JPH01118379U - - Google Patents

Info

Publication number
JPH01118379U
JPH01118379U JP1123488U JP1123488U JPH01118379U JP H01118379 U JPH01118379 U JP H01118379U JP 1123488 U JP1123488 U JP 1123488U JP 1123488 U JP1123488 U JP 1123488U JP H01118379 U JPH01118379 U JP H01118379U
Authority
JP
Japan
Prior art keywords
temperature
test chamber
opening
air curtain
temperature test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1123488U
Other languages
Japanese (ja)
Other versions
JPH075426Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988011234U priority Critical patent/JPH075426Y2/en
Publication of JPH01118379U publication Critical patent/JPH01118379U/ja
Application granted granted Critical
Publication of JPH075426Y2 publication Critical patent/JPH075426Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本考案の一実施例を示すもので、第1図
はその断面略図、第2図はその平面略図、第3図
はその構成ブロツク図である。 図中、2:温度試験室、4:第1エアーカーテ
ン、5:第2エアーカーテン、13:第1エアー
ノズル、14:第2エアーノズル、15:第1エ
アーシンク、16:第2エアーシンク。
The drawings show one embodiment of the present invention; FIG. 1 is a schematic sectional view thereof, FIG. 2 is a schematic plan view thereof, and FIG. 3 is a block diagram of the structure. In the figure, 2: temperature test chamber, 4: first air curtain, 5: second air curtain, 13: first air nozzle, 14: second air nozzle, 15: first air sink, 16: second air sink .

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子機器等の温度特性試験装置において、小型
で移動自在の筺体と、上部開放部及び側方開放部
を有する温度試験室と、強制通気手段及び温度昇
降手段により形成され少なくとも前記温度試験室
の上部開放部の内側を横断する第1エアーカーテ
ンと、強制通気手段により形成され少なくとも前
記温度試験室の上部開放部の外側を横断する第2
エアーカーテンと、前記側方開放部を開閉する側
方扉を含んでいることを特徴とする温度特性試験
槽。
In a temperature characteristic testing device for electronic equipment, etc., the temperature test chamber is formed by a small and movable housing, a temperature test chamber having an upper open part and a side open part, a forced ventilation means, and a temperature raising/lowering means, and at least the upper part of the temperature test chamber. a first air curtain extending across the inside of the opening; and a second air curtain formed by forced ventilation means and extending across at least the outside of the upper opening of the temperature test chamber.
A temperature characteristic test tank comprising an air curtain and a side door for opening and closing the side opening.
JP1988011234U 1988-02-01 1988-02-01 Temperature characteristic test tank Expired - Lifetime JPH075426Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988011234U JPH075426Y2 (en) 1988-02-01 1988-02-01 Temperature characteristic test tank

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988011234U JPH075426Y2 (en) 1988-02-01 1988-02-01 Temperature characteristic test tank

Publications (2)

Publication Number Publication Date
JPH01118379U true JPH01118379U (en) 1989-08-10
JPH075426Y2 JPH075426Y2 (en) 1995-02-08

Family

ID=31219606

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988011234U Expired - Lifetime JPH075426Y2 (en) 1988-02-01 1988-02-01 Temperature characteristic test tank

Country Status (1)

Country Link
JP (1) JPH075426Y2 (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51118151A (en) * 1975-04-02 1976-10-16 Clark Equipment Co Open topped well type freezing show case
JPS58141175U (en) * 1982-03-17 1983-09-22 株式会社東芝 open case
JPS613378U (en) * 1984-06-13 1986-01-10 日本建鐵株式会社 Frozen and refrigerated open case
JPS61105077A (en) * 1984-10-26 1986-05-23 三菱電機株式会社 Open showcase
JPS61203281U (en) * 1985-06-07 1986-12-20
JPS62169063A (en) * 1986-01-21 1987-07-25 Kumamoto Nippon Denki Kk Environmental tester
JPH01196583A (en) * 1988-02-01 1989-08-08 Takamisawa Cybernetics Co Ltd Temperature characteristic testing tank

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51118151A (en) * 1975-04-02 1976-10-16 Clark Equipment Co Open topped well type freezing show case
JPS58141175U (en) * 1982-03-17 1983-09-22 株式会社東芝 open case
JPS613378U (en) * 1984-06-13 1986-01-10 日本建鐵株式会社 Frozen and refrigerated open case
JPS61105077A (en) * 1984-10-26 1986-05-23 三菱電機株式会社 Open showcase
JPS61203281U (en) * 1985-06-07 1986-12-20
JPS62169063A (en) * 1986-01-21 1987-07-25 Kumamoto Nippon Denki Kk Environmental tester
JPH01196583A (en) * 1988-02-01 1989-08-08 Takamisawa Cybernetics Co Ltd Temperature characteristic testing tank

Also Published As

Publication number Publication date
JPH075426Y2 (en) 1995-02-08

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