JPS6229902B2 - - Google Patents
Info
- Publication number
- JPS6229902B2 JPS6229902B2 JP57126115A JP12611582A JPS6229902B2 JP S6229902 B2 JPS6229902 B2 JP S6229902B2 JP 57126115 A JP57126115 A JP 57126115A JP 12611582 A JP12611582 A JP 12611582A JP S6229902 B2 JPS6229902 B2 JP S6229902B2
- Authority
- JP
- Japan
- Prior art keywords
- chute
- semiconductor devices
- row
- air cylinder
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 87
- 238000012360 testing method Methods 0.000 claims description 73
- 230000007246 mechanism Effects 0.000 claims description 12
- 239000013307 optical fiber Substances 0.000 claims description 4
- 238000001514 detection method Methods 0.000 claims description 2
- 230000002950 deficient Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- 238000007664 blowing Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Chutes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57126115A JPS5917257A (ja) | 1982-07-20 | 1982-07-20 | 固定シユ−ト装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57126115A JPS5917257A (ja) | 1982-07-20 | 1982-07-20 | 固定シユ−ト装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5917257A JPS5917257A (ja) | 1984-01-28 |
| JPS6229902B2 true JPS6229902B2 (cs) | 1987-06-29 |
Family
ID=14927002
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57126115A Granted JPS5917257A (ja) | 1982-07-20 | 1982-07-20 | 固定シユ−ト装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5917257A (cs) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS619898U (ja) * | 1984-06-25 | 1986-01-21 | 富士通株式会社 | 半導体装置の傾斜落下式自動送り装置 |
-
1982
- 1982-07-20 JP JP57126115A patent/JPS5917257A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5917257A (ja) | 1984-01-28 |
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