JPS63145187U - - Google Patents

Info

Publication number
JPS63145187U
JPS63145187U JP3768687U JP3768687U JPS63145187U JP S63145187 U JPS63145187 U JP S63145187U JP 3768687 U JP3768687 U JP 3768687U JP 3768687 U JP3768687 U JP 3768687U JP S63145187 U JPS63145187 U JP S63145187U
Authority
JP
Japan
Prior art keywords
test chamber
temperature
open
slit curtain
small
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3768687U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3768687U priority Critical patent/JPS63145187U/ja
Publication of JPS63145187U publication Critical patent/JPS63145187U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本考案の一実施例を示すもので、第1図
はその断面略図、第2図はそのブロツク図、第3
図aはスリツトカーテンの平面図、第3図bはそ
の側面図である。 図中、2:試験室、4:エアーカーテン、9:
第1エアーノズル、10:第2エアーノズル、1
1:第1エアーシンク、12:第2エアーシンク
、28:スリツトカーテン。
The drawings show one embodiment of the present invention; Fig. 1 is a schematic sectional view thereof, Fig. 2 is a block diagram thereof, and Fig. 3 is a schematic cross-sectional view thereof.
Figure a is a plan view of the slit curtain, and Figure 3b is a side view thereof. In the figure, 2: Test room, 4: Air curtain, 9:
First air nozzle, 10: Second air nozzle, 1
1: First air sink, 12: Second air sink, 28: Slit curtain.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子機器類の温度特性試験装置において、小型
で移動自在の筐体と、その一部を開放部とする試
験室と、前記試験室の開放部を縦断し、強制通気
手段及び温度昇降手段と連通するエアーカーテン
と、前記試験室の上部に設けた防露ヒーターと、
前記開放部に懸垂され、多数の貫通する小孔を有
するスリツトカーテンと、前記スリツトカーテン
の下端に取り付けられたウエイトバーを含んでい
ることを特徴とする温度試験槽。
In a temperature characteristic testing device for electronic equipment, a small and movable casing, a test chamber with a part of the open part, and a forced ventilation means and a temperature raising/lowering means connected vertically through the open part of the test chamber. a dew-proof heater installed in the upper part of the test chamber;
A temperature test chamber comprising: a slit curtain suspended in the open portion and having a large number of small holes passing through it; and a weight bar attached to the lower end of the slit curtain.
JP3768687U 1987-03-15 1987-03-15 Pending JPS63145187U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3768687U JPS63145187U (en) 1987-03-15 1987-03-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3768687U JPS63145187U (en) 1987-03-15 1987-03-15

Publications (1)

Publication Number Publication Date
JPS63145187U true JPS63145187U (en) 1988-09-26

Family

ID=30849237

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3768687U Pending JPS63145187U (en) 1987-03-15 1987-03-15

Country Status (1)

Country Link
JP (1) JPS63145187U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54143668A (en) * 1978-04-28 1979-11-09 Toshiba Corp Continuous environment testing apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54143668A (en) * 1978-04-28 1979-11-09 Toshiba Corp Continuous environment testing apparatus

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