JPS6319899B2 - - Google Patents

Info

Publication number
JPS6319899B2
JPS6319899B2 JP55166092A JP16609280A JPS6319899B2 JP S6319899 B2 JPS6319899 B2 JP S6319899B2 JP 55166092 A JP55166092 A JP 55166092A JP 16609280 A JP16609280 A JP 16609280A JP S6319899 B2 JPS6319899 B2 JP S6319899B2
Authority
JP
Japan
Prior art keywords
speed
section
read
pattern
ram
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55166092A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5789156A (en
Inventor
Kaoru Mihashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP55166092A priority Critical patent/JPS5789156A/ja
Publication of JPS5789156A publication Critical patent/JPS5789156A/ja
Publication of JPS6319899B2 publication Critical patent/JPS6319899B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP55166092A 1980-11-25 1980-11-25 Pattern generation collating device Granted JPS5789156A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55166092A JPS5789156A (en) 1980-11-25 1980-11-25 Pattern generation collating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55166092A JPS5789156A (en) 1980-11-25 1980-11-25 Pattern generation collating device

Publications (2)

Publication Number Publication Date
JPS5789156A JPS5789156A (en) 1982-06-03
JPS6319899B2 true JPS6319899B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-04-25

Family

ID=15824841

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55166092A Granted JPS5789156A (en) 1980-11-25 1980-11-25 Pattern generation collating device

Country Status (1)

Country Link
JP (1) JPS5789156A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5245653B2 (ja) * 2008-09-01 2013-07-24 富士通セミコンダクター株式会社 半導体集積回路装置

Also Published As

Publication number Publication date
JPS5789156A (en) 1982-06-03

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