JPH0533721B2 - - Google Patents

Info

Publication number
JPH0533721B2
JPH0533721B2 JP62000126A JP12687A JPH0533721B2 JP H0533721 B2 JPH0533721 B2 JP H0533721B2 JP 62000126 A JP62000126 A JP 62000126A JP 12687 A JP12687 A JP 12687A JP H0533721 B2 JPH0533721 B2 JP H0533721B2
Authority
JP
Japan
Prior art keywords
rays
ray
defect
inspected
intensity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62000126A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63168545A (ja
Inventor
Kenichi Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP62000126A priority Critical patent/JPS63168545A/ja
Publication of JPS63168545A publication Critical patent/JPS63168545A/ja
Publication of JPH0533721B2 publication Critical patent/JPH0533721B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP62000126A 1987-01-06 1987-01-06 Ｘ線ｃｔ装置による欠陥測定方法 Granted JPS63168545A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62000126A JPS63168545A (ja) 1987-01-06 1987-01-06 Ｘ線ｃｔ装置による欠陥測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62000126A JPS63168545A (ja) 1987-01-06 1987-01-06 Ｘ線ｃｔ装置による欠陥測定方法

Publications (2)

Publication Number Publication Date
JPS63168545A JPS63168545A (ja) 1988-07-12
JPH0533721B2 true JPH0533721B2 (enExample) 1993-05-20

Family

ID=11465338

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62000126A Granted JPS63168545A (ja) 1987-01-06 1987-01-06 Ｘ線ｃｔ装置による欠陥測定方法

Country Status (1)

Country Link
JP (1) JPS63168545A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3031006U (ja) * 1996-05-08 1996-11-12 愛子 斎藤 生理用ナプキン
JPH09294771A (ja) * 1996-05-07 1997-11-18 Aiko Saito 生理用ナプキン

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7274771B2 (en) * 2005-05-03 2007-09-25 General Electric Company Methods and systems for controlling exposure for medical imaging devices
FR3001802B1 (fr) * 2013-02-04 2019-05-24 Cyxplus Dispositif et procede pour le controle non destructif de pneumatiques par tomographie

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09294771A (ja) * 1996-05-07 1997-11-18 Aiko Saito 生理用ナプキン
JP3031006U (ja) * 1996-05-08 1996-11-12 愛子 斎藤 生理用ナプキン

Also Published As

Publication number Publication date
JPS63168545A (ja) 1988-07-12

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