JPS63142772U - - Google Patents
Info
- Publication number
- JPS63142772U JPS63142772U JP3474187U JP3474187U JPS63142772U JP S63142772 U JPS63142772 U JP S63142772U JP 3474187 U JP3474187 U JP 3474187U JP 3474187 U JP3474187 U JP 3474187U JP S63142772 U JPS63142772 U JP S63142772U
- Authority
- JP
- Japan
- Prior art keywords
- test chamber
- temperature characteristic
- open part
- small
- dew
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009423 ventilation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
図面は本考案の一実施例を示すもので、第１図
はその断面略図、第２図はそのブロツク図である
。
図中、２：試験室、４：エアーカーテン、９：
第１エアーノズル、１０：第２エアーノズル、１
１：第１エアーシンク、１２：第２エアーシンク
。
The drawings show one embodiment of the present invention; FIG. 1 is a schematic cross-sectional view thereof, and FIG. 2 is a block diagram thereof. In the figure, 2: Test room, 4: Air curtain, 9:
First air nozzle, 10: Second air nozzle, 1
1: 1st air sink, 12: 2nd air sink.
補正 昭６２．６．１５
図面の簡単な説明を次のように補正する。
明細書第１１頁第１行「ブロツク図」と「であ
る」の間に以下の文字を挿入します。
「、第３図はスリツトカーテンの一部省略平面
図」Amendment June 15, 1982 The brief description of the drawing is amended as follows. Insert the following characters between "block diagram" and "is" in the first line of page 11 of the specification. ``Figure 3 is a partially omitted plan view of the slit curtain.''
Claims (1)
で移動自在の筐体と、その一部を開放部とする試
験室と、前記試験室の開放部を縦断し、強制通気
手段及び温度昇降手段と連通するエアーカーテン
と、前記試験室の上部に設けた防露ヒーターと、
前記開放部に懸垂され、多数の貫通する小孔を有
するスリツトカーテンを含んでいることを特徴と
する温度特性試験槽。 In a temperature characteristic testing device for electronic equipment, a small and movable casing, a test chamber with a part of the open part, and a forced ventilation means and a temperature raising/lowering means connected vertically through the open part of the test chamber. a dew-proof heater installed in the upper part of the test chamber;
A temperature characteristic test chamber comprising a slit curtain suspended in the opening and having a large number of small holes passing through it.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3474187U JPS63142772U (en) | 1987-03-10 | 1987-03-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3474187U JPS63142772U (en) | 1987-03-10 | 1987-03-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63142772U true JPS63142772U (en) | 1988-09-20 |
Family
ID=30843580
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3474187U Pending JPS63142772U (en) | 1987-03-10 | 1987-03-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63142772U (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54143668A (en) * | 1978-04-28 | 1979-11-09 | Toshiba Corp | Continuous environment testing apparatus |
-
1987
- 1987-03-10 JP JP3474187U patent/JPS63142772U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54143668A (en) * | 1978-04-28 | 1979-11-09 | Toshiba Corp | Continuous environment testing apparatus |