JPS6249926B2 - - Google Patents

Info

Publication number
JPS6249926B2
JPS6249926B2 JP764681A JP764681A JPS6249926B2 JP S6249926 B2 JPS6249926 B2 JP S6249926B2 JP 764681 A JP764681 A JP 764681A JP 764681 A JP764681 A JP 764681A JP S6249926 B2 JPS6249926 B2 JP S6249926B2
Authority
JP
Japan
Prior art keywords
discharge
discharge electrode
analytical
sample
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP764681A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57122351A (en
Inventor
Yoshitaka Hori
Toichi Kikuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP764681A priority Critical patent/JPS57122351A/ja
Publication of JPS57122351A publication Critical patent/JPS57122351A/ja
Publication of JPS6249926B2 publication Critical patent/JPS6249926B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP764681A 1981-01-21 1981-01-21 Method of spectrochemical analysis wherein continuous light emission is utilized Granted JPS57122351A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP764681A JPS57122351A (en) 1981-01-21 1981-01-21 Method of spectrochemical analysis wherein continuous light emission is utilized

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP764681A JPS57122351A (en) 1981-01-21 1981-01-21 Method of spectrochemical analysis wherein continuous light emission is utilized

Publications (2)

Publication Number Publication Date
JPS57122351A JPS57122351A (en) 1982-07-30
JPS6249926B2 true JPS6249926B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-10-22

Family

ID=11671584

Family Applications (1)

Application Number Title Priority Date Filing Date
JP764681A Granted JPS57122351A (en) 1981-01-21 1981-01-21 Method of spectrochemical analysis wherein continuous light emission is utilized

Country Status (1)

Country Link
JP (1) JPS57122351A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5855736A (ja) * 1981-09-28 1983-04-02 Shimadzu Corp 発光分光分析による濃度分布解析装置
JPS62277539A (ja) * 1986-05-27 1987-12-02 Nippon Steel Corp 連続鋳造鋳片の品質評価方法
KR101027278B1 (ko) * 2008-12-23 2011-04-06 주식회사 포스코 연속 스파크형 슬라브 단면 개재물의 맵 획득시스템 및 획득방법
JP5974696B2 (ja) * 2012-07-13 2016-08-23 Ｊｆｅスチール株式会社 発光分光分析による偏析評価方法および偏析評価装置

Also Published As

Publication number Publication date
JPS57122351A (en) 1982-07-30

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