JPS6326508A - 実装部品検査装置 - Google Patents
実装部品検査装置Info
- Publication number
- JPS6326508A JPS6326508A JP61169033A JP16903386A JPS6326508A JP S6326508 A JPS6326508 A JP S6326508A JP 61169033 A JP61169033 A JP 61169033A JP 16903386 A JP16903386 A JP 16903386A JP S6326508 A JPS6326508 A JP S6326508A
- Authority
- JP
- Japan
- Prior art keywords
- light
- height
- data
- brightness
- component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 title claims description 14
- 238000004806 packaging method and process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 claims abstract description 8
- 238000001514 detection method Methods 0.000 claims description 14
- 230000001678 irradiating effect Effects 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 8
- 238000000034 method Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 230000003287 optical effect Effects 0.000 description 3
- 238000011179 visual inspection Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 101100008044 Caenorhabditis elegans cut-1 gene Proteins 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
Landscapes
- Supply And Installment Of Electrical Components (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61169033A JPS6326508A (ja) | 1986-07-19 | 1986-07-19 | 実装部品検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61169033A JPS6326508A (ja) | 1986-07-19 | 1986-07-19 | 実装部品検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6326508A true JPS6326508A (ja) | 1988-02-04 |
| JPH0367567B2 JPH0367567B2 (ko) | 1991-10-23 |
Family
ID=15879073
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61169033A Granted JPS6326508A (ja) | 1986-07-19 | 1986-07-19 | 実装部品検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6326508A (ko) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005335712A (ja) * | 2004-05-24 | 2005-12-08 | Chuoh Pack Industry Co Ltd | ワイヤレス段ボールケース |
| JP2007317972A (ja) * | 2006-05-29 | 2007-12-06 | Hitachi High-Technologies Corp | 電子部品の貼付状態検査装置 |
| CN103471511A (zh) * | 2013-09-23 | 2013-12-25 | 马晓璐 | 一种包裹尺寸测量仪 |
| US11777228B2 (en) * | 2019-12-09 | 2023-10-03 | Nxp Usa, Inc. | Multi-polarized antenna array |
-
1986
- 1986-07-19 JP JP61169033A patent/JPS6326508A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005335712A (ja) * | 2004-05-24 | 2005-12-08 | Chuoh Pack Industry Co Ltd | ワイヤレス段ボールケース |
| JP2007317972A (ja) * | 2006-05-29 | 2007-12-06 | Hitachi High-Technologies Corp | 電子部品の貼付状態検査装置 |
| CN103471511A (zh) * | 2013-09-23 | 2013-12-25 | 马晓璐 | 一种包裹尺寸测量仪 |
| US11777228B2 (en) * | 2019-12-09 | 2023-10-03 | Nxp Usa, Inc. | Multi-polarized antenna array |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0367567B2 (ko) | 1991-10-23 |
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