JPS633254A - Ultrasonic flaw detector for square billet - Google Patents

Abstract

PURPOSE:To perform flaw detection over almost the entire area except the center part without being affected by the center part if there is a large defect at the center part by providing 1st longitudinal wave oblique probes, 2nd longitudinal wave oblique probes, etc. CONSTITUTION:A square billet 1 as a material to be inspected and a saddle type guide plate 3 are provided. Further, the 1st longitudinal wave oblique probes 4 (4A-4D) are arranged nearly at both ends of flat parts of the four surfaces of the square billet 1 so that the centers of ultrasonic wave beams are directed more outside than perpendiculars. Furthermore, the 2nd longitudinal wave oblique probes 5 (5A-5D) are arranged almost at the same positions with the probes 4 so that the centers of ultrasonic wave beams are directed more inward than the perpendiculars. Then, the flaw detection in the sectional direction of the square billet 1 is carried out by those two kinds of probes 4 and 5 over the entire section except the center part without being affected by the internal structure of the center part.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an ultrasonic flaw detection device for detecting defects in square billets.

[Conventional technology]

Figure 1) is a diagram showing the probe arrangement of a conventional square billet ultrasonic flaw detection device disclosed in, for example, Japanese Utility Model Application Publication No. 56-58453. , +2] is the vertical probe arranged so as to be in contact with the four sides of the square billet fi+, (3) is the saddle-shaped guide plate equipped with the vertical probe (2), and θ1 is the orientation of the vertical probe 12). corner,
R is the beam center line (image line) of the vertical probe (2A).

In FIG. 12, the number of vertical probes (2) that come into contact with each surface of the square billet (1) is increased compared to FIG. 1). t and θ2 are the directivity angles of the vertical probe (2).

Fig. 13 shows that, compared to Fig. 12, longitudinal wave angle probes (4) are added to almost both ends of the flat part on each of the four sides of the square billet +1). The center of the ultrasonic beam (4) is directed outward by θO from the perpendicular R, that is, toward the corner of the opposing surface.

Next, the operation will be explained. 1) In figure 1).

Ultrasonic waves incident from the vertical probe (2) into the rectangular billet (1) are reflected by defects such as pipe-shaped defects and nonmetallic inclusions that exist in the sound field, which is the propagation region, and are returned to the vertical probe. The reflected wave is returned to the probe (2) and detected to inspect whether there is a defect. The area where the presence or absence of defects can be inspected by the ultrasonic waves incident from the two vertical probes (2A) that are in contact with the surface A of the square billet +1) is around the time when the influence of the surface echo reflected from the 9th surface A fades ( from side A to 4Q1)
(about 60 fins away) to the opposing point C, and that area is shown by the shaded area. The directivity angle θ1 of the vertical probe (2A) used in this case is quite large, and the spread of the ultrasonic beam incident from the vertical probe (2A) on the 9-plane A side is The corners on both sides of the opposing surfaces C and the inside thereof should be such that they intersect near the center of the square billet (1). Vertical probes placed on other surfaces, 8th, 0th, and 9th (2B) (2C)
(2D) in the same manner at °C, it is possible to form a testable area over almost the entire area in the cross section of the square billet (1).

FIG. 12 is an improved version of FIG. 1) in order to inspect smaller defects. In other words, by selecting a vertical probe (2) whose directivity angle 02 is smaller than 01 and suppressing the spread of the ultrasonic beam, it is possible to detect smaller defects than in Figure 1). It is intended to be used in various ways. In this case, since the flaw detectable area per vertical probe becomes smaller, the number of vertical probes required to be arranged on each surface naturally increases.

FIG. 13 is a further improvement of FIG. 12 in order to also inspect the corners of the square billet (1) for smaller defects. In the probe arrangement shown in Figure 12, a beam with a sharp directional angle is emitted from the horizontal part of the square billet (1) toward the opposite surface, avoiding the corners, for flaw detection. The ultrasonic beam of the arranged vertical probe does not spread to the corner, leaving the corner as an undetected area. In order to compensate for this, by additionally placing longitudinal wave angle probes (4) on both ends of each surface of the square billet tl+, the center direction of the ultrasonic beam is directed outward by θ0 from the perpendicular R. It is designed to obtain high defect detection ability even in corner portions.

In the ultrasonic flaw detection of square billets, from the basic flaw detection device shown in Fig. 1) to the flaw detection equipment shown in Fig. 12 or 13, which has recently become mainstream in attempts to detect even smaller defects.

[Problem that the invention seeks to solve]

With conventional probe placement, there is a large chip in the center of the cross section, which is useful when detecting materials with high ultrasonic scattering attenuation.

The detection area of the vertical probe (2) is square billet (1)
From near the center of r to the surface opposite to the surface where the probe comes in contact with the material, in the case of a specimen with a large defect in the center of the cross section, the region near the opposite surface is obstructed by the large defect. In materials that cannot be detected or have coarse internal structures, the attenuation of ultrasonic waves passing through the center becomes large, making it impossible to detect small defects in areas close to opposing surfaces. Therefore, when trying to detect flaws on such a test material, there is a problem in that the intended flaw detectable area cannot be secured.

This invention was made in order to solve the above-mentioned problems, and is applicable to specimens with a large defect in the center of the cross section, or specimens with a coarse internal structure and large ultrasonic scattering attenuation. The purpose of this invention is to obtain a square billet ultrasonic flaw detection device that can secure the intended flaw detection area.

Another object of the present invention is to obtain a square billet ultrasonic flaw detection device in addition to the above object.

[Means for solving problems]

The square billet ultrasonic flaw detection device according to the present invention is as follows.

The ultrasonic probe is attached to a saddle-shaped guide.C, there are two corners at almost both ends of the flat part on each of the four sides of the square billet, with the center direction of the ultrasonic beam facing 3 to 10 degrees outward from the perpendicular. 1 longitudinal wave angle probe.

A second longitudinal wave angle probe is arranged in which the center direction of the ultrasonic beam is oriented 60° to 90° inward from the perpendicular.

In addition, in the square billet ultrasonic flaw detection device according to another aspect of the present invention, vertical probes are additionally arranged on the flat parts of each of the four sides of the square billet, and the data processing section is further provided with the vertical probes and the first Added a switch to select whether or not to use the flaw detection data obtained from three types of ultrasonic probes: the longitudinal wave angle probe and the second longitudinal wave angle probe. It is something.

[For production]

The square billet ultrasonic flaw detection device in this invention is as follows.

With two types of longitudinal wave angle probes, the cross-sectional direction of the square billet is not affected by the internal structure of the center.
Flaws can be detected over the entire cross section except for the center.

In addition, in another invention of the present invention, by selection using a changeover operation switch, a square billet that should be inspected for flaws while avoiding the center part, and a square billet that is desired to be inspected for flaws in its entire cross section as before without the influence of the center part are mixed as test materials. Almost all square billets can be inspected on the inspection line where they are transported.

〔Example〕

FIG. 1 is a layout diagram of an ultrasonic probe in a square billet ultrasonic flaw detection apparatus showing an embodiment of the present invention.

In the figure, (1) is the square billet that is the material to be tested, (3)
(4) is a saddle type guide plate, and (4) is a first longitudinal wave bevel which is arranged at almost both ends of the flat part on each of the four sides of the square billet (1) so that the center of the ultrasonic beam is directed outward from the perpendicular line. Probe (hereinafter referred to as corner probe).

(5) is a second probe placed at almost the same position as the corner probe so that the center of the ultrasound beam points inward from the perpendicular line.
This is a longitudinal wave angle probe (hereinafter referred to as 1 subepidermal probe).

FIG. 2 is a layout diagram of the ultrasonic probe seen from the A side of the square billet (1).

Figure 3 is a diagram showing the flaw detection area of the corner probe (4A) on the A side of the corner bit 1) 1, where the center of the ultrasonic beam is θ0 outside the perpendicular R, that is, the opposite ml It should face towards the corner of the screen.

FIG. 4 is a diagram showing the flaw detection areas of all four corner probes (4) of the square billet (1).

Figure 5 shows the flaw detection area of only the right probe of the subcutaneous probe (5A) on side A of the square billet (1), and the center of the ultrasonic beam is on the perpendicular line R. It faces inward by θ1.

FIG. 6 is a diagram showing the flaw detection areas of all the subcutaneous probes (5) on the four sides of the square billet (1).

FIG. 7 is a diagram showing the combined flaw detection areas of the corner probe (4) at all degrees centigrade and the subcutaneous probe on the four sides of the square billet (1).

FIG. 8 is a diagram showing the arrangement of ultrasonic probes in a rectangular billet ultrasonic flaw detection device showing another embodiment of the present invention.゛ is additionally placed.

FIG. 9 is a layout diagram of the ultrasonic probe when FIG. 8 is viewed from the Ai side of the square billet (l).

FIG. 10 is a block diagram showing a data processing system of a rectangular billet ultrasonic flaw detection apparatus according to another embodiment of the present invention.

In the figure, (6) is the transmission and reception amplification unit 171 for the vertical probe (2), the transmission and reception amplification unit for the 1-corner probe (4), and (8) is the subepidermal probe (5).
(9) is a data processing unit, α, which collectively processes the data sent from the respective transmitting and receiving amplifying units [61, +7+, +81];
1, the data processing unit (9) uses and processes the data of only the subepidermal probe (5) and the corner probe (4) out of the three types of probes, or A changeover operation switch is used to output a signal for switching between processing using only data from the vertical probe (4) and the vertical probe (2), and (lυ is an output device that outputs and records the results).

Next, the operation of this invention shown in FIG. 1 will be explained. The operation of the corner probe (4) shown in Figure 1 is shown in Figures 3 and 4.
This will be explained with a diagram. In Figure 3, the corner probe (4A
), the center of the ultrasound beam is oriented 5 to 10 degrees outward with respect to the perpendicular R.

The ultrasonic beam can detect flaws in the shaded area without passing through the center of the square billet (1).

The shaded area in FIG. 4 is the combined area that can be detected by all the corner probes. In the detectable area in Figure 4, 8 parts are missing except for the center part.

If a vertical probe is used as in the past to detect defects in part 8, the ultrasonic wave passes through the center and then reaches part 8, so if there is a large defect in the center, it will be blocked by the defect. However, ultrasonic waves cannot sufficiently reach materials with coarse internal structures.

Therefore, in the present invention, a subcutaneous probe (5) as shown in FIG. 5 is used to detect flaws in the 8 parts shown in FIG. 4. In Fig. 5, the subepidermal probe (5A) is oriented so that the center of the ultrasound beam is oriented 60 degrees to 90 degrees inward with respect to the perpendicular R, and the ultrasound beam is directed to the center of the square billet (1). It is possible to perform flaw detection in the shaded area in Figure 0 without passing through the area.The shaded area in Figure 6 is the combined area that can be detected by all subcutaneous probes (5).

Therefore, as shown in FIG. 7, corner probes (4) and subepidermal probes (5) are placed at substantially both ends of the flat portion of each surface of the square billet (1).

It is possible to perform flaw detection on the entire surface other than the center without being affected by the condition of the center.

Next, the operations shown in FIGS. 8 to 10, which are other embodiments of the present invention, will be explained. As shown in Figure 8, the 1st saddle type guide plate (3) has a vertical probe (2), a corner probe +
．． Three types of ultrasound probes are attached: E and subcutaneous probe (5).

The operation of this embodiment is shown in FIG. In the figure, the data obtained from the vertical probe (2) is passed through the vertical probe transmitting and receiving amplifier section (6), and then the data processing section (9).
). Similarly, the data obtained from the corner probe (4) is the transmission and reception amplification section (7) of the corner probe (4).The data obtained from the subcutaneous probe (5) is The transmission and reception amplifier section (8) of the subepidermal probe (5) is inserted into the data processing section (9). At this time, the data processing section (9) operates from the changeover operation switch α1.

Of the three types of probes, use the data of only the subcutaneous probe (5) and the corner probe (4) to perform flaw detection while avoiding the center of the billet, or use the corner probe The data processing unit (9) receives a switching signal indicating whether to perform full-surface flaw detection, which is a conventional flaw detection method using only the data from the vertical probe (4) and the vertical probe (2). Reception amplification H+61. +71. (The data from 81 is used for processing, and the results are output to the output device aυ.

As shown above, by using three types of probes: 1 subcutaneous probe (5-inch, corner probe (4), and vertical probe (2))9, full-surface flaw detection is usually possible. If you want to detect defects while avoiding the center of the material.

By switching operation, flaw detection can be performed while avoiding the influence of the center part.

In the above embodiment, a corner probe (4) and a subcutaneous probe (5) are placed at both ends of each surface of the square billet (1).
), but a plurality of corner probes (4) or subepidermal probes (5) may be used.

Furthermore, it is also possible to perform flaw detection at corners or under the epidermis.Also, the position of the subcutaneous probe (5) attached to the saddle-shaped guide plate (3) should be at the edge of each surface. (Depending on the number of subcutaneous probes (5) arranged and the size of the refraction angle θ1 of the subcutaneous probes (5),
It is also conceivable to arrange the subepidermal probe (5) not at the end of each surface but inside. In addition, as a method of selectively using three types of probes using a switching signal, only the 0 subepidermal probe (5) is used or not.

Although it is conceivable that the other two types of probes are always used, similar results can be expected with both of them, so the application of the present invention is inevitable.

〔Effect of the invention〕

As explained in above 1, this invention arranges the ultrasonic probe in the corner billet flaw detection device so that the center of the ultrasonic beam is directed outward from the perpendicular line near the edge of the flat part of each corner and billet surface. By attaching the first longitudinal wave angle probe and the second longitudinal wave angle probe with the center of the ultrasound beam facing inward from the perpendicular line, a thick T defect is created in the center. There is. Alternatively, when testing a T-angle billet with a coarse internal structure, it is possible to detect almost the entire area other than the center without being affected by the center.

Another invention of the present invention is to additionally arrange vertical probes on the flat portions of each side of the square billet, and add a switching operation switch to instruct the use of the data of the three types of probes. Therefore, when performing normal full cross-section flaw detection, the flaw detection is performed using a vertical probe and a first longitudinal wave angle probe with the center of the ultrasonic beam facing outward from the perpendicular line. If you have a square billet that has defects or a coarsened internal structure and you want to inspect it except for the center.

Flaw detection is performed using a first longitudinal wave angle probe with the center of the ultrasonic beam facing outward from the perpendicular line and a second longitudinal wave angle probe with the center of the ultrasonic beam facing inward from the perpendicular line. As you do,
It can be used depending on the material to be inspected, and as a result, it has the effect of being able to detect flaws on most square billets.

[Brief explanation of drawings]

Fig. 1 is a cross-sectional layout diagram showing the arrangement of ultrasonic probes in the cross-sectional direction in a square billet flaw detection device showing an embodiment of the present invention, and Fig. 2 is a cross-sectional layout diagram showing the arrangement of the ultrasonic probes in the longitudinal direction of the square billet. FIGS. 3 to 7 are conceptual diagrams of the ultrasonic beam of an ultrasonic probe in an actual example of the present invention, and FIG. 8 is a square billet flaw detection device showing another embodiment of the present invention. 9 is a top view showing the arrangement of the ultrasound probes in the longitudinal direction in FIG. 8, and FIG. 10 is a data processing system. The block diagrams, Fig. 1), Fig. 12, and Fig. 13 are conceptual diagrams of the arrangement of ultrasonic probes and ultrasonic beams in a conventional square billet flaw detection device. In the figure, (1) is a square billet, and t2+ is a vertical probe. (3) is a saddle type guide plate, (4) is the first longitudinal wave angle probe,
(5) is the second longitudinal wave angle probe, (6) is the transmission and reception amplifier for the vertical probe, and (7) is the first longitudinal wave angle probe (4). Transmission and reception amplification section, (8) is transmission and reception amplification section for the second longitudinal wave angle probe (5), (9)
is a data processing unit, α1 is a changeover operation switch, and Uυ is an output device. Note that the same reference numerals in each figure indicate the same or corresponding parts.

Claims (2)

[Claims] (1) In a square billet flaw detection device that detects flaws by contacting the four sides of a square billet with an ultrasonic probe, the center of the ultrasonic beam is directed outward from the perpendicular line near both ends of the flat part of each of the four sides of the square billet. A rectangular billet ultrasonic device characterized in that a first longitudinal wave angle probe is arranged as shown in FIG. Sonic flaw detection equipment. (2) In a square billet flaw detection device that detects flaws by contacting the four sides of a square billet with an ultrasonic probe, a vertical probe is placed on the flat part of each of the four sides of the square billet, and a vertical probe is placed at both ends of the flat part of each of the four sides of the square billet. Nearby are a first longitudinal wave angle probe with the center of the ultrasound beam facing outward from the perpendicular line, and a second longitudinal wave angle probe with the center of the ultrasound beam facing inward from the perpendicular line. An angular probe is arranged, and flaw detection data obtained from three types of ultrasonic probes, the vertical probe, the first longitudinal wave angle probe, and the second longitudinal wave angle probe, is A rectangular billet ultrasonic flaw detection device characterized by comprising a changeover operation switch for inputting and selecting whether or not to use each of them.