JPS627851A - Sputtering method - Google Patents

Sputtering method

Info

Publication number
JPS627851A
JPS627851A JP14477185A JP14477185A JPS627851A JP S627851 A JPS627851 A JP S627851A JP 14477185 A JP14477185 A JP 14477185A JP 14477185 A JP14477185 A JP 14477185A JP S627851 A JPS627851 A JP S627851A
Authority
JP
Japan
Prior art keywords
target
substrate
film
sputtering method
obtd
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14477185A
Other languages
Japanese (ja)
Inventor
Keiji Arimatsu
有松 啓治
Hidetsugu Setoyama
英嗣 瀬戸山
Yoichi Oshita
陽一 大下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14477185A priority Critical patent/JPS627851A/en
Publication of JPS627851A publication Critical patent/JPS627851A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To economically form a film on a substrate surface to a uniform film thickness to meet the ruggedness on said surface in the titled method for depositing a material for deposition released from a target on the substrate by forcing either of the target and substrate to make specific motion. CONSTITUTION:For exaple, the target 3 is so constructed that the target 3 can rotate around the central part A on the surface thereof as the center of the axis of rotation to rotate the target 3 as shown by dotted lines. Since spatter particles 5 released from the target 3 are thereby made to arrive at the substrate 1 with an angle of inclination therewith, the effect similar to the effect obtd. by having relatively plural pieces of the targets is obtd. More specifically, the angle between the plane of the substrate 1 and the plane of the target 3 changes; therefore, the film having the uniform thickness to meet the ruggedness on the substrate 1 surface is formed. The performance of the film formed in the above-mentioned manner is satisfied with a piece of the target 3 and since just one set of a power source for driving the target 3 and other ancillary equipment are required, the high economy, reliability, etc. are obtd.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明はスパッタ方法に係り、特に、ターゲットからた
たき出された被着物質が基板の表面に堆積して薄膜を形
成するスパッタ方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a sputtering method, and particularly to a sputtering method in which a deposited material ejected from a target is deposited on the surface of a substrate to form a thin film.

〔発明の背景〕[Background of the invention]

近年、スパッタ装置は種々の材料の薄膜化技術として最
も重要な一つとして、各方面でニーズが高まっている。
In recent years, sputtering equipment is one of the most important technologies for thinning films of various materials, and needs are increasing in various fields.

このスパッタ装置において、ターゲットに近接して永久
磁石を配設し、直交電磁界によってプラズマの密度を高
め、これにより基板への膜成長法     一度を増大
させた、いわゆるマグネトロンスパッタと呼ばれる方法
について第5図を用いて説明する。
In this sputtering apparatus, a permanent magnet is disposed close to the target and the plasma density is increased by orthogonal electromagnetic fields, thereby increasing the film growth rate on the substrate. This will be explained using figures.

該図において、3は永久磁石6が設置されているターゲ
ットで、図示のような磁極線4を発生している。このタ
ーゲット3には対向して基板1が設置された基板支持台
2が配置されている。尚、上記ターゲット3.及び基板
支持台2は、特に図示しないが真空容器中に設置されて
いるものである。
In the figure, reference numeral 3 denotes a target on which a permanent magnet 6 is installed, which generates magnetic pole lines 4 as shown. A substrate support stand 2 on which a substrate 1 is installed is arranged opposite to this target 3. In addition, the above target 3. Although not particularly shown, the substrate support stand 2 is installed in a vacuum container.

そして、真空容器内が真空に排気された段階でArガス
を導入し、ターゲット3が(−)に、基板支持台2が(
+)になるように、例えば直流の高電圧を印加させるこ
とでArガスをイオン化してA r ” を発生させ、
このAr”がターゲット3に吸引されて表面に衝突し、
この衝突によってたたき出されたスパッタ粒子5を基板
1の表面に堆積させて薄膜を形成する。
Then, when the inside of the vacuum container is evacuated, Ar gas is introduced, so that the target 3 becomes (-) and the substrate support 2 becomes (
+), for example, by applying a high DC voltage, Ar gas is ionized to generate Ar'',
This Ar'' is attracted to the target 3 and collides with the surface,
The sputtered particles 5 thrown out by this collision are deposited on the surface of the substrate 1 to form a thin film.

ところで、基板1への薄膜形成に際しては、基板1表面
の平坦部のみならず、表面の凹凸に応じて段差部にも一
様な膜厚で成膜しなければならなV)s このため、特開昭56−156766号公報(第6図に
示す)に記載されているように、複数個のターゲット3
a、3b、3cを基板支持台2に対して角度を変化させ
て配置し、多方向よりスパッタリングすることによって
、膜厚分布を一様にする方法が提案されている。
By the way, when forming a thin film on the substrate 1, the film must be formed with a uniform thickness not only on the flat parts of the surface of the substrate 1, but also on the stepped parts according to the unevenness of the surface. As described in Japanese Patent Application Laid-Open No. 56-156766 (shown in FIG. 6), a plurality of targets 3
A method has been proposed in which the film thickness distribution is made uniform by arranging the films a, 3b, and 3c at different angles with respect to the substrate support 2, and performing sputtering from multiple directions.

しかしながら、この方法では、膜厚分布など膜形成につ
いての性能上は大巾な改善が期待できるが、ターゲット
が複数個になるため、真空容器が大形になる他、ターゲ
ット自身、及び電源、その他の付属装置が増加するなど
、きわめて不経済であり信頼性にも劣ることになる。
However, although this method can be expected to significantly improve film formation performance such as film thickness distribution, since there are multiple targets, the vacuum container becomes large and the targets themselves, power supply, etc. This increases the number of attached devices, which is extremely uneconomical and reduces reliability.

〔発明の目的〕[Purpose of the invention]

本発明は上述の点に鑑み成されたもので、その目的とす
るところは、基板表面の凹凸に応じても一様な膜厚で成
膜できることは勿論、真空容器が大形したり付属装置が
増加することがなくなり、経済性、信頼性に優れたスパ
ッタ方法を提供するにある。
The present invention has been made in view of the above-mentioned points, and its purpose is not only to be able to form a film with a uniform thickness even if the substrate surface is uneven, but also to be able to form a film with a uniform thickness even if the substrate surface is uneven. The object of the present invention is to provide a sputtering method that is economical and reliable, and which eliminates the increase in

[発明の概要〕 本発明は基板へのターゲット成分の被着を、ターゲット
と基板のいずれか一方を基板に対するターゲットからの
スパッタ粒子の入射が角度をもつよう運動させ行うこと
により、所期の目的を達成するようになしたものである
[Summary of the Invention] The present invention achieves the desired purpose by depositing a target component on a substrate by moving either the target or the substrate so that the incidence of sputtered particles from the target on the substrate is at an angle. It was designed to achieve this goal.

[発明の実施例〕 以下、図面の実施例に基づいて本発明を説明する。[Embodiments of the invention] The present invention will be described below based on embodiments shown in the drawings.

第1図に本発明の一実施例を示す。FIG. 1 shows an embodiment of the present invention.

該図の如く、本実施例ではターゲット3表面の中央部分
Aを回転軸中心として、ターゲット3を回転運動できる
構造としたもので、ターゲット3は点線で示すように回
転運動を行う。従って、ターゲット3から放出したスパ
ッタ粒子5は、基板1に対して傾斜角をもって到達する
ので、相対的に複数個のターゲットをもったものと同様
な効果が得られる。即ち、基板1の面とターゲット3の
面とがなす角が変化するので、基板1表面の凹凸に応じ
て一様な厚さの膜を形成できる。更に、するので、信頼
性、経済性に優れる。また、ターゲット3を駆動する電
源、その他の付属装置が1組ですむので、経済性、メン
テナンス性、信頼性いずれもすぐれた装置とすることが
できる。
As shown in the figure, this embodiment has a structure in which the target 3 can be rotated about the central portion A of the surface of the target 3 as the rotation axis, and the target 3 performs the rotational movement as shown by the dotted line. Therefore, the sputtered particles 5 emitted from the target 3 reach the substrate 1 at an oblique angle, so that relatively the same effect as having a plurality of targets can be obtained. That is, since the angle between the surface of the substrate 1 and the surface of the target 3 changes, a film with a uniform thickness can be formed depending on the unevenness of the surface of the substrate 1. Furthermore, it is highly reliable and economical. Further, since only one set of the power supply and other accessory devices for driving the target 3 is required, the device can be excellent in terms of economy, ease of maintenance, and reliability.

第2図は本発明の他の実施例で、基板1の表面中央部分
Bを回転軸として、ターゲット3を円弧運動させるもの
である。この場合には、基板1とターゲット3との距離
を一定にできるので、さらに優れた効果が期待できる。
FIG. 2 shows another embodiment of the present invention, in which the target 3 is moved in an arc with the central portion B of the surface of the substrate 1 serving as the rotation axis. In this case, since the distance between the substrate 1 and the target 3 can be kept constant, even better effects can be expected.

第3図、及び第4図に本発明の更に他の実施例を示す。Still other embodiments of the present invention are shown in FIGS. 3 and 4.

第3図に示す例は、基板1表面の中央部分Aを回転軸と
して、基板1を基板支持台2に取付けた状態で回転運動
できる構造としたもので、基板1、及び基板支持台2は
点線で示すように回転運動を行う。従って、ターゲット
3から放出したスパッタ粒子5は、基板1に対して傾斜
角をもって到達するので、第1図の例と同様な効果が得
られる。
The example shown in FIG. 3 has a structure in which the substrate 1 can be rotated with the center portion A of the surface of the substrate 1 as the rotation axis while the substrate 1 is attached to the substrate support 2. The substrate 1 and the substrate support 2 are Perform rotational motion as shown by the dotted line. Therefore, the sputtered particles 5 emitted from the target 3 reach the substrate 1 at an inclined angle, so that the same effect as in the example of FIG. 1 can be obtained.

更に、第4図に示す例は、ターゲット3の表面中台2を
円弧運動させるもので、基板1とターゲット3との距離
を一定にできるので、第2図の例と同様な効果が期待で
きる。
Furthermore, in the example shown in FIG. 4, the platform 2 on the surface of the target 3 is moved in an arc, and the distance between the substrate 1 and the target 3 can be kept constant, so the same effect as in the example shown in FIG. 2 can be expected. .

〔発明の効果〕〔Effect of the invention〕

以上説明した本発明のスパッタ方法によれば、基板への
ターゲット成分の被着を、ターゲットと基板のいずれか
一方を基板に対するターゲットからのスパッタ粒子の入
射が角度をもつよう運動させることにより行うようにし
たものであるから。
According to the sputtering method of the present invention described above, the target component is deposited on the substrate by moving either the target or the substrate so that the incidence of sputtered particles from the target on the substrate is at an angle. Because it was made by

基板表面の凹凸に応じても一様な厚さの膜が形成できる
と共に、1個のターゲットですむので真空容器が大形し
たり付属装置が増加したりすることがなく、経済性、信
頼性に優れたスパッタ方法とすることができる。
A film with a uniform thickness can be formed regardless of the irregularities of the substrate surface, and since only one target is required, there is no need to increase the size of the vacuum container or the number of attached devices, making it economical and reliable. It can be an excellent sputtering method.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のスパッタ方法の一実施例を説明するた
めのスパッタ装置の概略図、第2図、第3図、及び第4
図はそれぞれ本発明のスパッタ方法の他の実施例を説明
するためのスパッタ装置の概略図、第5図はマグネトロ
ンスパッタ装置を示す概略図、第6図は従来のスパッタ
方法を説明するためのスパッタ装置の概略図である。 1・・・基板、2・・・基板支持台、3・・・ターゲッ
ト、4・・・磁極線、5・・・スパッタ粒子、6・・・
永久磁石。
FIG. 1 is a schematic diagram of a sputtering apparatus for explaining one embodiment of the sputtering method of the present invention, FIGS. 2, 3, and 4.
The figures are a schematic diagram of a sputtering apparatus for explaining other embodiments of the sputtering method of the present invention, FIG. 5 is a schematic diagram of a magnetron sputtering apparatus, and FIG. 6 is a schematic diagram of a sputtering apparatus for explaining a conventional sputtering method. FIG. 2 is a schematic diagram of the device. DESCRIPTION OF SYMBOLS 1... Substrate, 2... Substrate support stand, 3... Target, 4... Magnetic pole line, 5... Sputtered particle, 6...
permanent magnet.

Claims (1)

【特許請求の範囲】 1、少くとも成膜材料を備えたターゲットと成膜すべき
母材である基板とを真空容器中に対向配置させ、前記タ
ーゲットから放出したスパッタ粒子によりターゲットの
成分を前記基板に被着させるスパッタ方法において、前
記基板へのターゲット成分の被着を、前記ターゲットと
基板のいずれか一方を前記基板に対するターゲットから
のスパッタ粒子の入射が角度をもつよう運動させること
により行うことを特徴とするスパッタ方法。 2、前記ターゲットの運動は、前記基板表面のほぼ中央
部分を回転軸とする円弧運動であることを特徴とする特
許請求の範囲第1項記載のスパッタ方法。 3、前記ターゲットの運動は、該ターゲットのほぼ中央
部分を回転軸とする回転運動であることを特徴とする特
許請求の範囲第1項記載のスパッタ方法。 4、前記基板の運動は、前記ターゲットの表面のほぼ中
央部分を回転軸とする円弧運動であることを特徴とする
特許請求の範囲第1項記載のスパッタ方法。 5、前記基板の運動は、該基板のほぼ中央部分を回転軸
とする回転運動であることを特徴とする特許請求の範囲
第1項記載のスパッタ方法。
[Claims] 1. A target provided with at least a film-forming material and a substrate, which is a base material on which a film is to be formed, are placed facing each other in a vacuum container, and the components of the target are removed by sputtered particles emitted from the target. In a sputtering method for depositing a target component on a substrate, the target component is deposited on the substrate by moving either the target or the substrate so that the incidence of sputtered particles from the target on the substrate is at an angle. A sputtering method characterized by: 2. The sputtering method according to claim 1, wherein the movement of the target is an arc movement with an axis of rotation approximately at the center of the surface of the substrate. 3. The sputtering method according to claim 1, wherein the movement of the target is a rotational movement about a substantially central portion of the target as a rotation axis. 4. The sputtering method according to claim 1, wherein the motion of the substrate is an arcuate motion with an axis of rotation approximately at the center of the surface of the target. 5. The sputtering method according to claim 1, wherein the movement of the substrate is a rotational movement about a substantially central portion of the substrate as a rotation axis.
JP14477185A 1985-07-03 1985-07-03 Sputtering method Pending JPS627851A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14477185A JPS627851A (en) 1985-07-03 1985-07-03 Sputtering method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14477185A JPS627851A (en) 1985-07-03 1985-07-03 Sputtering method

Publications (1)

Publication Number Publication Date
JPS627851A true JPS627851A (en) 1987-01-14

Family

ID=15370039

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14477185A Pending JPS627851A (en) 1985-07-03 1985-07-03 Sputtering method

Country Status (1)

Country Link
JP (1) JPS627851A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0716161A1 (en) * 1994-12-05 1996-06-12 Satis Vacuum Industries AG Apparatus for coating of optical substrate
US7744958B2 (en) 2005-07-13 2010-06-29 Tsinghua University Method for making carbon nanotube-based device
US8012314B2 (en) 2000-09-12 2011-09-06 Hoya Corporation Manufacturing method and apparatus of phase shift mask blank
WO2017098537A1 (en) * 2015-12-07 2017-06-15 キヤノンアネルバ株式会社 Method and device for manufacturing magnetoresistance effect element

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0716161A1 (en) * 1994-12-05 1996-06-12 Satis Vacuum Industries AG Apparatus for coating of optical substrate
US8012314B2 (en) 2000-09-12 2011-09-06 Hoya Corporation Manufacturing method and apparatus of phase shift mask blank
US7744958B2 (en) 2005-07-13 2010-06-29 Tsinghua University Method for making carbon nanotube-based device
WO2017098537A1 (en) * 2015-12-07 2017-06-15 キヤノンアネルバ株式会社 Method and device for manufacturing magnetoresistance effect element

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