JPS63296217A - 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造 - Google Patents
両面露光型マスクアライナのウエハ−吸着方法とその吸着構造Info
- Publication number
- JPS63296217A JPS63296217A JP61246249A JP24624986A JPS63296217A JP S63296217 A JPS63296217 A JP S63296217A JP 61246249 A JP61246249 A JP 61246249A JP 24624986 A JP24624986 A JP 24624986A JP S63296217 A JPS63296217 A JP S63296217A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- mask
- exposure
- exposure mask
- suction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims abstract description 10
- 238000001179 sorption measurement Methods 0.000 claims description 6
- 230000006837 decompression Effects 0.000 claims description 5
- 101100269850 Caenorhabditis elegans mask-1 gene Proteins 0.000 abstract 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 74
- 239000010453 quartz Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 238000009423 ventilation Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000002040 relaxant effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61246249A JPS63296217A (ja) | 1986-10-16 | 1986-10-16 | 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61246249A JPS63296217A (ja) | 1986-10-16 | 1986-10-16 | 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63296217A true JPS63296217A (ja) | 1988-12-02 |
| JPH0533808B2 JPH0533808B2 (enrdf_load_stackoverflow) | 1993-05-20 |
Family
ID=17145718
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61246249A Granted JPS63296217A (ja) | 1986-10-16 | 1986-10-16 | 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63296217A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009194147A (ja) * | 2008-02-14 | 2009-08-27 | Seiko Instruments Inc | ウエハ露光装置及びウエハ露光方法 |
| JP2010182997A (ja) * | 2009-02-09 | 2010-08-19 | Seiko Instruments Inc | ウエハ露光装置及びウエハ露光方法 |
-
1986
- 1986-10-16 JP JP61246249A patent/JPS63296217A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009194147A (ja) * | 2008-02-14 | 2009-08-27 | Seiko Instruments Inc | ウエハ露光装置及びウエハ露光方法 |
| JP2010182997A (ja) * | 2009-02-09 | 2010-08-19 | Seiko Instruments Inc | ウエハ露光装置及びウエハ露光方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0533808B2 (enrdf_load_stackoverflow) | 1993-05-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20100133735A1 (en) | Substrate holding apparatus, substrate holding method, exposure apparatus, and device manufacturing method | |
| JP2008103703A (ja) | 基板保持装置、該基板保持装置を備える露光装置、およびデバイス製造方法 | |
| US5160959A (en) | Device and method for the alignment of masks | |
| JPH11312635A (ja) | コンタクト露光方法 | |
| CN211123620U (zh) | 光刻机 | |
| JP2003051535A (ja) | 基板保持装置、露光装置およびデバイス製造方法 | |
| JP4052826B2 (ja) | マスクと露光対象基板との搬送に兼用できる搬送アーム及びそれを備えた露光装置 | |
| JPH09180990A (ja) | 画像形成用露光装置とワーク位置決め方法 | |
| JP4420507B2 (ja) | 基板露光方法および装置 | |
| JPS63296217A (ja) | 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造 | |
| JP4621136B2 (ja) | 露光装置 | |
| JPS63141342A (ja) | 半導体ウエハ処理方法及びその装置 | |
| JP5434549B2 (ja) | 露光装置及び露光方法 | |
| CA1070855A (en) | Mask for optical exposure | |
| JP2509134B2 (ja) | プリント配線基板の露光方法及び装置 | |
| JPS60189745A (ja) | 密着露光方法 | |
| JP2007036101A (ja) | 露光機のワークステージ及び露光方法 | |
| KR100205199B1 (ko) | 필름마스크를 이용한 노광방법 및 장치 | |
| US20030007139A1 (en) | Aligner | |
| JP4195321B2 (ja) | 露光装置の運転方法 | |
| JP2850061B2 (ja) | 基板露光装置 | |
| JP2676278B2 (ja) | ガラス基板露光装置におけるギャップ制御方法 | |
| JP2000299546A (ja) | 真空吸着機構および露光装置ならびに露光方法 | |
| JP2004085778A (ja) | 密着露光方法および密着露光装置 | |
| JPH04158511A (ja) | 熱処理装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |