JPS6321344B2 - - Google Patents

Info

Publication number
JPS6321344B2
JPS6321344B2 JP58103341A JP10334183A JPS6321344B2 JP S6321344 B2 JPS6321344 B2 JP S6321344B2 JP 58103341 A JP58103341 A JP 58103341A JP 10334183 A JP10334183 A JP 10334183A JP S6321344 B2 JPS6321344 B2 JP S6321344B2
Authority
JP
Japan
Prior art keywords
measurement
items
tester
data
product lot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58103341A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59228729A (ja
Inventor
Katsuaki Utena
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP58103341A priority Critical patent/JPS59228729A/ja
Publication of JPS59228729A publication Critical patent/JPS59228729A/ja
Publication of JPS6321344B2 publication Critical patent/JPS6321344B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP58103341A 1983-06-09 1983-06-09 半導体測定装置 Granted JPS59228729A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58103341A JPS59228729A (ja) 1983-06-09 1983-06-09 半導体測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58103341A JPS59228729A (ja) 1983-06-09 1983-06-09 半導体測定装置

Publications (2)

Publication Number Publication Date
JPS59228729A JPS59228729A (ja) 1984-12-22
JPS6321344B2 true JPS6321344B2 (enrdf_load_stackoverflow) 1988-05-06

Family

ID=14351437

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58103341A Granted JPS59228729A (ja) 1983-06-09 1983-06-09 半導体測定装置

Country Status (1)

Country Link
JP (1) JPS59228729A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01197674A (ja) * 1988-02-03 1989-08-09 Mitsubishi Electric Corp 物品検査方法
JPH04143676A (ja) * 1990-10-04 1992-05-18 Nec Corp 電子部品測定システム
JP4867014B2 (ja) * 2007-07-25 2012-02-01 富士通株式会社 試験方法及び装置
JP7206574B2 (ja) * 2018-03-01 2023-01-18 株式会社東京精密 測定プログラムの管理方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593371A (ja) * 1982-06-30 1984-01-10 Nec Corp 半導体装置の試験装置

Also Published As

Publication number Publication date
JPS59228729A (ja) 1984-12-22

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