JPS6312535B2 - - Google Patents

Info

Publication number
JPS6312535B2
JPS6312535B2 JP12693382A JP12693382A JPS6312535B2 JP S6312535 B2 JPS6312535 B2 JP S6312535B2 JP 12693382 A JP12693382 A JP 12693382A JP 12693382 A JP12693382 A JP 12693382A JP S6312535 B2 JPS6312535 B2 JP S6312535B2
Authority
JP
Japan
Prior art keywords
lens
reflectance
light
plane
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP12693382A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5917139A (ja
Inventor
Kenichi Nishiuchi
Michoshi Nagashima
Noboru Yamada
Mutsuo Takenaga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP12693382A priority Critical patent/JPS5917139A/ja
Publication of JPS5917139A publication Critical patent/JPS5917139A/ja
Publication of JPS6312535B2 publication Critical patent/JPS6312535B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Manufacturing Optical Record Carriers (AREA)
JP12693382A 1982-07-20 1982-07-20 反射率測定方法 Granted JPS5917139A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12693382A JPS5917139A (ja) 1982-07-20 1982-07-20 反射率測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12693382A JPS5917139A (ja) 1982-07-20 1982-07-20 反射率測定方法

Publications (2)

Publication Number Publication Date
JPS5917139A JPS5917139A (ja) 1984-01-28
JPS6312535B2 true JPS6312535B2 (enrdf_load_stackoverflow) 1988-03-19

Family

ID=14947487

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12693382A Granted JPS5917139A (ja) 1982-07-20 1982-07-20 反射率測定方法

Country Status (1)

Country Link
JP (1) JPS5917139A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10297565T5 (de) * 2001-12-17 2005-01-05 Cyberoptics Semiconductor, Inc., Beaverton Mapping-Sensor für Halbleiterwaferträger

Also Published As

Publication number Publication date
JPS5917139A (ja) 1984-01-28

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