JPS63296217A - 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造 - Google Patents

両面露光型マスクアライナのウエハ−吸着方法とその吸着構造

Info

Publication number
JPS63296217A
JPS63296217A JP61246249A JP24624986A JPS63296217A JP S63296217 A JPS63296217 A JP S63296217A JP 61246249 A JP61246249 A JP 61246249A JP 24624986 A JP24624986 A JP 24624986A JP S63296217 A JPS63296217 A JP S63296217A
Authority
JP
Japan
Prior art keywords
wafer
mask
exposure
exposure mask
suction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61246249A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0533808B2 (enrdf_load_stackoverflow
Inventor
Takeshi Murai
剛 村井
Toshinori Konaka
敏典 小中
Noboru Kawahara
川原 昇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
M SETETSUKU KK
Original Assignee
M SETETSUKU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by M SETETSUKU KK filed Critical M SETETSUKU KK
Priority to JP61246249A priority Critical patent/JPS63296217A/ja
Publication of JPS63296217A publication Critical patent/JPS63296217A/ja
Publication of JPH0533808B2 publication Critical patent/JPH0533808B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70425Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP61246249A 1986-10-16 1986-10-16 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造 Granted JPS63296217A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61246249A JPS63296217A (ja) 1986-10-16 1986-10-16 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61246249A JPS63296217A (ja) 1986-10-16 1986-10-16 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造

Publications (2)

Publication Number Publication Date
JPS63296217A true JPS63296217A (ja) 1988-12-02
JPH0533808B2 JPH0533808B2 (enrdf_load_stackoverflow) 1993-05-20

Family

ID=17145718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61246249A Granted JPS63296217A (ja) 1986-10-16 1986-10-16 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造

Country Status (1)

Country Link
JP (1) JPS63296217A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009194147A (ja) * 2008-02-14 2009-08-27 Seiko Instruments Inc ウエハ露光装置及びウエハ露光方法
JP2010182997A (ja) * 2009-02-09 2010-08-19 Seiko Instruments Inc ウエハ露光装置及びウエハ露光方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009194147A (ja) * 2008-02-14 2009-08-27 Seiko Instruments Inc ウエハ露光装置及びウエハ露光方法
JP2010182997A (ja) * 2009-02-09 2010-08-19 Seiko Instruments Inc ウエハ露光装置及びウエハ露光方法

Also Published As

Publication number Publication date
JPH0533808B2 (enrdf_load_stackoverflow) 1993-05-20

Similar Documents

Publication Publication Date Title
JP2010129929A (ja) 基板保持装置、基板保持方法、露光装置およびデバイス製造方法
JP2008103703A (ja) 基板保持装置、該基板保持装置を備える露光装置、およびデバイス製造方法
JP3940823B2 (ja) ステージ装置及びその制御方法
US5160959A (en) Device and method for the alignment of masks
US20070125491A1 (en) Method of removing particle on substrate, apparatus therefor, and coating and development apparatus
CN211123620U (zh) 光刻机
JPH11312635A (ja) コンタクト露光方法
JP4052826B2 (ja) マスクと露光対象基板との搬送に兼用できる搬送アーム及びそれを備えた露光装置
JPH09180990A (ja) 画像形成用露光装置とワーク位置決め方法
JP4420507B2 (ja) 基板露光方法および装置
JPS63296217A (ja) 両面露光型マスクアライナのウエハ−吸着方法とその吸着構造
JPS63141342A (ja) 半導体ウエハ処理方法及びその装置
JP5434549B2 (ja) 露光装置及び露光方法
CA1070855A (en) Mask for optical exposure
JP2509134B2 (ja) プリント配線基板の露光方法及び装置
JPS60189745A (ja) 密着露光方法
JP2007036101A (ja) 露光機のワークステージ及び露光方法
JPH08279336A (ja) 露光方法及び露光装置
KR100205199B1 (ko) 필름마스크를 이용한 노광방법 및 장치
JP2003021909A (ja) 露光装置
JP4195321B2 (ja) 露光装置の運転方法
JP2850061B2 (ja) 基板露光装置
JP2676278B2 (ja) ガラス基板露光装置におけるギャップ制御方法
JP2000299546A (ja) 真空吸着機構および露光装置ならびに露光方法
JP2004085778A (ja) 密着露光方法および密着露光装置

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term