JPS63193375U - - Google Patents
Info
- Publication number
- JPS63193375U JPS63193375U JP3473987U JP3473987U JPS63193375U JP S63193375 U JPS63193375 U JP S63193375U JP 3473987 U JP3473987 U JP 3473987U JP 3473987 U JP3473987 U JP 3473987U JP S63193375 U JPS63193375 U JP S63193375U
- Authority
- JP
- Japan
- Prior art keywords
- test chamber
- open
- temperature characteristic
- dew
- open part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009423 ventilation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
図面は本考案の一実施例を示すもので、第1図
はその断面略図、第2図はそのブロツク図である
。
図中、2:試験室、4:エアーカーテン、9:
第1エアーノズル、10:第2エアーノズル、1
1:第1エアーシンク、12:第2エアーシンク
。
The drawings show one embodiment of the present invention; FIG. 1 is a schematic cross-sectional view thereof, and FIG. 2 is a block diagram thereof. In the figure, 2: Test room, 4: Air curtain, 9:
First air nozzle, 10: Second air nozzle, 1
1: 1st air sink, 12: 2nd air sink.
補正 昭63.7.22
図面の簡単な説明を次のように補正する。
明細書第10頁第10行「ブロツク図」と「で
ある」の間に以下の文書を挿入します。
「、第3図はスリツトカーテンの一部省略平面
図」Amendment July 22, 1983 The brief description of the drawing is amended as follows. Insert the following document between "block diagram" and "is" on page 10 of the specification, line 10. ``Figure 3 is a partially omitted plan view of the slit curtain.''
Claims (1)
で移動自在の筐体と、その一部を開放部とする試
験室と、前記試験室の開放部を縦断し、強制通気
手段及び温度昇降手段と連通するエアーカーテン
と、前記試験室の上部に設けた防露ヒーターと、
前記開放部に懸垂したスリツトカーテンを含んで
いることを特徴とする温度特性試験槽。 In a temperature characteristic testing device for electronic equipment, a small and movable casing, a test chamber with a part of the open part, and a forced ventilation means and a temperature raising/lowering means connected vertically through the open part of the test chamber. a dew-proof heater installed in the upper part of the test chamber;
A temperature characteristic test chamber comprising a slit curtain suspended in the open portion.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3473987U JPS63193375U (en) | 1987-03-10 | 1987-03-10 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3473987U JPS63193375U (en) | 1987-03-10 | 1987-03-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63193375U true JPS63193375U (en) | 1988-12-13 |
Family
ID=30843577
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3473987U Pending JPS63193375U (en) | 1987-03-10 | 1987-03-10 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63193375U (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54143668A (en) * | 1978-04-28 | 1979-11-09 | Toshiba Corp | Continuous environment testing apparatus |
-
1987
- 1987-03-10 JP JP3473987U patent/JPS63193375U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54143668A (en) * | 1978-04-28 | 1979-11-09 | Toshiba Corp | Continuous environment testing apparatus |