944944B2 (en) Automatically producing an optical blend mask individually adapted to a projector and its position to a projection surface of the projection system
US4917488A (en) Photocell distance measurement
JPH1040815A (ja) ストライプパターン検査装置
JPH07229736A (ja) 三次元計測器校正装置
US5434429A (en) Image sensing device with circuit layout alignment pattern
JPH08264122A (ja) アライメント測定装置及びその使用方法
JP2615659B2 (ja) ラスター位置測定装置
JP2008256455A (ja) 光測定方法及び光測定装置
JPS60228904A (ja) 露光装置内の光源位置測定装置
RU2079923C1 (ru) Устройство для измерения положения источника света в установках фотоэкспонирования
JPS61250923A (ja) テレビ画面歪測定装置
JPS5918651B2 (ja) 硬さ計測表示方法およびその装置
JPH10136410A (ja) Crtコンバージェンス測定方法
EP0276909B1 (en) Photocell distance measurement method and apparatus
KR0167772B1 (ko) 콘버전스측정장치
JPS63116339A (ja) カラ−ブラウン管のコンバ−ゼンス測定装置
JP2976743B2 (ja) シャドウマスク及びカラーフィルタのパターンむらの検査方法