JPS6338175A - 半導体発光素子の発光特性測定装置 - Google Patents
半導体発光素子の発光特性測定装置Info
- Publication number
- JPS6338175A JPS6338175A JP61182886A JP18288686A JPS6338175A JP S6338175 A JPS6338175 A JP S6338175A JP 61182886 A JP61182886 A JP 61182886A JP 18288686 A JP18288686 A JP 18288686A JP S6338175 A JPS6338175 A JP S6338175A
- Authority
- JP
- Japan
- Prior art keywords
- light emitting
- video camera
- light
- semiconductor light
- emitting element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 16
- 238000003384 imaging method Methods 0.000 claims description 11
- 206010047571 Visual impairment Diseases 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 3
- 239000007787 solid Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 12
- 239000000523 sample Substances 0.000 abstract description 6
- 230000008646 thermal stress Effects 0.000 abstract description 5
- 230000007246 mechanism Effects 0.000 description 8
- 230000003287 optical effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 230000026676 system process Effects 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Landscapes
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61182886A JPS6338175A (ja) | 1986-08-04 | 1986-08-04 | 半導体発光素子の発光特性測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61182886A JPS6338175A (ja) | 1986-08-04 | 1986-08-04 | 半導体発光素子の発光特性測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6338175A true JPS6338175A (ja) | 1988-02-18 |
| JPH0360376B2 JPH0360376B2 (enExample) | 1991-09-13 |
Family
ID=16126125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61182886A Granted JPS6338175A (ja) | 1986-08-04 | 1986-08-04 | 半導体発光素子の発光特性測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6338175A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0446691A (ja) * | 1990-06-14 | 1992-02-17 | Mitsubishi Heavy Ind Ltd | Yagレーザー光の拡がり角計測方法 |
| JP2008180661A (ja) * | 2007-01-26 | 2008-08-07 | Shin Etsu Handotai Co Ltd | 電子デバイス検査装置及び電子デバイス検査方法 |
| JP2015210134A (ja) * | 2014-04-24 | 2015-11-24 | 豊田合成株式会社 | 光学測定装置および発光素子の波長測定方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58108423A (ja) * | 1981-12-21 | 1983-06-28 | Mitsubishi Electric Corp | 発光素子の輝度分布測定装置 |
| JPS6189536A (ja) * | 1984-10-09 | 1986-05-07 | Meisei Electric Co Ltd | 信号の送・受信特性パタ−ン計測装置 |
-
1986
- 1986-08-04 JP JP61182886A patent/JPS6338175A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58108423A (ja) * | 1981-12-21 | 1983-06-28 | Mitsubishi Electric Corp | 発光素子の輝度分布測定装置 |
| JPS6189536A (ja) * | 1984-10-09 | 1986-05-07 | Meisei Electric Co Ltd | 信号の送・受信特性パタ−ン計測装置 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0446691A (ja) * | 1990-06-14 | 1992-02-17 | Mitsubishi Heavy Ind Ltd | Yagレーザー光の拡がり角計測方法 |
| JP2008180661A (ja) * | 2007-01-26 | 2008-08-07 | Shin Etsu Handotai Co Ltd | 電子デバイス検査装置及び電子デバイス検査方法 |
| JP2015210134A (ja) * | 2014-04-24 | 2015-11-24 | 豊田合成株式会社 | 光学測定装置および発光素子の波長測定方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0360376B2 (enExample) | 1991-09-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |