JPS6341417B2 - - Google Patents
Info
- Publication number
- JPS6341417B2 JPS6341417B2 JP55122532A JP12253280A JPS6341417B2 JP S6341417 B2 JPS6341417 B2 JP S6341417B2 JP 55122532 A JP55122532 A JP 55122532A JP 12253280 A JP12253280 A JP 12253280A JP S6341417 B2 JPS6341417 B2 JP S6341417B2
- Authority
- JP
- Japan
- Prior art keywords
- dew
- frost
- sensor
- temperature
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 39
- 238000010438 heat treatment Methods 0.000 claims description 11
- 238000001816 cooling Methods 0.000 claims description 10
- 230000007423 decrease Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 9
- 238000005259 measurement Methods 0.000 description 8
- 230000005494 condensation Effects 0.000 description 3
- 238000009833 condensation Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000009529 body temperature measurement Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000004781 supercooling Methods 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
- G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12253280A JPS5746147A (en) | 1980-09-04 | 1980-09-04 | Measuring device for dew point and frost point |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12253280A JPS5746147A (en) | 1980-09-04 | 1980-09-04 | Measuring device for dew point and frost point |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5746147A JPS5746147A (en) | 1982-03-16 |
JPS6341417B2 true JPS6341417B2 (ru) | 1988-08-17 |
Family
ID=14838181
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12253280A Granted JPS5746147A (en) | 1980-09-04 | 1980-09-04 | Measuring device for dew point and frost point |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5746147A (ru) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63167243U (ru) * | 1987-04-22 | 1988-10-31 | ||
JP2007292275A (ja) * | 2006-03-31 | 2007-11-08 | Synztec Co Ltd | マウントブッシュ |
KR100926461B1 (ko) * | 2007-12-14 | 2009-11-13 | 한국표준과학연구원 | 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점구별 측정 방법 |
WO2017213118A1 (ja) * | 2016-06-08 | 2017-12-14 | 国立研究開発法人物質・材料研究機構 | 露点測定方法及び露点測定装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53148485A (en) * | 1977-05-31 | 1978-12-25 | Yokogawa Hokushin Electric Corp | Dew point and frost point detector |
-
1980
- 1980-09-04 JP JP12253280A patent/JPS5746147A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53148485A (en) * | 1977-05-31 | 1978-12-25 | Yokogawa Hokushin Electric Corp | Dew point and frost point detector |
Also Published As
Publication number | Publication date |
---|---|
JPS5746147A (en) | 1982-03-16 |
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