JPS63145186U - - Google Patents
Info
- Publication number
- JPS63145186U JPS63145186U JP3768587U JP3768587U JPS63145186U JP S63145186 U JPS63145186 U JP S63145186U JP 3768587 U JP3768587 U JP 3768587U JP 3768587 U JP3768587 U JP 3768587U JP S63145186 U JPS63145186 U JP S63145186U
- Authority
- JP
- Japan
- Prior art keywords
- test chamber
- temperature
- open
- dew
- open part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009423 ventilation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
図面は本考案の一実施例を示すもので、第１図
はその断面略図、第２図はそのブロツク図、第３
図はスリツトカーテンの部分省略平面図、第４図
は第１図の一部の拡大図である。
図中、２：試験室、４：エアーカーテン、９：
第１エアーノズル、１０：第２エアーノズル、１
１：第１エアーシンク、１２：第２エアーシンク
、３０：シエルフプレート。
The drawings show one embodiment of the present invention; Fig. 1 is a schematic sectional view thereof, Fig. 2 is a block diagram thereof, and Fig. 3 is a schematic cross-sectional view thereof.
The figure is a partially omitted plan view of the slit curtain, and FIG. 4 is an enlarged view of a portion of FIG. 1. In the figure, 2: Test room, 4: Air curtain, 9:
First air nozzle, 10: Second air nozzle, 1
1: 1st air sink, 12: 2nd air sink, 30: Shelf plate.
Claims (1)
で移動自在の筐体と、その一部を開放部とする試
験室と、前記試験室の開放部を縦断し、強制通気
手段及び温度昇降手段と連通するエアーカーテン
と、前記試験室の上部に設けた防露ヒーターと、
前記開放部の外側に張り出したシエルフプレート
を含んでいることを特徴とする温度試験槽。 In a temperature characteristic testing device for electronic equipment, a small and movable casing, a test chamber with a part of the open part, and a forced ventilation means and a temperature raising/lowering means connected vertically through the open part of the test chamber. a dew-proof heater installed in the upper part of the test chamber;
A temperature test chamber comprising a shelf plate projecting outside the open portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3768587U JPS63145186U (en) | 1987-03-15 | 1987-03-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3768587U JPS63145186U (en) | 1987-03-15 | 1987-03-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63145186U true JPS63145186U (en) | 1988-09-26 |
Family
ID=30849235
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3768587U Pending JPS63145186U (en) | 1987-03-15 | 1987-03-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63145186U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6039981B2 (en) * | 1977-07-05 | 1985-09-09 | 台糖株式会社 | Continuous quantitative analysis method and device |
| JPS6221083A (en) * | 1985-07-19 | 1987-01-29 | Takamisawa Saibaneteitsukusu:Kk | Tester for temperature characteristics of electronic machinery |
-
1987
- 1987-03-15 JP JP3768587U patent/JPS63145186U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6039981B2 (en) * | 1977-07-05 | 1985-09-09 | 台糖株式会社 | Continuous quantitative analysis method and device |
| JPS6221083A (en) * | 1985-07-19 | 1987-01-29 | Takamisawa Saibaneteitsukusu:Kk | Tester for temperature characteristics of electronic machinery |