JPS63185579U - - Google Patents

Info

Publication number
JPS63185579U
JPS63185579U JP7524587U JP7524587U JPS63185579U JP S63185579 U JPS63185579 U JP S63185579U JP 7524587 U JP7524587 U JP 7524587U JP 7524587 U JP7524587 U JP 7524587U JP S63185579 U JPS63185579 U JP S63185579U
Authority
JP
Japan
Prior art keywords
temperature
test chamber
open
open part
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7524587U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7524587U priority Critical patent/JPS63185579U/ja
Publication of JPS63185579U publication Critical patent/JPS63185579U/ja
Pending legal-status Critical Current

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Landscapes

  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本考案の一実施例を示すもので、第1図
はその断面略図、第2図はそのブロツク図、第3
図はスリツトカーテンの部分省略平面図、第4図
は第1図の一部の拡大図である。 図中、2:試験室、4:エアーカーテン、9:
第1エアーノズル、10:第2エアーノズル、1
1:第1エアーシンク、12:第2エアーシンク
、30:吊り台。
The drawings show one embodiment of the present invention; Fig. 1 is a schematic sectional view thereof, Fig. 2 is a block diagram thereof, and Fig. 3 is a schematic cross-sectional view thereof.
The figure is a partially omitted plan view of the slit curtain, and FIG. 4 is an enlarged view of a portion of FIG. 1. In the figure, 2: Test room, 4: Air curtain, 9:
First air nozzle, 10: Second air nozzle, 1
1: First air sink, 12: Second air sink, 30: Hanging stand.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子機器類の温度特性試験装置において、小型
で移動自在の筐体と、その一部を開放部とする試
験室と、前記試験室の開放部を縦断し、強制通気
手段及び温度昇降手段と連通するエアーカーテン
と、前記開放部の外側に張り出した吊り台を含ん
でいることを特徴とする温度試験槽。
In a temperature characteristic testing device for electronic equipment, a small and movable casing, a test chamber with a part of it as an open part, and the open part of the test chamber is longitudinally traversed and communicated with a forced ventilation means and a temperature raising/lowering means. 1. A temperature test chamber comprising: an air curtain that allows a temperature test to be performed; and a hanging stand extending outside the open portion.
JP7524587U 1987-05-21 1987-05-21 Pending JPS63185579U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7524587U JPS63185579U (en) 1987-05-21 1987-05-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7524587U JPS63185579U (en) 1987-05-21 1987-05-21

Publications (1)

Publication Number Publication Date
JPS63185579U true JPS63185579U (en) 1988-11-29

Family

ID=30921203

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7524587U Pending JPS63185579U (en) 1987-05-21 1987-05-21

Country Status (1)

Country Link
JP (1) JPS63185579U (en)

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