JPS628938B2 - - Google Patents

Info

Publication number
JPS628938B2
JPS628938B2 JP57052004A JP5200482A JPS628938B2 JP S628938 B2 JPS628938 B2 JP S628938B2 JP 57052004 A JP57052004 A JP 57052004A JP 5200482 A JP5200482 A JP 5200482A JP S628938 B2 JPS628938 B2 JP S628938B2
Authority
JP
Japan
Prior art keywords
chute
test
test head
row
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57052004A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58168250A (ja
Inventor
Masatoshi Mishima
Naohiko Urasaki
Shigeki Takeo
Iwao Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57052004A priority Critical patent/JPS58168250A/ja
Publication of JPS58168250A publication Critical patent/JPS58168250A/ja
Publication of JPS628938B2 publication Critical patent/JPS628938B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Chutes (AREA)
  • Feeding Of Articles To Conveyors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP57052004A 1982-03-30 1982-03-30 試験ヘッド装置 Granted JPS58168250A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57052004A JPS58168250A (ja) 1982-03-30 1982-03-30 試験ヘッド装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57052004A JPS58168250A (ja) 1982-03-30 1982-03-30 試験ヘッド装置

Publications (2)

Publication Number Publication Date
JPS58168250A JPS58168250A (ja) 1983-10-04
JPS628938B2 true JPS628938B2 (cs) 1987-02-25

Family

ID=12902673

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57052004A Granted JPS58168250A (ja) 1982-03-30 1982-03-30 試験ヘッド装置

Country Status (1)

Country Link
JP (1) JPS58168250A (cs)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6164134A (ja) * 1984-09-06 1986-04-02 Hitachi Electronics Eng Co Ltd 電子部品搬送装置
JPH0644101Y2 (ja) * 1986-03-19 1994-11-14 旭化成工業株式会社 半導体素子の位置決め装置

Also Published As

Publication number Publication date
JPS58168250A (ja) 1983-10-04

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