JPS6338175A - 半導体発光素子の発光特性測定装置 - Google Patents

半導体発光素子の発光特性測定装置

Info

Publication number
JPS6338175A
JPS6338175A JP61182886A JP18288686A JPS6338175A JP S6338175 A JPS6338175 A JP S6338175A JP 61182886 A JP61182886 A JP 61182886A JP 18288686 A JP18288686 A JP 18288686A JP S6338175 A JPS6338175 A JP S6338175A
Authority
JP
Japan
Prior art keywords
light emitting
video camera
light
semiconductor light
emitting element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61182886A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0360376B2 (enExample
Inventor
Iesato Sato
佐藤 家郷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meisei Electric Co Ltd
Original Assignee
Meisei Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meisei Electric Co Ltd filed Critical Meisei Electric Co Ltd
Priority to JP61182886A priority Critical patent/JPS6338175A/ja
Publication of JPS6338175A publication Critical patent/JPS6338175A/ja
Publication of JPH0360376B2 publication Critical patent/JPH0360376B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP61182886A 1986-08-04 1986-08-04 半導体発光素子の発光特性測定装置 Granted JPS6338175A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61182886A JPS6338175A (ja) 1986-08-04 1986-08-04 半導体発光素子の発光特性測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61182886A JPS6338175A (ja) 1986-08-04 1986-08-04 半導体発光素子の発光特性測定装置

Publications (2)

Publication Number Publication Date
JPS6338175A true JPS6338175A (ja) 1988-02-18
JPH0360376B2 JPH0360376B2 (enExample) 1991-09-13

Family

ID=16126125

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61182886A Granted JPS6338175A (ja) 1986-08-04 1986-08-04 半導体発光素子の発光特性測定装置

Country Status (1)

Country Link
JP (1) JPS6338175A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0446691A (ja) * 1990-06-14 1992-02-17 Mitsubishi Heavy Ind Ltd Yagレーザー光の拡がり角計測方法
JP2008180661A (ja) * 2007-01-26 2008-08-07 Shin Etsu Handotai Co Ltd 電子デバイス検査装置及び電子デバイス検査方法
JP2015210134A (ja) * 2014-04-24 2015-11-24 豊田合成株式会社 光学測定装置および発光素子の波長測定方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58108423A (ja) * 1981-12-21 1983-06-28 Mitsubishi Electric Corp 発光素子の輝度分布測定装置
JPS6189536A (ja) * 1984-10-09 1986-05-07 Meisei Electric Co Ltd 信号の送・受信特性パタ−ン計測装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58108423A (ja) * 1981-12-21 1983-06-28 Mitsubishi Electric Corp 発光素子の輝度分布測定装置
JPS6189536A (ja) * 1984-10-09 1986-05-07 Meisei Electric Co Ltd 信号の送・受信特性パタ−ン計測装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0446691A (ja) * 1990-06-14 1992-02-17 Mitsubishi Heavy Ind Ltd Yagレーザー光の拡がり角計測方法
JP2008180661A (ja) * 2007-01-26 2008-08-07 Shin Etsu Handotai Co Ltd 電子デバイス検査装置及び電子デバイス検査方法
JP2015210134A (ja) * 2014-04-24 2015-11-24 豊田合成株式会社 光学測定装置および発光素子の波長測定方法

Also Published As

Publication number Publication date
JPH0360376B2 (enExample) 1991-09-13

Similar Documents

Publication Publication Date Title
US6002792A (en) Semiconductor device inspection system
JPH0117523B2 (enExample)
CN105981363B (zh) 成像模块以及成像装置
EP0653626A1 (en) Semiconductor device inspection system
JPS6338175A (ja) 半導体発光素子の発光特性測定装置
JPH0321913A (ja) 走査型顕微鏡装置
JP2624481B2 (ja) 光誘起電流による半導体装置の検査装置
JPH0575921A (ja) 露光制御装置
US8279326B2 (en) Light quantity detecting apparatus and imaging apparatus
JP2975194B2 (ja) 半導体デバイス検査システム
JP3029004B2 (ja) 立体ビジョンカメラ
JP4266286B2 (ja) 距離情報取得装置、および距離情報取得方法
CN220305493U (zh) 光电探测器测试系统、激光雷达
JPH085570A (ja) パターン検査装置のレベル調整方法
TW201514479A (zh) 缺陷觀察裝置及其方法
JPH02198347A (ja) 半導体不良解析装置
JP3190061B2 (ja) 画素を有する光電変換装置の電気出力を処理する方法及びその装置
JPH07270239A (ja) 半田付け監視装置及びそれを用いた半田付け監視システム
JP2004145195A (ja) 画像取り込み装置
US6867417B2 (en) Method of acquiring data from multi-element detector in infrared imaging apparatus
SU1504504A1 (ru) Оптико-электронное устройство дл контрол дефектов на наружных поверхност х деталей
SU211025A1 (ru) А. А. Вишневский,Ф. В. Бассин и Е. Ф. Дриго
TW202447189A (zh) 檢查裝置及檢查方法
CN121152968A (zh) 检查装置及检查方法
KR100323388B1 (ko) 디지탈 스틸 카메라의 측거 및 측광 장치

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term