JPS54133396A - Method and apparatus for nondestructive measuring - Google Patents

Method and apparatus for nondestructive measuring

Info

Publication number
JPS54133396A
JPS54133396A JP4153778A JP4153778A JPS54133396A JP S54133396 A JPS54133396 A JP S54133396A JP 4153778 A JP4153778 A JP 4153778A JP 4153778 A JP4153778 A JP 4153778A JP S54133396 A JPS54133396 A JP S54133396A
Authority
JP
Japan
Prior art keywords
radiation source
radiation
inspection
letting
truck
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4153778A
Other languages
Japanese (ja)
Other versions
JPS6253769B2 (en
Inventor
Toshiaki Maeda
Hideo Kashiwatani
Toshiro Aihara
Masaru Hamaoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP4153778A priority Critical patent/JPS54133396A/en
Publication of JPS54133396A publication Critical patent/JPS54133396A/en
Publication of JPS6253769B2 publication Critical patent/JPS6253769B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Abstract

PURPOSE:To make possible quantitative non-destructive inspection rapidly and easily, reduce the inspection manhours and achieve the higher reliability of products by letting a radiation source and a detector oppose by way of a thick-wall part in- between while letting a hollow rotator form object rotate. CONSTITUTION:The position of a guide 8 is so determined that the center in the axial direction of a cylindrical object 1 under inspection becomes the center of a swivelling mechanism 18. An object 1 is then placed on a roller 2 and the radiation source 4 and detecting pipe 6, truck 16, rods 15 and 14 are respectively positioned. After the guide 8 is freed from the object under inspection, suitable quantity of radiation is performed from the radiation source 4 by a control panel 5 and the radiation dose having passed is detected 6 and is supplied to a recorder 7. Next, the object 1 is rotated by the roller 2 and the detection signals corresponding to the sizes of the internal defects thereof are recorded. Further the truck 16 is moved in the axial direction at a constant speed, whereby nondestructive measurement of the object 1 may be continuously performed.
JP4153778A 1978-04-08 1978-04-08 Method and apparatus for nondestructive measuring Granted JPS54133396A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4153778A JPS54133396A (en) 1978-04-08 1978-04-08 Method and apparatus for nondestructive measuring

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4153778A JPS54133396A (en) 1978-04-08 1978-04-08 Method and apparatus for nondestructive measuring

Publications (2)

Publication Number Publication Date
JPS54133396A true JPS54133396A (en) 1979-10-17
JPS6253769B2 JPS6253769B2 (en) 1987-11-12

Family

ID=12611156

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4153778A Granted JPS54133396A (en) 1978-04-08 1978-04-08 Method and apparatus for nondestructive measuring

Country Status (1)

Country Link
JP (1) JPS54133396A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108519395A (en) * 2018-03-08 2018-09-11 芜湖泰领信息科技有限公司 pipeline inspection robot control system and method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023042402A (en) 2021-09-14 2023-03-27 三菱電機株式会社 Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108519395A (en) * 2018-03-08 2018-09-11 芜湖泰领信息科技有限公司 pipeline inspection robot control system and method

Also Published As

Publication number Publication date
JPS6253769B2 (en) 1987-11-12

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