JPS63142771U - - Google Patents

Info

Publication number
JPS63142771U
JPS63142771U JP3474087U JP3474087U JPS63142771U JP S63142771 U JPS63142771 U JP S63142771U JP 3474087 U JP3474087 U JP 3474087U JP 3474087 U JP3474087 U JP 3474087U JP S63142771 U JPS63142771 U JP S63142771U
Authority
JP
Japan
Prior art keywords
test chamber
temperature characteristic
open part
slit curtain
small
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3474087U
Other languages
Japanese (ja)
Other versions
JPH0752625Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987034740U priority Critical patent/JPH0752625Y2/en
Publication of JPS63142771U publication Critical patent/JPS63142771U/ja
Application granted granted Critical
Publication of JPH0752625Y2 publication Critical patent/JPH0752625Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本考案の一実施例を示すもので、第１図
はその断面略図、第２図はそのブロツク図である
。 図中、２：試験室、４：エアーカーテン、９：
第１エアーノズル、１０：第２エアーノズル、１
１：第１エアーシンク、１２：第２エアーシンク
。 The drawings show one embodiment of the present invention; FIG. 1 is a schematic cross-sectional view thereof, and FIG. 2 is a block diagram thereof. In the figure, 2: Test room, 4: Air curtain, 9:
First air nozzle, 10: Second air nozzle, 1
1: 1st air sink, 12: 2nd air sink.

補正 昭６２．６．１５ 図面の簡単な説明を次のように補正する。 明細書第１１頁第３行「ブロツク図」と「であ
る」の間に以下の文字を挿入します。 「、第３図はスリツトカーテンの一部省略平面
図」Amendment June 15, 1982 The brief description of the drawing is amended as follows. Insert the following characters between "block diagram" and "is" on page 11 of the specification, line 3. ``Figure 3 is a partially omitted plan view of the slit curtain.''

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子機器類の温度特性試験装置において、小型
で移動自在の筐体と、その一部を開放部とする試
験室と、前記試験室の開放部を縦断し、強制通気
手段及び温度昇降手段と連通するエアーカーテン
と、前記試験室の上部に設けた防露ヒーターと、
前記開放部に懸垂され、多数の貫通する小孔をそ
の下方に有するスリツトカーテンを含んでいるこ
とを特徴とする温度特性試験槽。 In a temperature characteristic testing device for electronic equipment, a small and movable casing, a test chamber with a part of the open part, and a forced ventilation means and a temperature raising/lowering means connected vertically through the open part of the test chamber. a dew-proof heater installed in the upper part of the test chamber;
A temperature characteristic test chamber comprising a slit curtain suspended in the opening and having a large number of penetrating small holes below the slit curtain.
JP1987034740U 1987-03-10 1987-03-10 Temperature characteristic test tank Expired - Lifetime JPH0752625Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987034740U JPH0752625Y2 (en) 1987-03-10 1987-03-10 Temperature characteristic test tank

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987034740U JPH0752625Y2 (en) 1987-03-10 1987-03-10 Temperature characteristic test tank

Publications (2)

Publication Number Publication Date
JPS63142771U true JPS63142771U (en) 1988-09-20
JPH0752625Y2 JPH0752625Y2 (en) 1995-11-29

Family

ID=30843578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987034740U Expired - Lifetime JPH0752625Y2 (en) 1987-03-10 1987-03-10 Temperature characteristic test tank

Country Status (1)

Country Link
JP (1) JPH0752625Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006275326A (en) * 2005-03-28 2006-10-12 Sanyo Electric Co Ltd Constant-temperature storage

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54143668A (en) * 1978-04-28 1979-11-09 Toshiba Corp Continuous environment testing apparatus
JPS5896241U (en) * 1981-12-23 1983-06-30 ソニー株式会社 environmental test equipment

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54143668A (en) * 1978-04-28 1979-11-09 Toshiba Corp Continuous environment testing apparatus
JPS5896241U (en) * 1981-12-23 1983-06-30 ソニー株式会社 environmental test equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006275326A (en) * 2005-03-28 2006-10-12 Sanyo Electric Co Ltd Constant-temperature storage

Also Published As

Publication number Publication date
JPH0752625Y2 (en) 1995-11-29

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