JPS63284405A - 走査電子顕微鏡 - Google Patents

走査電子顕微鏡

Info

Publication number
JPS63284405A
JPS63284405A JP62118756A JP11875687A JPS63284405A JP S63284405 A JPS63284405 A JP S63284405A JP 62118756 A JP62118756 A JP 62118756A JP 11875687 A JP11875687 A JP 11875687A JP S63284405 A JPS63284405 A JP S63284405A
Authority
JP
Japan
Prior art keywords
sample
image
scanning
inclination
straight line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62118756A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0587764B2 (cs
Inventor
Hiroyoshi Mori
森　弘義
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62118756A priority Critical patent/JPS63284405A/ja
Publication of JPS63284405A publication Critical patent/JPS63284405A/ja
Publication of JPH0587764B2 publication Critical patent/JPH0587764B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP62118756A 1987-05-18 1987-05-18 走査電子顕微鏡 Granted JPS63284405A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62118756A JPS63284405A (ja) 1987-05-18 1987-05-18 走査電子顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62118756A JPS63284405A (ja) 1987-05-18 1987-05-18 走査電子顕微鏡

Publications (2)

Publication Number Publication Date
JPS63284405A true JPS63284405A (ja) 1988-11-21
JPH0587764B2 JPH0587764B2 (cs) 1993-12-17

Family

ID=14744278

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62118756A Granted JPS63284405A (ja) 1987-05-18 1987-05-18 走査電子顕微鏡

Country Status (1)

Country Link
JP (1) JPS63284405A (cs)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0325844A (ja) * 1989-06-22 1991-02-04 Hitachi Ltd 微小寸法測定方法および装置
JP2002323311A (ja) * 2001-04-27 2002-11-08 Seiko Instruments Inc 荷電粒子ビーム装置による表面凹凸形状の観察方法
JP2013105603A (ja) * 2011-11-11 2013-05-30 Hitachi High-Technologies Corp 荷電粒子線装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5011761A (cs) * 1973-06-04 1975-02-06
JPS53117463A (en) * 1977-03-23 1978-10-13 Fujitsu Ltd Position detection method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5011761A (cs) * 1973-06-04 1975-02-06
JPS53117463A (en) * 1977-03-23 1978-10-13 Fujitsu Ltd Position detection method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0325844A (ja) * 1989-06-22 1991-02-04 Hitachi Ltd 微小寸法測定方法および装置
JP2002323311A (ja) * 2001-04-27 2002-11-08 Seiko Instruments Inc 荷電粒子ビーム装置による表面凹凸形状の観察方法
JP2013105603A (ja) * 2011-11-11 2013-05-30 Hitachi High-Technologies Corp 荷電粒子線装置

Also Published As

Publication number Publication date
JPH0587764B2 (cs) 1993-12-17

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Legal Events

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