JPS63168545A - Ｘ線ｃｔ装置による欠陥測定方法 - Google Patents

Ｘ線ｃｔ装置による欠陥測定方法

Info

Publication number
JPS63168545A
JPS63168545A JP62000126A JP12687A JPS63168545A JP S63168545 A JPS63168545 A JP S63168545A JP 62000126 A JP62000126 A JP 62000126A JP 12687 A JP12687 A JP 12687A JP S63168545 A JPS63168545 A JP S63168545A
Authority
JP
Japan
Prior art keywords
rays
ray
defect
source voltage
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62000126A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0533721B2 (enExample
Inventor
Kenichi Fujii
藤井　建一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62000126A priority Critical patent/JPS63168545A/ja
Publication of JPS63168545A publication Critical patent/JPS63168545A/ja
Publication of JPH0533721B2 publication Critical patent/JPH0533721B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP62000126A 1987-01-06 1987-01-06 Ｘ線ｃｔ装置による欠陥測定方法 Granted JPS63168545A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62000126A JPS63168545A (ja) 1987-01-06 1987-01-06 Ｘ線ｃｔ装置による欠陥測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62000126A JPS63168545A (ja) 1987-01-06 1987-01-06 Ｘ線ｃｔ装置による欠陥測定方法

Publications (2)

Publication Number Publication Date
JPS63168545A true JPS63168545A (ja) 1988-07-12
JPH0533721B2 JPH0533721B2 (enExample) 1993-05-20

Family

ID=11465338

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62000126A Granted JPS63168545A (ja) 1987-01-06 1987-01-06 Ｘ線ｃｔ装置による欠陥測定方法

Country Status (1)

Country Link
JP (1) JPS63168545A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006312040A (ja) * 2005-05-03 2006-11-16 General Electric Co <Ge> 医用イメージング装置のための露出を制御する方法及びシステム
JP2016505152A (ja) * 2013-02-04 2016-02-18 シクセプリュＣｙｘｐｌｕｓ 断層撮影法によるタイヤ非破壊検査装置及び方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09294771A (ja) * 1996-05-07 1997-11-18 Aiko Saito 生理用ナプキン
JP3031006U (ja) * 1996-05-08 1996-11-12 愛子 斎藤 生理用ナプキン

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006312040A (ja) * 2005-05-03 2006-11-16 General Electric Co <Ge> 医用イメージング装置のための露出を制御する方法及びシステム
JP2016505152A (ja) * 2013-02-04 2016-02-18 シクセプリュＣｙｘｐｌｕｓ 断層撮影法によるタイヤ非破壊検査装置及び方法

Also Published As

Publication number Publication date
JPH0533721B2 (enExample) 1993-05-20

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