JPS631248Y2 - - Google Patents
Info
- Publication number
- JPS631248Y2 JPS631248Y2 JP11820382U JP11820382U JPS631248Y2 JP S631248 Y2 JPS631248 Y2 JP S631248Y2 JP 11820382 U JP11820382 U JP 11820382U JP 11820382 U JP11820382 U JP 11820382U JP S631248 Y2 JPS631248 Y2 JP S631248Y2
- Authority
- JP
- Japan
- Prior art keywords
- test
- voltage
- terminal
- current
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 64
- 238000011990 functional testing Methods 0.000 claims description 6
- 238000005259 measurement Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11820382U JPS5923674U (ja) | 1982-08-02 | 1982-08-02 | Ｉｃ試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11820382U JPS5923674U (ja) | 1982-08-02 | 1982-08-02 | Ｉｃ試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5923674U JPS5923674U (ja) | 1984-02-14 |
| JPS631248Y2 true JPS631248Y2 (en:Method) | 1988-01-13 |
Family
ID=30271788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11820382U Granted JPS5923674U (ja) | 1982-08-02 | 1982-08-02 | Ｉｃ試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5923674U (en:Method) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7690656B1 (ja) * | 2024-07-11 | 2025-06-10 | 株式会社アドバンテスト | 試験回路、試験装置、および試験方法 |
-
1982
- 1982-08-02 JP JP11820382U patent/JPS5923674U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5923674U (ja) | 1984-02-14 |
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