JPS63137875U - - Google Patents
Info
- Publication number
- JPS63137875U JPS63137875U JP3094787U JP3094787U JPS63137875U JP S63137875 U JPS63137875 U JP S63137875U JP 3094787 U JP3094787 U JP 3094787U JP 3094787 U JP3094787 U JP 3094787U JP S63137875 U JPS63137875 U JP S63137875U
- Authority
- JP
- Japan
- Prior art keywords
- test chamber
- temperature
- temperature characteristic
- open part
- electronic equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009423 ventilation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
図面は本考案の一実施例を示すもので、第１図
はその断面略図、第２図はそのブロツク図である
。
図中、２：試験室、４：エアーカーテン、９：
第１エアーノズル、１０：第２エアーノズル、１
１：第１エアーシンク、１２：第２エアーシンク
。
The drawings show one embodiment of the present invention; FIG. 1 is a schematic cross-sectional view thereof, and FIG. 2 is a block diagram thereof. In the figure, 2: Test room, 4: Air curtain, 9:
First air nozzle, 10: Second air nozzle, 1
1: 1st air sink, 12: 2nd air sink.
Claims (1)
で移動自在の筐体と、その一部を開放部とする試
験室と、前記試験室の開放部を縦断し、強制通気
手段及び温度昇降手段と連通するエアーカーテン
と、前記試験室の上部に設けた防露ヒーターとを
含んでいることを特徴とする温度特性試験槽。 In a temperature characteristic testing device for electronic equipment, a small and movable casing, a test chamber with a part of the open part, and a forced ventilation means and a temperature raising/lowering means connected vertically through the open part of the test chamber. 1. A temperature characteristic test chamber comprising: an air curtain that controls air temperature; and an anti-dew heater provided in the upper part of the test chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3094787U JPS63137875U (en) | 1987-03-03 | 1987-03-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3094787U JPS63137875U (en) | 1987-03-03 | 1987-03-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63137875U true JPS63137875U (en) | 1988-09-12 |
Family
ID=30836225
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3094787U Pending JPS63137875U (en) | 1987-03-03 | 1987-03-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63137875U (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6221083A (en) * | 1985-07-19 | 1987-01-29 | Takamisawa Saibaneteitsukusu:Kk | Tester for temperature characteristics of electronic machinery |
-
1987
- 1987-03-03 JP JP3094787U patent/JPS63137875U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6221083A (en) * | 1985-07-19 | 1987-01-29 | Takamisawa Saibaneteitsukusu:Kk | Tester for temperature characteristics of electronic machinery |