JPS63169746A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS63169746A
JPS63169746A JP225487A JP225487A JPS63169746A JP S63169746 A JPS63169746 A JP S63169746A JP 225487 A JP225487 A JP 225487A JP 225487 A JP225487 A JP 225487A JP S63169746 A JPS63169746 A JP S63169746A
Authority
JP
Japan
Prior art keywords
semiconductor element
conductors
lead frame
leads
precoat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP225487A
Other languages
Japanese (ja)
Inventor
Tetsuo Hoshino
星野 哲雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP225487A priority Critical patent/JPS63169746A/en
Publication of JPS63169746A publication Critical patent/JPS63169746A/en
Pending legal-status Critical Current

Links

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE:To prevent the generation of the disconnection of conductors by providing a plurality of the conductors connecting an electrode on a semiconductor element and leads for a lead frame, a sealing medium stuck including said semiconductor element and the regions of the conductors and a precoat material to be formed, coating said semiconductor element and the upper sections of the conductors. CONSTITUTION:A sealing medium (Capton, etc.) 6 is stuck to a rear region with one parts of leads 12 and an island 11 in a lead frame 1 under a semiconductor element 2 such as an integrated circuit. Electrodes for the semiconductor element 2 and the leads 12 for the lead frame 1 are connected by a plurality of thin conductors 4, and a precoat medium 7 is shaped, coating the semiconductor element 2 and the conductors 4 to the upper sections of the semiconductor element 2 and the conductors 4. The whole is sealed with a resin 5, thus completing a semiconductor device. According to such constitution, the conductors 4 are brought into contact only with the precoat medium 7, thus resulting in no disconnection even when thermal expansion and shrinkage are repeated.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体装置に関し、特に半導体素子回りの構造
における半導体装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor device, and particularly to a semiconductor device in a structure around a semiconductor element.

〔従来の技術〕[Conventional technology]

従来、この種の半導体装置は、第2図(a>及び(b)
にそれぞれ平面図及びB−B′線断面図を示すように、
リードフレーム1のアイランド11上に半導体素子2を
搭載してろう材3で固定し、リードフレーム1のリード
12と半導体素子2上の電極とを細い導線4で接続し、
半導体素子2と導線4の一部とをプリコート材7′で覆
い、プリコート材7′と導線4を含むリード12を樹脂
5で封止していた。
Conventionally, this type of semiconductor device is as shown in FIGS.
As shown in the plan view and sectional view taken along the line B-B', respectively,
The semiconductor element 2 is mounted on the island 11 of the lead frame 1 and fixed with a brazing material 3, and the leads 12 of the lead frame 1 and the electrodes on the semiconductor element 2 are connected with a thin conducting wire 4.
The semiconductor element 2 and a part of the conductor wire 4 were covered with a precoat material 7', and the lead 12 including the precoat material 7' and the conductor wire 4 was sealed with a resin 5.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来の半導体装置は、導線がプリコート材と樹
脂とを通るようになっているので、プリコート材と樹脂
との境界面で熱膨張の差により導線が切断されるという
欠点がある。
In the conventional semiconductor device described above, since the conductive wire passes through the precoat material and the resin, there is a drawback that the conductive wire is cut due to the difference in thermal expansion at the interface between the precoat material and the resin.

本発明の目的は、熱膨張の差により導線の断線が発生し
ない半導体装置を提供することにある。
An object of the present invention is to provide a semiconductor device in which disconnection of conductive wires does not occur due to differences in thermal expansion.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の半導体装置は、リードフレームと、該リドフレ
ームのアイランド上に固定された半導体素子と、該半導
体素子上の電極と前記リードフレ−ムのリードとを接続
する複数の導線と、前記リードフレームの裏面側に前記
半導体素子及び導線の領域を含んで貼付されるシール材
と、前記半導体素子及び導線上を覆って形成されるプリ
コート材とを有している。
The semiconductor device of the present invention includes a lead frame, a semiconductor element fixed on an island of the lead frame, a plurality of conductive wires connecting electrodes on the semiconductor element and leads of the lead frame, and a semiconductor element fixed on an island of the lead frame. includes a sealing material that is attached to the back side of the semiconductor element and the conductive wire including the area thereof, and a precoat material that is formed to cover the semiconductor element and the conductive wire.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図(a)及び(b)はそれぞれ本発明の一実施例の
平面図及びA−A”線断面図である。
FIGS. 1(a) and 1(b) are a plan view and a sectional view taken along the line A-A'' of an embodiment of the present invention, respectively.

第1図(a)及び(b)に示すように、集積回路等の半
導体素子2の下のリードフレーム1のアイランド11と
リード12の一部との裏面領域にシール材(カプトン等
)6を貼り、半導体素子2の電極とリードフレーム1の
リード12とを複数の細い導線4で接続し、半導体素子
2と導線4との上部にそれらを覆ってプリコート材7を
形成する。この後、全体を樹脂5で封止して完成する。
As shown in FIGS. 1(a) and 1(b), a sealing material (such as Kapton) 6 is applied to the back surface area of the island 11 and part of the leads 12 of the lead frame 1 under the semiconductor element 2 such as an integrated circuit. The electrodes of the semiconductor element 2 and the leads 12 of the lead frame 1 are connected by a plurality of thin conductive wires 4, and a precoat material 7 is formed on the semiconductor element 2 and the conductive wires 4 to cover them. After this, the entire structure is sealed with resin 5 and completed.

このように構成することにより、導線4はプリコート材
7のみに接するので、熱膨張及び収縮が繰返されても断
線することがない。
With this configuration, the conductive wire 4 comes into contact only with the precoat material 7, so that it will not break even if thermal expansion and contraction are repeated.

(発明の効果〕 以上説明したように本発明の半導体装置は、導線がプリ
コート材のみと接するようにすることにより、熱膨張及
び収縮の繰返しに対して導線の切断が発生することを防
止できるので、信頼性を向上できるという効果がある。
(Effects of the Invention) As explained above, the semiconductor device of the present invention can prevent the conductor from breaking due to repeated thermal expansion and contraction by allowing the conductor to contact only the precoat material. , which has the effect of improving reliability.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)及び(b)はそれぞれ本発明の一実施例の
平面図及びA−A’断面図、第2図(a>及び(b)は
それぞれ従来の半導体装置の一例の平面図及びB−B’
断面図である。 1・・・リードフレーム、2・・・半導体素子、3・・
・ろう材、4・・・導線、5・・・樹脂、6・・・シー
ル材、7゜7′・・・プリコート材、11・・・アイラ
ンド、12・・・リード。 代理人 弁理士 内 原  晋(′1 //      35うネオ 夢l ■ 菓2 面
FIGS. 1(a) and (b) are a plan view and an AA' cross-sectional view of an embodiment of the present invention, respectively, and FIGS. 2(a> and (b) are plan views of an example of a conventional semiconductor device, respectively. and B-B'
FIG. 1...Lead frame, 2...Semiconductor element, 3...
- Brazing metal, 4... Conductor wire, 5... Resin, 6... Sealing material, 7゜7'... Precoat material, 11... Island, 12... Lead. Agent: Susumu Uchihara, patent attorney

Claims (1)

【特許請求の範囲】[Claims] リードフレームと、該リードフレームのアイランド上に
固定された半導体素子と、該半導体素子上の電極と前記
リードフレームのリードとを接続する複数の導線と、前
記リードフレームの裏面側に前記半導体素子及び導線の
領域を含んで貼付されるシール材と、前記半導体素子及
び導線上を覆って形成されるプリコート材とを有する半
導体装置。
A lead frame, a semiconductor element fixed on an island of the lead frame, a plurality of conductive wires connecting electrodes on the semiconductor element and leads of the lead frame, and a semiconductor element and a semiconductor element fixed on the back side of the lead frame. A semiconductor device comprising: a sealing material attached to include a region of a conductive wire; and a precoat material formed to cover the semiconductor element and the conductive wire.
JP225487A 1987-01-07 1987-01-07 Semiconductor device Pending JPS63169746A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP225487A JPS63169746A (en) 1987-01-07 1987-01-07 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP225487A JPS63169746A (en) 1987-01-07 1987-01-07 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS63169746A true JPS63169746A (en) 1988-07-13

Family

ID=11524225

Family Applications (1)

Application Number Title Priority Date Filing Date
JP225487A Pending JPS63169746A (en) 1987-01-07 1987-01-07 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS63169746A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0878611A (en) * 1994-08-31 1996-03-22 Nec Corp Semiconductor device
US5581119A (en) * 1994-03-04 1996-12-03 National Semiconductor Corporation IC having heat spreader attached by glob-topping

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5581119A (en) * 1994-03-04 1996-12-03 National Semiconductor Corporation IC having heat spreader attached by glob-topping
JPH0878611A (en) * 1994-08-31 1996-03-22 Nec Corp Semiconductor device

Similar Documents

Publication Publication Date Title
JPH01503184A (en) integrated circuit device package
KR960005972A (en) Resin-sealed semiconductor device and manufacturing method thereof
JPH08321521A (en) Plastic molded type semiconductor device and its manufacture
US5358598A (en) Folded bus bar leadframe and method of making
JP2828056B2 (en) Semiconductor device and manufacturing method thereof
JPS63169746A (en) Semiconductor device
JPS622628A (en) Semiconductor device
JPH0666354B2 (en) Semiconductor device
JP2782870B2 (en) Lead frame
JP2539763B2 (en) Semiconductor device mounting method
JPS5930538Y2 (en) semiconductor equipment
JPH03261153A (en) Package for semiconductor device
JPH08250624A (en) Semiconductor device and its manufacture
JP2596246B2 (en) Semiconductor integrated circuit device
JPH03129840A (en) Resin-sealed semiconductor device
JPH02251161A (en) Semiconductor device
JP2533750B2 (en) Resin-sealed semiconductor device
JP2533751B2 (en) Resin-sealed semiconductor device
JPH03227041A (en) Resin-sealed semiconductor device
JPH039541A (en) Manufacture of semiconductor device
JPS6236299Y2 (en)
JPH01114058A (en) Resin-sealed semiconductor device
JPH0513658A (en) Lead frame for semiconductor device
JPS6151953A (en) Semiconductor device
JPS61137334A (en) Semiconductor device