KR100926461B1 - 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점구별 측정 방법 - Google Patents
수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점구별 측정 방법 Download PDFInfo
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- KR100926461B1 KR100926461B1 KR1020070131458A KR20070131458A KR100926461B1 KR 100926461 B1 KR100926461 B1 KR 100926461B1 KR 1020070131458 A KR1020070131458 A KR 1020070131458A KR 20070131458 A KR20070131458 A KR 20070131458A KR 100926461 B1 KR100926461 B1 KR 100926461B1
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- dew point
- temperature
- resonance frequency
- crystal oscillator
- microbalance
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- 239000013078 crystal Substances 0.000 title claims abstract description 96
- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000005259 measurement Methods 0.000 title description 11
- 230000035939 shock Effects 0.000 claims abstract description 16
- 239000010453 quartz Substances 0.000 claims abstract description 13
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 13
- 238000003380 quartz crystal microbalance Methods 0.000 claims abstract description 4
- 238000001816 cooling Methods 0.000 claims description 17
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 16
- 230000007423 decrease Effects 0.000 claims description 15
- 230000007704 transition Effects 0.000 claims description 11
- 238000000691 measurement method Methods 0.000 claims description 8
- 229910052697 platinum Inorganic materials 0.000 claims description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
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- 230000003247 decreasing effect Effects 0.000 claims description 4
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- 229920006395 saturated elastomer Polymers 0.000 description 11
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 6
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
- G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
- G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
- G01N25/68—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/02—Investigating or analyzing materials by the use of thermal means by investigating changes of state or changes of phase; by investigating sintering
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
Description
Claims (9)
- 온도를 서서히 하강시키면서 수정미소저울 노점센서(quartz crystal microbalance dew-point sensor)의 공명진동수를 측정하는 단계;상기 공명진동수의 충격파를 관찰하는 단계; 및상기 수정미소저울 노점센서의 공명진동수 및 상기 충격파의 관찰을 통하여 이슬점 또는 서리점을 결정하는 단계를 포함하는 것을 특징으로 하는 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점 구별 측정 방법.
- 제 1항에 있어서,상기 수정미소저울 노점센서의 수정진동자 공명진동수를 온도를 감소시키며 관찰할 때, 상기 수정진동자의 공명진동수 패턴에서 급격한 감소패턴이 나타나는 시점의 온도를 이슬점 또는 상점이라고 판단하되,공명진동수의 온도에 따른 변화 양상이 임의의 형태에서 그와는 다른 형태로 변화가 이루어지는 현상을 전이현상이라 할 때,충격파와 공명진동수의 전이현상이 나타나는 경우에는, 상기 온도를 이슬점이라 판단하고,충격파와 공명진동수의 전이현상이 관측되지 않을 경우에는, 상기 온도를 상점이라고 판단하는 것을 특징으로 하는 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점 구별 측정 방법.
- 제 1 항에 있어서,상기 공명진동수의 충격파가 관찰되기 전에, 상기 공명진동수는 일정하게 감소하는 것을 특징으로 하는 저온에서의 이슬점 측정 방법.
- 제 3 항에 있어서,상기 공명진동수의 충격파를 관찰한 후에, 상기 공명진동수는 다시 일정하게 감소하는 것을 특징으로 하는 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점 구별 측정 방법.
- 제 1 항에 있어서,상기 온도를 서서히 하강시키는 것은 0℃ 이하 -90℃ 이상의 온도 범위에서 수행하는 것을 특징으로 하는 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점 구별 측정 방법.
- 제 1 항에 있어서,상기 수정미소저울 노점센서는 수정진동자(quartz resonator), 펠티어 냉각소자(Peltier cooler device), 수정진동자 홀더 및 백금저항온도소자(platinum resistance temperature sensor)를 포함하는 것을 특징으로 하는 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점 구별 측정 방법.
- 제 6 항에 있어서,상기 온도를 서서히 하강시키는 것은 상기 펠티어 냉각소자를 이용하여 상기 수정진동자의 온도를 조절하여 수행되는 것을 특징으로 하는 수정미소저울 노점센 서를 이용한 저온에서의 상점과 이슬점 구별 측정 방법.
- 제 7 항에 있어서,상기 펠티어 냉각소자에 의해 하강되는 온도가 상기 수정진동자 홀더를 통해 상기 수정진동자로 전해짐으로써, 상기 수정진동자의 온도가 조절되는 것을 특징으로 하는 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점 구별 측정 방법.
- 제 8 항에 있어서,상기 수정진동자 홀더는 구리로 만들어지며, 상기 수정진동자 홀더의 온도 측정을 위해 상기 수정진동자의 일면에 백금저항온도소자가 부착되는 것을 특징으로 하는 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점 구별 측정 방법.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070131458A KR100926461B1 (ko) | 2007-12-14 | 2007-12-14 | 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점구별 측정 방법 |
PCT/KR2007/006830 WO2009088108A1 (en) | 2007-12-14 | 2007-12-26 | The measurement method of distinguishing dew and frost point using quartz crystal microbalance dew-point sensor in low temperature |
US12/747,320 US8485720B2 (en) | 2007-12-14 | 2007-12-26 | Measurement method of distinguishing dew and frost point using quartz crystal microbalance dew-point sensor in low temperature |
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KR1020070131458A KR100926461B1 (ko) | 2007-12-14 | 2007-12-14 | 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점구별 측정 방법 |
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KR20090063925A KR20090063925A (ko) | 2009-06-18 |
KR100926461B1 true KR100926461B1 (ko) | 2009-11-13 |
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KR1020070131458A KR100926461B1 (ko) | 2007-12-14 | 2007-12-14 | 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점구별 측정 방법 |
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US (1) | US8485720B2 (ko) |
KR (1) | KR100926461B1 (ko) |
WO (1) | WO2009088108A1 (ko) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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US20140192836A1 (en) * | 2012-12-10 | 2014-07-10 | Femtoscale, Inc. | Resonant dew point measuring device |
US10408775B2 (en) | 2015-05-26 | 2019-09-10 | Agency For Science, Technology And Research | Sensor arrangements and methods of operating a sensor arrangement |
US20160356731A1 (en) * | 2015-06-05 | 2016-12-08 | Probe Holdings, Inc. | Thermal conductivity quartz transducer with waste-heat management system |
JP7246049B2 (ja) * | 2019-05-27 | 2023-03-27 | 日本電波工業株式会社 | 感知装置 |
CN112818528B (zh) * | 2021-01-21 | 2021-09-24 | 河海大学 | 超高频无线微波数据驱动的露点-霜点温度场重构方法 |
CN114441426A (zh) * | 2021-12-22 | 2022-05-06 | 中国兵器工业第五九研究所 | 一种环境效应监测装置及系统 |
CN114674917B (zh) * | 2022-03-25 | 2023-07-18 | 兰州空间技术物理研究所 | 一种月面尘埃沉积质量原位探测器及其制造方法 |
CN116047180A (zh) * | 2022-11-24 | 2023-05-02 | 南方电网数字电网研究院有限公司 | 一种石墨烯电场传感器 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56126738A (en) | 1980-03-12 | 1981-10-05 | Yokogawa Hokushin Electric Corp | Cooling-type dew-point meter |
JPS56155351U (ko) | 1980-04-22 | 1981-11-19 | ||
JPS5746147A (en) | 1980-09-04 | 1982-03-16 | Yokogawa Hokushin Electric Corp | Measuring device for dew point and frost point |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU651271A1 (ru) * | 1975-01-28 | 1979-03-05 | Институт Экспериментальной Метеорологии | Устройство дл измерени активного сопротивлени кварцевых резонаторов |
SU682854A1 (ru) * | 1977-03-30 | 1979-08-30 | Всесоюзный Заочный Инженерно-Строительный Институт | Устройство дл измерени влажности |
US4760351A (en) * | 1986-08-22 | 1988-07-26 | Northern Illinois University | Multiple oscillator device having plural quartz resonators in a common quartz substrate |
US4793182A (en) * | 1987-06-02 | 1988-12-27 | Djorup Robert Sonny | Constant temperature hygrometer |
JPH0219742A (ja) * | 1988-07-08 | 1990-01-23 | Nok Corp | 水晶振動子湿度センサ |
US5299867A (en) * | 1992-06-30 | 1994-04-05 | Buck Arden L | Low moisture cryogenic hygrometer |
JPH07260661A (ja) * | 1994-03-25 | 1995-10-13 | Nok Corp | 水晶振動子湿度センサ |
US5661233A (en) * | 1996-03-26 | 1997-08-26 | Sandia Corporation | Acoustic-wave sensor apparatus for analyzing a petroleum-based composition and sensing solidification of constituents therein |
US6926439B2 (en) * | 1998-10-30 | 2005-08-09 | Optiguide Ltd. | Dew point hygrometers and dew sensors |
US6126311A (en) * | 1998-11-02 | 2000-10-03 | Claud S. Gordon Company | Dew point sensor using mems |
US6073479A (en) * | 1998-11-13 | 2000-06-13 | General Electric Company | Dewpoint sensor |
WO2009041371A1 (ja) * | 2007-09-28 | 2009-04-02 | National Institute Of Advanced Industrial Science And Technology | 検出センサ |
US8215171B1 (en) * | 2008-08-26 | 2012-07-10 | University Of South Florida | Uniform mass sensitivity thickness shear mode quartz resonator |
RU106395U1 (ru) * | 2010-06-11 | 2011-07-10 | Вячеслав Элизбарович Иванов | Цифровой радиозонд со сверхрегенеративным приемопередатчиком |
WO2012009429A1 (en) * | 2010-07-13 | 2012-01-19 | Sand9, Inc. | Methods and apparatus for calibration and temperature compensation of oscillators having mechanical resonators |
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2007
- 2007-12-14 KR KR1020070131458A patent/KR100926461B1/ko not_active IP Right Cessation
- 2007-12-26 WO PCT/KR2007/006830 patent/WO2009088108A1/en active Application Filing
- 2007-12-26 US US12/747,320 patent/US8485720B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56126738A (en) | 1980-03-12 | 1981-10-05 | Yokogawa Hokushin Electric Corp | Cooling-type dew-point meter |
JPS56155351U (ko) | 1980-04-22 | 1981-11-19 | ||
JPS5746147A (en) | 1980-09-04 | 1982-03-16 | Yokogawa Hokushin Electric Corp | Measuring device for dew point and frost point |
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KR20090063925A (ko) | 2009-06-18 |
WO2009088108A1 (en) | 2009-07-16 |
US20100322280A1 (en) | 2010-12-23 |
US8485720B2 (en) | 2013-07-16 |
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