JPS6342455Y2 - - Google Patents
Info
- Publication number
- JPS6342455Y2 JPS6342455Y2 JP16349482U JP16349482U JPS6342455Y2 JP S6342455 Y2 JPS6342455 Y2 JP S6342455Y2 JP 16349482 U JP16349482 U JP 16349482U JP 16349482 U JP16349482 U JP 16349482U JP S6342455 Y2 JPS6342455 Y2 JP S6342455Y2
- Authority
- JP
- Japan
- Prior art keywords
- aperture
- diaphragm
- piece
- mirror body
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000615 nonconductor Substances 0.000 claims description 9
- 238000001514 detection method Methods 0.000 claims description 8
- 230000002159 abnormal effect Effects 0.000 claims description 3
- 230000005856 abnormality Effects 0.000 description 6
- 238000010894 electron beam technology Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16349482U JPS5966849U (ja) | 1982-10-28 | 1982-10-28 | 電子顕微鏡等用絞り装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16349482U JPS5966849U (ja) | 1982-10-28 | 1982-10-28 | 電子顕微鏡等用絞り装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5966849U JPS5966849U (ja) | 1984-05-04 |
| JPS6342455Y2 true JPS6342455Y2 (enrdf_load_stackoverflow) | 1988-11-07 |
Family
ID=30358723
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16349482U Granted JPS5966849U (ja) | 1982-10-28 | 1982-10-28 | 電子顕微鏡等用絞り装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5966849U (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7022815B2 (ja) * | 2018-03-29 | 2022-02-18 | 株式会社日立ハイテク | 荷電粒子線装置 |
-
1982
- 1982-10-28 JP JP16349482U patent/JPS5966849U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5966849U (ja) | 1984-05-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5296704A (en) | Scanning tunneling microscope | |
| US4532810A (en) | Device for the pick-up of measured values | |
| EP0527601A1 (en) | Composite scanning tunnelling microscope and optical microscope | |
| JP2001124550A (ja) | 傾斜センサ | |
| JPS6342455Y2 (enrdf_load_stackoverflow) | ||
| JPS6352423B2 (enrdf_load_stackoverflow) | ||
| US1601014A (en) | Controlling apparatus for light projectors | |
| US5920073A (en) | Optical system | |
| JPH04308638A (ja) | 電子顕微鏡用試料駆動装置 | |
| JPS59211802A (ja) | 車軸測定器の測定装置の保持装置 | |
| US3480855A (en) | Image dissector system having pattern rotation means | |
| US4197494A (en) | Electromagnetic device with magnetic null means | |
| KR100190644B1 (ko) | 광픽업 액츄에이터의 보빈 코일 방향성 검사장치 | |
| US3308294A (en) | Tiltable specimen holder for electron microscopes with electrical deflecting means to wobble the electron beam image | |
| JP2005118908A (ja) | マグネットチャックの着磁状態の表示方法およびその装置 | |
| US3255532A (en) | Magnetic measuring apparatus | |
| US496500A (en) | Electrical measuring-instrument | |
| JPH07243855A (ja) | 可視光ビームの投光装置 | |
| JPH11233053A (ja) | 電子顕微鏡等用可動絞り装置 | |
| JP2002221472A (ja) | 試料作成装置 | |
| JPH0740221Y2 (ja) | 計器用ムーブメント | |
| JPS59210307A (ja) | 外径測定装置 | |
| JPS58111136A (ja) | 光ピツクアツプ装置の対物レンズ上下左右移動装置 | |
| JPH067312Y2 (ja) | クロスコイル形指示計器 | |
| JPH0449669B2 (enrdf_load_stackoverflow) |