JPS6327317B2 - - Google Patents
Info
- Publication number
- JPS6327317B2 JPS6327317B2 JP12469883A JP12469883A JPS6327317B2 JP S6327317 B2 JPS6327317 B2 JP S6327317B2 JP 12469883 A JP12469883 A JP 12469883A JP 12469883 A JP12469883 A JP 12469883A JP S6327317 B2 JPS6327317 B2 JP S6327317B2
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- alxga
- gaas
- crystal
- crystals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 claims description 60
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 5
- 150000001495 arsenic compounds Chemical class 0.000 claims description 5
- 229910052733 gallium Inorganic materials 0.000 claims description 5
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 22
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 20
- 239000004065 semiconductor Substances 0.000 description 16
- 239000000758 substrate Substances 0.000 description 15
- 238000000034 method Methods 0.000 description 8
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 6
- 150000001875 compounds Chemical class 0.000 description 6
- 239000000203 mixture Substances 0.000 description 5
- 238000002109 crystal growth method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000002128 reflection high energy electron diffraction Methods 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- -1 GaAs compound Chemical class 0.000 description 1
- FTWRSWRBSVXQPI-UHFFFAOYSA-N alumanylidynearsane;gallanylidynearsane Chemical class [As]#[Al].[As]#[Ga] FTWRSWRBSVXQPI-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 238000002484 cyclic voltammetry Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12469883A JPS6016897A (ja) | 1983-07-11 | 1983-07-11 | 分子線結晶成長方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12469883A JPS6016897A (ja) | 1983-07-11 | 1983-07-11 | 分子線結晶成長方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6016897A JPS6016897A (ja) | 1985-01-28 |
JPS6327317B2 true JPS6327317B2 (enrdf_load_html_response) | 1988-06-02 |
Family
ID=14891877
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12469883A Granted JPS6016897A (ja) | 1983-07-11 | 1983-07-11 | 分子線結晶成長方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6016897A (enrdf_load_html_response) |
-
1983
- 1983-07-11 JP JP12469883A patent/JPS6016897A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6016897A (ja) | 1985-01-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3330218B2 (ja) | 半導体装置の製造方法,及び半導体装置 | |
US5659188A (en) | Capped anneal | |
JP3093904B2 (ja) | 化合物半導体結晶の成長方法 | |
US5834362A (en) | Method of making a device having a heteroepitaxial substrate | |
JPH0484418A (ja) | 異種基板上への3―v族化合物半導体のヘテロエピタキシャル成長法 | |
JPS63169717A (ja) | 半導体素子 | |
EP0442414A2 (en) | Compound semiconductor substrate and method of manufacturing the same | |
US4421576A (en) | Method for forming an epitaxial compound semiconductor layer on a semi-insulating substrate | |
JP3326704B2 (ja) | Iii/v系化合物半導体装置の製造方法 | |
Wang et al. | Optical and electrical properties of InP/InGaAs grown selectively on SiO2‐masked InP | |
US4939102A (en) | Method of growing III-V semiconductor layers with high effective hole concentration | |
JPH05259077A (ja) | 半導体装置及びその製造方法 | |
US6188090B1 (en) | Semiconductor device having a heteroepitaxial substrate | |
JP3438116B2 (ja) | 化合物半導体装置及びその製造方法 | |
JPS6327317B2 (enrdf_load_html_response) | ||
CN1092839C (zh) | 半导体衬底的制备方法 | |
JPH02295127A (ja) | 半導体装置の製造方法およびヘテロ接合バイポーラトランジスタ | |
US6036769A (en) | Preparation of semiconductor substrates | |
JPH05335346A (ja) | 半導体装置及びその製造方法 | |
JP3670130B2 (ja) | Iii−v族化合物半導体装置の製造方法 | |
JP3416051B2 (ja) | Iii−v族化合物半導体装置の製造方法 | |
JPH06333832A (ja) | 化合物半導体薄膜の製造方法 | |
JP2897107B2 (ja) | 結晶成長方法 | |
JPH01161822A (ja) | 素子およびその製造法 | |
JPH02306668A (ja) | 量子細線を有する半導体装置及びその製造方法 |