JPS6253769B2 - - Google Patents
Info
- Publication number
- JPS6253769B2 JPS6253769B2 JP53041537A JP4153778A JPS6253769B2 JP S6253769 B2 JPS6253769 B2 JP S6253769B2 JP 53041537 A JP53041537 A JP 53041537A JP 4153778 A JP4153778 A JP 4153778A JP S6253769 B2 JPS6253769 B2 JP S6253769B2
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- radiation
- drive roller
- radiation source
- outer peripheral
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005855 radiation Effects 0.000 claims description 30
- 230000002093 peripheral effect Effects 0.000 claims description 5
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 4
- 238000007689 inspection Methods 0.000 description 12
- 238000005259 measurement Methods 0.000 description 12
- 230000001066 destructive effect Effects 0.000 description 7
- 238000001514 detection method Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000005266 casting Methods 0.000 description 2
- 230000004323 axial length Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4153778A JPS54133396A (en) | 1978-04-08 | 1978-04-08 | Method and apparatus for nondestructive measuring |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4153778A JPS54133396A (en) | 1978-04-08 | 1978-04-08 | Method and apparatus for nondestructive measuring |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS54133396A JPS54133396A (en) | 1979-10-17 |
| JPS6253769B2 true JPS6253769B2 (enrdf_load_stackoverflow) | 1987-11-12 |
Family
ID=12611156
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4153778A Granted JPS54133396A (en) | 1978-04-08 | 1978-04-08 | Method and apparatus for nondestructive measuring |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54133396A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102022120566A1 (de) | 2021-09-14 | 2023-03-16 | Mitsubishi Electric Corporation | Halbleitervorrichtung |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108519395A (zh) * | 2018-03-08 | 2018-09-11 | 芜湖泰领信息科技有限公司 | 管道探伤机器人控制系统及方法 |
-
1978
- 1978-04-08 JP JP4153778A patent/JPS54133396A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102022120566A1 (de) | 2021-09-14 | 2023-03-16 | Mitsubishi Electric Corporation | Halbleitervorrichtung |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS54133396A (en) | 1979-10-17 |
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