JPS63165563U - - Google Patents

Info

Publication number
JPS63165563U
JPS63165563U JP1987120525U JP12052587U JPS63165563U JP S63165563 U JPS63165563 U JP S63165563U JP 1987120525 U JP1987120525 U JP 1987120525U JP 12052587 U JP12052587 U JP 12052587U JP S63165563 U JPS63165563 U JP S63165563U
Authority
JP
Japan
Prior art keywords
ray
lens system
item
optical axis
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987120525U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS63165563U publication Critical patent/JPS63165563U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
  • Geophysics And Detection Of Objects (AREA)

Description

【図面の簡単な説明】
第１Ａ図は本考案によるＸ線検査装置の全体を
示す斜視図、第１Ｂ図はＸ線検査装置のＸ線およ
び光学作動部分を略図的に示す線図、第１Ｃ図は
本考案によるＸ線室の内部構成を示す線図、第２
Ａ図は品物をＸ線室内において観察する状態を示
す線図、第２Ｂ図は制御機構の位置移動とＸ線室
に対する関係を示す線図、第３図は本考案による
直接観察系を示す線図、第４図はＴＶ制御装置に
使用された本考案装置の構造装置を示す線図、第
５図は第４図の装置の構造の側面を示す線図、第
６図は第４図の―線に沿つて取つて示した略
図的断面図である。 １…ユニツト、２…フロントドア、３…制御灯
、４…直接観察系、５…テレビジヨン装置、６…
制御ノブ、７…制御パネル、８…足踏ペダル、１
０…軸、１１…Ｘ線源、１２…Ｘ線ビーム、１３
…Ｘ線室、１４…蛍光スクリーン、１５ａ，１５
ｂ…ミラー、１６…光学系、１７…Ｘ線フイルタ
、１８…対物レンズ系、１９…緩衝部材、２０…
手荷物（またはカバン）、２１…ねじ、２３…動
かす手段（またはジンバル装置）、２４，２６…
レンズ系、２９…ＢＮＣコネクタ、３２…ブラケ
ツト、３４…シヤフト。

Claims (1)

    【実用新案登録請求の範囲】
  1. Ｘ線源１、Ｘ線ビーム１２の通路内にあり、検
    査すべき品物を入れるためのＸ線室１３、このＸ
    線室の前記Ｘ線源と反対の側に設けられ、Ｘ線像
    を可視像に変換するための蛍光スクリーン１４、
    この可視像を観察部所に向けるための手段１５、
    およびレンズ倍率切換装置３０を有する、品物の
    可視像の観察手段１６より成るＸ線検査装置にお
    いて、１つのレンズ系２４は品物の全視野を与え
    また残りのレンズ系２６は品物の拡大を与える少
    なくとも２つのレンズ系２４，２６と、このレン
    ズ系２４，２６を保持し、観察手段１６の光軸２
    ５と平行な軸１０の回りに回動して拡大レンズ系
    ２６を光軸２５と整列して位置決めしまたこの拡
    大レンズ系の使用時以外は全視野レンズ系２４を
    光軸２５と整列して維持するための、前記の軸１
    ０の回りに回動可能な回転板３５とを有し、前記
    の観察手段１６は、前記の回転板と作動連結され
    た制御ノブ６と連結され、この制御ノブ６は、品
    物の部分上を動かすために前記の拡大レンズ系２
    ６を制御するようにしたことを特徴とするＸ線検
    査装置。
JP1987120525U 1980-09-23 1987-08-07 Pending JPS63165563U (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/189,995 US4379348A (en) 1980-09-23 1980-09-23 X-Ray security screening system having magnification

Publications (1)

Publication Number Publication Date
JPS63165563U true JPS63165563U (ja) 1988-10-27

Family

ID=22699629

Family Applications (2)

Application Number Title Priority Date Filing Date
JP56149691A Pending JPS5786027A (en) 1980-09-23 1981-09-24 X-ray inspector
JP1987120525U Pending JPS63165563U (ja) 1980-09-23 1987-08-07

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP56149691A Pending JPS5786027A (en) 1980-09-23 1981-09-24 X-ray inspector

Country Status (6)

Country Link
US (1) US4379348A (ja)
EP (1) EP0048530B1 (ja)
JP (2) JPS5786027A (ja)
BR (1) BR8106098A (ja)
CA (1) CA1168380A (ja)
DE (1) DE3175165D1 (ja)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4454605A (en) * 1982-01-25 1984-06-12 Delucia Victor E Modular X-ray inspection apparatus
JPS5954843U (ja) * 1982-09-21 1984-04-10 セイコーインスツルメンツ株式会社 試料台の作動装置
US4890313A (en) * 1987-12-03 1989-12-26 Johns Hopkins University Bi-directional x-ray imager
US5127032A (en) * 1987-12-03 1992-06-30 Johns Hopkins University Multi-directional x-ray imager
US4974249A (en) * 1989-06-02 1990-11-27 Glenbrook Technologies, Inc. X-ray inspection system
US5113425A (en) * 1989-06-02 1992-05-12 Glenbrook Technologies, Inc. X-ray inspection system for electronic components
US5692029A (en) * 1993-01-15 1997-11-25 Technology International Incorporated Detection of concealed explosives and contraband
US5912939A (en) * 1997-02-07 1999-06-15 Hirsch; Gregory Soft x-ray microfluoroscope
US6256404B1 (en) * 1997-10-10 2001-07-03 Analogic Corporation Computed tomography scanning apparatus and method using adaptive reconstruction window
SE521332C2 (sv) * 2002-04-16 2003-10-21 Styrbjoern Gaerde Automat och förfarande för hantering av försändelser
DE10330521A1 (de) * 2003-07-05 2005-02-10 Smiths Heimann Gmbh Gerät und Verfahren zur Überprüfung von Gegenständen
DE10332743B4 (de) * 2003-07-17 2008-10-30 Siemens Ag Röntgensystem mit einer Strahlenschutzeinrichtung
US7289601B2 (en) * 2004-12-01 2007-10-30 Imascope Inc. Digital image collector for X-ray systems
US7991242B2 (en) * 2005-05-11 2011-08-02 Optosecurity Inc. Apparatus, method and system for screening receptacles and persons, having image distortion correction functionality
US20070041613A1 (en) * 2005-05-11 2007-02-22 Luc Perron Database of target objects suitable for use in screening receptacles or people and method and apparatus for generating same
US20090174554A1 (en) * 2005-05-11 2009-07-09 Eric Bergeron Method and system for screening luggage items, cargo containers or persons
CA2584683A1 (en) * 2006-04-20 2007-10-20 Optosecurity Inc. Apparatus, method and system for screening receptacles and persons
US7899232B2 (en) 2006-05-11 2011-03-01 Optosecurity Inc. Method and apparatus for providing threat image projection (TIP) in a luggage screening system, and luggage screening system implementing same
US8494210B2 (en) 2007-03-30 2013-07-23 Optosecurity Inc. User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same
US20080152082A1 (en) * 2006-08-16 2008-06-26 Michel Bouchard Method and apparatus for use in security screening providing incremental display of threat detection information and security system incorporating same
JP2008246490A (ja) * 2007-03-29 2008-10-16 Kayaba Ind Co Ltd 穴開け装置及び穴開け方法
WO2008119151A1 (en) * 2007-03-30 2008-10-09 Optosecurity Inc. User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same
AU2012304490B2 (en) 2011-09-07 2015-06-25 Rapiscan Systems, Inc. X-ray inspection system that integrates manifest data with imaging/detection processing
US10302807B2 (en) 2016-02-22 2019-05-28 Rapiscan Systems, Inc. Systems and methods for detecting threats and contraband in cargo

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS514877A (en) * 1974-06-28 1976-01-16 Shin Meiwa Ind Co Ltd Jinkaishuyobakono jinkaioshikomisochi

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3678278A (en) * 1970-01-26 1972-07-18 Le Roy E Peil Apparatus for baggage inspection
US3846632A (en) * 1970-11-17 1974-11-05 E Ljubimov Closed-circuit tv inspection x-ray microscope
US3958078A (en) * 1974-08-30 1976-05-18 Ithaco, Inc. X-ray inspection method and apparatus
US4297580A (en) * 1977-12-27 1981-10-27 North American Philips Corporation X-ray optical system for article inspection, with components disposed on parallel axes

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS514877A (en) * 1974-06-28 1976-01-16 Shin Meiwa Ind Co Ltd Jinkaishuyobakono jinkaioshikomisochi

Also Published As

Publication number Publication date
DE3175165D1 (en) 1986-09-25
CA1168380A (en) 1984-05-29
EP0048530B1 (en) 1986-08-20
BR8106098A (pt) 1982-06-08
US4379348A (en) 1983-04-05
EP0048530A3 (en) 1983-01-12
EP0048530A2 (en) 1982-03-31
JPS5786027A (en) 1982-05-28

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